Prognostics and Health Management of Mechanical Systems

2013 ◽  
Vol 694-697 ◽  
pp. 872-875
Author(s):  
Jiang Chang ◽  
Fang Wei
Keyword(s):  
Health Management ◽  
Mechanical Systems ◽  
Smart Sensors ◽  
Electronic Systems ◽  
System Failure ◽  
Prognostics And Health Management ◽  
Critical Systems ◽  
Embedded Sensing ◽  
Safety Critical Systems ◽  
Self Test

Reliability is an important issue to consider for mechanical systems. The state of art is regular checkup and maintenance to ensure normal operations. This is not good enough for safety-critical systems like gearboxes in vehicles and helicopters because the risk of system failure still exists, let alone the manpower and monetary cost required. Prognostics and health management (PHM) was first raised by the U.S. armed force, which should ideally be able to predict faults and schedule maintenance only when necessary by monitoring the system condition. In this paper, inspired by the idea of Built-In Self Test (BIST) in electronic systems, we propose a novel framework to fulfill the task of prognostics and health management with a set of smart sensors, consisting of embedded sensing elements, wireless communication modules and micro-controllers. Both the significance and challenges of the framework are discussed.

RELIABILITY AND MODELING OF SYSTEMS INTEGRATED WITH FIRMWARE AND HARDWARE

2005 ◽  
Vol 12 (03) ◽  
pp. 227-239 ◽  
Author(s):  
TIELING ZHANG ◽  
MIN XIE ◽  
LOON CHING TANG ◽  
SZU HUI NG
Keyword(s):  
Weibull Distribution ◽  
Failure Rate ◽  
Software Reliability ◽  
Integrated System ◽  
System Failure ◽  
Application Software ◽  
Critical Systems ◽  
Exponentiated Weibull Distribution ◽  
Exponentiated Weibull ◽  
Safety Critical Systems

Firmware is embedded software in hardware devices and they play important role for many critical systems' function. Firmware failure rate in operation should be quite lower than the application software which is operating on it. Most of the study on software reliability deals with systems during development, and it is also important to study the integrated system during operation. Complex systems usually have a bathtub-shaped failure rate over the lifecycle of the product. This paper discusses the parametric analysis of model given by Haupt and Schäbe (1992), exponentiated Weibull distribution and models generated from Pareto and Weibull distribution, as well as their possible application to modeling firmware system failure. In addition, the Safety Integrity Levels (SIL) stipulated in IEC 61508 are taken into account in the modeling since the safety-critical systems in general are firmware-dominated.

A Survey of Sensor Technologies for Prognostics and Health Management of Electronic Systems

2014 ◽  
Vol 602-605 ◽  
pp. 2229-2232 ◽  
Author(s):  
Wen Xue Yang ◽  
Zhe Chen ◽  
Feng Yang
Keyword(s):  
Life Cycle ◽  
Early Warning ◽  
Health Management ◽  
Life Cycle Costs ◽  
Electronic Systems ◽  
Sensor Systems ◽  
Prognostics And Health Management ◽  
Electronic Products ◽  
System Failures

Recently, the field of Prognostics and Health Management (PHM) for electronic products and systems has received increasing attention due to the potentialities to provide early warning of system failures, reduce life cycle costs, and forecast maintenance as needed. This paper introduces the sensors and their sensor technologies. The required attributes of sensors for the development for PHM of electronics are discussed. Finally, their trends in sensor systems are presented.

Power Supply Prognostics and Health Management of High Reliability Electronic Systems in Rugged Environment

2011 ◽  
Vol 474-476 ◽  
pp. 1195-1200 ◽  
Author(s):  
Yong Guan ◽  
Sheng Zhen Jin ◽  
Li Feng Wu ◽  
Wei Pan ◽  
Yong Mei Liu ◽  
...  
Keyword(s):  
Power System ◽  
Embedded System ◽  
Power Supply ◽  
Health Management ◽  
High Reliability ◽  
Electronic System ◽  
Fixed Time ◽  
Electronic Systems ◽  
Prognostics And Health Management ◽  
Healing Model

The high reliable embedded system in rugged environment has huge potential application value. There are 34% faults in electronic system by the cause of the fault of power system. So the prognostics mechanism and the algorithm of power health has been a core support technology in applications. the fault and the deterioration and healing model of the power system in rugged environment is constructed by analysis of FFP, DFP and healing(alleviation)for improving the reliability, the usability and the maintainability. And many questions such as fixed-time maintenance and back-down maintenance depending on conventional statistical method are solved fundamentally. Finally, the prognostics and health management methods of power health in domestic and foreign presently are contrasted and analyzed.

scholarly journals Stress-Aware Periodic Test of Interconnects

2022 ◽  
Author(s):  
Somayeh Sadeghi-Kohan ◽  
Sybille Hellebrand ◽  
Hans-Joachim Wunderlich
Keyword(s):  
Error Detection ◽  
Concurrent Error Detection ◽  
Critical Systems ◽  
Time Intervals ◽  
Detection Mechanism ◽  
Space Applications ◽  
Periodic Test ◽  
Safety Critical Systems ◽  
Self Test ◽  
Short Time

AbstractSafety-critical systems have to follow extremely high dependability requirements as specified in the standards for automotive, air, and space applications. The required high fault coverage at runtime is usually obtained by a combination of concurrent error detection or correction and periodic tests within rather short time intervals. The concurrent scheme ensures the integrity of computed results while the periodic test has to identify potential aging problems and to prevent any fault accumulation which may invalidate the concurrent error detection mechanism. Such periodic built-in self-test (BIST) schemes are already commercialized for memories and for random logic. The paper at hand extends this approach to interconnect structures. A BIST scheme is presented which targets interconnect defects before they will actually affect the system functionality at nominal speed. A BIST schedule is developed which significantly reduces aging caused by electromigration during the lifetime application of the periodic test.

Sign in / Sign up

Export Citation Format

Share Document