Cube Texture Formation of Cu-33at.%Ni Alloy Substrates and CeO2 Buffer Layer for YBCO Coated Conductors
2014 ◽
Vol 887-888
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pp. 345-348
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Cube texture formation of Cu-33 at.%Ni alloy substartes and CeO2buffer layer prepared by chemical solution deposition on the textured substrate were investigated by electron back scattered diffraction (EBSD) and XRD technics systematically. The results shown that a strong cube textured Cu-33at.%Ni alloy substrate with the cube texture fraction of 99.8 % (< 10°) was obtained after annealing at 1000°C for 1 h. The full width half maximum (FWHM) values for the X-ray (111) phi-scan and (002) omega-scan in this substrate were 7.31° and 5.51°, respectively. Furthermore, the cube texture fraction of epitaxially grown CeO2buffer layer was 95 % (< 10°), and the FWHM values of phi-scan and omega-scan being 6.98° and 5.92°, respectively.