Single Buffer Layer Technology for YBCO Coated Conductors

2001 ◽  
Vol 689 ◽  
Author(s):  
M. Parans Paranthaman ◽  
T. Aytug ◽  
H. Y. Zhai ◽  
S. Sathyamurthy ◽  
H. M. Christen ◽  
...  
Keyword(s):  
Buffer Layer ◽  
High Current Density ◽  
Rf Magnetron Sputtering ◽  
Coated Conductors ◽  
High Current ◽  
Ybco Films ◽  
X Ray ◽  
Diffusion Barrier Layer ◽  
Good Template ◽  
Ybco Coated Conductors

ABSTRACTIn an effort to develop alternative single buffer layer technology for YBa2Cu3O7-δ (YBCO) coated conductors, we have investigated LaMnO3 (LMO) as a potential buffer layer. High-quality LMO films were grown directly on biaxially textured Ni and Ni-W (3%) substrates using rf magnetron sputtering. YBCO films were then grown on LMO buffers using pulsed laser deposition. Detailed X-ray studies have shown that both YBCO and LMO layers were grown with a single epitaxial orientation. Rutherford backscattering spectroscopy (RBS) analyses have indicated the ratio of La to Mn ratio is 1:1. SEM micrographs indicated that 3000-Å-thick LMO films on biaxially textured Ni (100) substrates were dense, continuous and crack-free. A high Jc of over 1 MA/cm2 at 77 K and self-field was obtained on YBCO films grown on LMO-buffered Ni or Ni-W substrates. We have identified LaMnO3 as a good diffusion barrier layer for Ni and it also provides a good template for growing high current density YBCO films.

Growth of thick Yba2Cu3O7−δ films carrying a critical current of over 230 A/cm on single LaMnO3-buffered ion-beam assisted deposition MgO substrates

2003 ◽  
Vol 18 (9) ◽  
pp. 2055-2059 ◽  
Author(s):  
M. Paranthaman ◽  
T. Aytug ◽  
D. K. Christen ◽  
P. N. Arendt ◽  
S. R. Foltyn ◽  
...  
Keyword(s):  
Critical Current ◽  
Current Density ◽  
Ybco Film ◽  
High Current Density ◽  
Ion Beam ◽  
Coated Conductors ◽  
High Current ◽  
Ion Beam Assisted Deposition ◽  
Ni Alloy ◽  
Ybco Coated Conductors

A single LaMnO3 buffer layer was developed for the growth of superconducting thick YBa2Cu3O7−δ (YBCO) films on polycrystalline Ni-alloy substrates where a biaxially textured MgO layer, produced by ion-beam assisted deposition (IBAD), was used as a template. Using pulsed laser deposition, a 1.65-μm-thick YBCO film with a critical current density of 1.4 × 106 A/cm2 in self field at 75 K was achieved on sputtered LaMnO3-buffered IBAD MgO substrates. This corresponds to a critical current (Ic) of 231 A/cm-width. This result demonstrates the possibility of using both LaMnO3 buffer and IBAD MgO template for producing high current density YBCO-coated conductors.

Cube Texture Formation of Cu-33at.%Ni Alloy Substrates and CeO2 Buffer Layer for YBCO Coated Conductors

2014 ◽  
Vol 887-888 ◽  
pp. 345-348 ◽  
Author(s):  
Hui Tian ◽  
Hong Li Suo ◽  
Ya Ru Liang ◽  
Yue Zhao ◽  
Lin Ma ◽  
...  
Keyword(s):  
Buffer Layer ◽  
Full Width Half Maximum ◽  
Cube Texture ◽  
Coated Conductors ◽  
Texture Formation ◽  
Solution Deposition ◽  
X Ray ◽  
Ni Alloy ◽  
Electron Back Scattered Diffraction ◽  
Ybco Coated Conductors

Cube texture formation of Cu-33 at.%Ni alloy substartes and CeO2buffer layer prepared by chemical solution deposition on the textured substrate were investigated by electron back scattered diffraction (EBSD) and XRD technics systematically. The results shown that a strong cube textured Cu-33at.%Ni alloy substrate with the cube texture fraction of 99.8 % (< 10°) was obtained after annealing at 1000°C for 1 h. The full width half maximum (FWHM) values for the X-ray (111) phi-scan and (002) omega-scan in this substrate were 7.31° and 5.51°, respectively. Furthermore, the cube texture fraction of epitaxially grown CeO2buffer layer was 95 % (< 10°), and the FWHM values of phi-scan and omega-scan being 6.98° and 5.92°, respectively.

A novel process for CeO2single buffer layer on biaxially textured metal substrates in YBCO coated conductors

2006 ◽  
Vol 19 (10) ◽  
pp. 1068-1072 ◽  
Author(s):  
Jie Xiong ◽  
Yin Chen ◽  
Yang Qiu ◽  
Bowan Tao ◽  
Wenfeng Qin ◽  
...  
Keyword(s):  
Buffer Layer ◽  
Coated Conductors ◽  
Metal Substrates ◽  
Ybco Coated Conductors

scholarly journals A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

2001 ◽  
Vol 11 (1) ◽  
pp. 3359-3364 ◽  
Author(s):  
T.G. Holesinger ◽  
S.R. Foltyn ◽  
P.N. Arendt ◽  
Quanxi Jia ◽  
P.C. Dowden ◽  
...  
Keyword(s):  
Buffer Layer ◽  
Coated Conductors ◽  
Ybco Coated Conductors

STEM investigation of the chemistry and bonding changes associated with the grain boundary embrittlement of Cu by Bi

1996 ◽  
Vol 54 ◽  
pp. 526-527
Author(s):  
V. J. Keast ◽  
J. Bruley ◽  
D. B. Williams
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
High Current Density ◽  
High Current ◽  
Fracture Path ◽  
Scanning Electron Micrograph ◽  
Edge Structure ◽  
X Ray ◽  
Grain Boundary Embrittlement ◽  
Electron Energy Loss

It has long been known that trace amounts of Bi can embrittle Cu after appropriate heat treatments. The Bi segregates to the grain boundaries and weakens them such that failure occurs through intergranular fracture without plastic deformation. This behavior is demonstrated in the scanning electron micrograph of a typical Cu-Bi fracture surface in Figure 1. It is known that the Bi extends for only a few atomic layers into the grains on either side of the grain boundary. This narrow segregation width was been confirmed using Energy Dispersive X-ray Spectroscopy (EDS) on a VG HB603 STEM. Figure 2 shows the ratio of Bi to Cu as the probe is stepped across the grain boundary.The segregation behavior is well understood, however it is not yet properly understood how the Bi causes embrittlement once it is at the grain boundaries. The Bi must change the bonding at the boundaries so that the boundaries become weak and hence the most likely fracture path. The Electron Energy Loss Near Edge Structure (ELNES) coupled with the small probes and high current density available in a field emission STEM can provide information about the localized electronic structure and hence bonding at grain boundaries. Previous investigations indicated that the near edge structure of Cu was altered at the grain boundaries due to the presence of Bi.

Chemical synthesis of nanoparticles for artificial pinning centers in YBCO coated conductors

2005 ◽  
Vol 868 ◽  
Author(s):  
Srivatsan Sathyamurthy ◽  
Keith J. Leonard ◽  
M. Parans Paranthaman
Keyword(s):  
Coated Conductors ◽  
Ceria Nanoparticles ◽  
Structure And Properties ◽  
X Ray Diffraction ◽  
Pinning Centers ◽  
X Ray ◽  
Synthesis Of Nanoparticles ◽  
Artificial Pinning Centers ◽  
Transmission Electron ◽  
Ybco Coated Conductors

AbstractCeria nanoparticles were prepared using a solution based approach using cerium (III) acetate as a starting material and cetyltrimethylammonium hydroxide (CTAOH) as a precipitating agent and surfactant. The presence of the surfactant CTAOH helps prevent agglomeration of the nanoparticles. Using X-ray diffraction (XRD) and high resolution transmission electron microscopy (HRTEM), the particle size was determined to be 3.5 – 4 nm. The structure and properties of these CeO2 nanoparticles have been analyzed.

scholarly journals Reel-to-reel continuous deposition of CexZr1-xO2single buffer layer for YBCO coated conductors

2009 ◽  
Vol 153 ◽  
pp. 012036 ◽  
Author(s):  
Jie Xiong ◽  
Bowan Tao ◽  
Wenfeng Qin ◽  
Xiao Feng ◽  
Xiaoke Song ◽  
...  
Keyword(s):  
Buffer Layer ◽  
Coated Conductors ◽  
Continuous Deposition ◽  
Ybco Coated Conductors
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