Stress State Localized Analysis on the Tip of the Crack
2010 ◽
Vol 449
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pp. 87-95
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Keyword(s):
In this paper is presented a study of the analysis of the stress state of micro specimens exposed to a load inside the column of a High Voltage Electron Microscope (HVTEM), in particular for a Mo single crystal. The experimental tangential stresses distribution images were obtained and compared with theoretical calculations using Naiber approach, obtaining an excellent match.
1973 ◽
Vol 37
(7)
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pp. 800-801
1982 ◽
Vol 53
(2)
◽
pp. 263-272
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1967 ◽
Vol 25
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pp. 260-261
1975 ◽
Vol 33
◽
pp. 156-157
1978 ◽
Vol 36
(1)
◽
pp. 68-69
1978 ◽
Vol 36
(1)
◽
pp. 370-371
1975 ◽
Vol 33
◽
pp. 550-551
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1986 ◽
Vol 44
◽
pp. 888-889
1980 ◽
Vol 38
◽
pp. 822-825
1974 ◽
Vol 140
(1)
◽
pp. 27-45
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