Characterization of H-Plasma Treated ZnO Crystals by Positron Annihilation and Atomic Force Microscopy

Nominally undoped, hydrothermally grown ZnO single crystals have been investigated before and after exposure to remote H-plasma. Defect characterization has been made by two complementary techniques of positron annihilation: positron lifetime spectroscopy and coincidence Doppler broadening. The high-momentum parts of the annihilation photon momentum distribution have been calculated from first principles in order to assist in defect identification. The positron annihilation results are supplemented by Atomic Force Microscopy for characterization of the crystal surface. It was found that virgin ZnO crystal contains Zn-vacancies associated with hydrogen. H-plasma treatment causes a significant reduction in concentration of these complexes. Physical mechanism of this effect is discussed in the paper.

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Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.2161940 ◽

2006 ◽

Vol 99 (2) ◽

pp. 023523 ◽

Cited By ~ 10

Author(s):

G. Brauer ◽

W. Anwand ◽

W. Skorupa ◽

S. Brandstetter ◽

C. Teichert

Keyword(s):

Atomic Force Microscopy ◽

Ion Implantation ◽

Positron Annihilation ◽

Positron Annihilation Spectroscopy ◽

Force Microscopy ◽

Atomic Force

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Atomic force microscopy characterization of a YBaCuO crystal surface patterned by proton irradiation

Physica C Superconductivity ◽

10.1016/0921-4534(92)90654-u ◽

1992 ◽

Vol 191 (1-2) ◽

pp. 243-247

Author(s):

T. Kroener ◽

G. Linker ◽

O. Meyer ◽

B. Strehlau ◽

Th. Wolf ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Proton Irradiation ◽

Crystal Surface ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Review—Multiscale Characterization of Li-Ion Batteries through the Combined Use of Atomic Force Microscopy and X-ray Microscopy and Considerations for a Correlative Analysis of the Reviewed Data

Journal of The Electrochemical Society ◽

10.1149/1945-7111/ac4298 ◽

2021 ◽

Author(s):

Danilo Dini ◽

Flavio Cognigni ◽

Daniele Passeri ◽

Francesca Anna Scaramuzzo ◽

Mauro Pasquali ◽

...

Keyword(s):

Atomic Force Microscopy ◽

X Ray ◽

Force Microscopy ◽

Correlative Analysis ◽

Atomic Force ◽

Combined Use ◽

Complementary Techniques ◽

Non Destructive

Abstract The present review analyses the recent literature on the combined use of X-ray microscopy (XRM) and atomic force microscopy (AFM) for multiscale characterization of Li+ (or Li) batteries (LiBs) with the aim of developing guidelines for correlative analysis. The usefulness of XRM resides in the capability of affording non invasively in situ images of the inner parts of a LiB (an encapsulated device) with spatial resolution of dozens of nm during operation. XRM is non destructive and affords the early diagnosis of LiBs degradation causes when these manifest themselves as microdeformations. Multiscale characterization of LiBs also requires AFM for visualizing the morphological/physical alterations of LiB components (anodes, cathodes, electrolyte) at the sub-nanometer level. Different to XRM, AFM necessitates of a modification of LiB working configuration since AFM uses a contacting probe whereas XRM exploits radiation-matter interactions and does not require LiB dissection. A description of the working principles of the two techniques is provided to evidence which technical aspects have to be considered for achieving a meaningful correlative analysis of LiBs. In delineating new perspectives for the analysis of LiBs we will consider additional complementary techniques. Among various AFM-based techniques particular emphasis is given to electrochemical AFM (EC-AFM).

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