SiAlON Microstructures

2008 ◽  
Vol 403 ◽  
pp. 265-268
Author(s):  
L.K.L. Falk
Keyword(s):  
Grain Shape ◽  
Ceramic Materials ◽  
Liquid Phase Sintering ◽  
High Resolution Imaging ◽  
Size Distributions ◽  
Fine Scale ◽  
Quantitative Microscopy ◽  
Transmission Electron ◽  
Resolution Imaging ◽  
Shape And Size

This paper is focussed on the development of microstructure during liquid phase sintering and post-densification crystallisation heat treatment of ceramic materials based on the α- and β-Si3N4 structures. Grain shape and size distributions, assessed by quantitative microscopy in combination with stereological methods, and fine scale microstructures, investigated by electron diffraction and high resolution imaging and microanalysis in the transmission electron microscope, are discussed in relation to the fabrication process and the overall composition of the ceramic material.

High-resolution imaging of ceramics

1992 ◽  
Vol 50 (1) ◽  
pp. 112-113
Author(s):  
C. Barry Carter ◽  
Stuart McKernan
Keyword(s):  
High Resolution ◽  
Ceramic Materials ◽  
Local Scale ◽  
Current Status ◽  
High Resolution Imaging ◽  
Future Studies ◽  
Transmission Electron ◽  
The Matrix ◽  
Resolution Imaging ◽  
Local Crystal Structure

Ceramic materials have now been studied for many years using high-resolution transmission electron microscopy (HRTEM). The technique has had a major impact on our understanding of both the solid-sate chemistry of the materials themselves and the interfaces and defects present in the materials. The development of both aspects of the field have progressed in parallel as summarized in Figure 1. It is the purpose of this paper to review the current status and assess the needs for future studies.HRTEM is uniquely suited for examining the chemistry and structure of ceramic materials on the local scale. Although it does not directly give information on the chemical composition of these materials, it does provide information on the local crystal structure which can, in turn, be used to infer the local crystal chemistry. A particularly clear illustration of such an application is shown in Figure 2 where a small particle with the spinel structure has grown inside a matrix of olivine as a result of internal oxidation of the matrix. The selected-area diffraction pattern confirmed the FCC nature of the particle although due to its small size, the diffraction spots were all considerably elongated.

High Resolution Imaging of As-Grown Sapphire Surfaces

1985 ◽  
Vol 62 ◽  
Author(s):  
Tung Hsu ◽  
S. R. Nutt
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Features ◽  
High Resolution Imaging ◽  
Sapphire Surface ◽  
Surface Steps ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Resolution Imaging ◽  
Surface Facets

ABSTRACTSurfaces of commercially grown edge-defined film-fed growth sapphire (EFG α-Al2O3) were studied in the electron microscope using both reflection electron microscopy (REM) and conventional transmission electron microscopy (TEM). The as-grown sapphire surface, ostensibly {1120}, was characterized by “rooftop” structures which were often locally periodic. These rooftop structures consisted of alternating {1120} facets and additional facets inclined a few degrees. The crystallography of the surface facets was analyzed using REM imaging of bulk specimens, and trace analysis of back-thinned plan section TEM specimens. Surface roughness was measured by stylus profilometry. and these measurements were compared to the electron microscopy observations. Fine structural features parallel to <0110> directions were also observed in both REM and TEM experiments, and these were attributed to surface steps of atomic scales.

scholarly journals Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1304 ◽  
Author(s):  
Giulio Guzzinati ◽  
Thomas Altantzis ◽  
Maria Batuk ◽  
Annick De Backer ◽  
Gunnar Lumbeeck ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Electron Tomography ◽  
High Resolution Imaging ◽  
Rapid Progress ◽  
Transmission Electron ◽  
The World ◽  
Resolution Imaging ◽  
The University

The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.

A novel mosaic-like structure in SrTiO3 thin films on a Pt(001) surface revealed by transmission electron microscopy

1996 ◽  
Vol 11 (11) ◽  
pp. 2777-2784 ◽  
Author(s):  
S. Takeno ◽  
S. Nakamura ◽  
K. Abe ◽  
S. Komatsu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
High Resolution Imaging ◽  
Antiphase Boundaries ◽  
Growth Modes ◽  
Transmission Electron ◽  
Interfacial Structures ◽  
Resolution Imaging ◽  
Means Of Transmission

A novel mosaic-like structure in SrTiO3 thin films was discovered and characterized by means of transmission electron microscopy (TEM). The films were deposited on a (001) oriented Pt surface. The orientation relationship between SrTiO3 film and Pt substrate was determined, and four types of growth modes were revealed. These four growth modes formed four types of domains, respectively, and these domains and Pt formed peculiarly ordered interfacial structures, i.e., near coincidence site lattices. Antiphase boundaries between two adjacent domains were also observed by high-resolution imaging.

Atomic Structure of Interfaces in Epitaxial NiSi2 on (001) Silicon

1992 ◽  
Vol 263 ◽  
Author(s):  
W.J. Chen ◽  
F.R. Chen ◽  
L.J. Chen
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Atomic Structure ◽  
Imaging Technique ◽  
Interface Structure ◽  
High Resolution Imaging ◽  
Image Simulation ◽  
Transmission Electron ◽  
Resolution Imaging ◽  
Boundary Core

ABSTRACTHigh resolution transmission electron microscopy (HRTEM) has been applied to study the atomic structure of NiSi2 /(001)Si interface. Previous HRTEM result suggested that Ni atoms in the boundary core are six-fold coordinated and Si atoms are everywhere tetrahedrally coordinated. In this work, high resolution imaging technique and computer image simulation were used to study the atomic structure of NiSi2 /(001)Si interfaces and a new interface structure was found. For the new interface structure, Ni and Si atoms are also six-fold and tetrahedrally coordinated, respectively, with an extra layer of fourfold planar bonded Si atoms present at the interface.

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