Thermal Transport in Hotspots Using the Lattice Boltzmann Method with Application to Silicon-on-Insulator Transistors
2014 ◽
Vol 960-961
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pp. 337-340
Keyword(s):
Silicon-on-insulator (SOI) transistors have been widely used in the micro-electronic devices. The Lattice Boltzmann method (LBM) is employed to simulate the heat conductions of hotspots appeared in a SOI transistor. The results show that a thermal wave effect is appeared in micro-region, and it can not be found in Fourier prediction. Comparing the results obtained by the Fourier law and LBM, we find that the LBM solution shows approximately 22% higher energy density than the Fourier prediction. When two thermal waves form different hotspots meet together, a significant energy enhancement will be appeared.
Transient conduction simulation of a nano-scale hotspot using finite volume lattice Boltzmann method
2014 ◽
Vol 25
(04)
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pp. 1350103
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2015 ◽
Vol 723
◽
pp. 896-900
Keyword(s):
2010 ◽
Vol 229
(7)
◽
pp. 2526-2543
◽
2020 ◽
Keyword(s):
Keyword(s):