Effect of Humidity and Bias on the Size of Nanostructures Fabricated by STM Anodization and its Application to Patterns

2016 ◽  
Vol 698 ◽  
pp. 35-40
Author(s):  
You Yin

In this paper, the effect of humidity and sample bias on the size of nanostructures fabricated by STM anodization on a 3 nm-thick Ti film was investigated by random nano-arrays. 3.5 V and 4 V bias were applied to samples at a relative humidity of ~30% while 3.5 V, 4 V and 4.5 V were applied to samples at a relative humidity of ~43%. According to the cross section analyses, dots scattered randomly on surfaces became larger and higher as the bias increased at a constant relative humidity or as the relative humidity increased at the same bias. Two complicated patterns were fabricated by running a program in which the movement of STM tip and the sample bias were defined.

Author(s):  
Kholliyev Askar Ergashovich ◽  
◽  
Fozilov Sherzod Musurmonovich ◽  

The article presents data obtained from the study of the daily intensity of transpiration during the flowering stage of soybean varieties. According to the data on the diurnal variation of transpiration intensity, this process was accelerated in Vilana and Ustoz MM-60 varieties of soybeans, and a relative decrease in intensity was observed in Baraka and Tomaris man-60 varieties. Different variations in the intensity of transpiration in the cross section of the studied varieties may depend on the biological characteristics of the varieties as well as the air temperature and its relative humidity level.


1998 ◽  
Vol 05 (03n04) ◽  
pp. 797-802 ◽  
Author(s):  
H. Hirayama ◽  
Y. Einaga ◽  
M. Koike ◽  
K. Takayanagi

The development of the cross-section scanning tunneling microscope (XSTM) and its application to the study of the cross-section of boron(B)-implanted Si wafers are reported. To obtain a cross-section of wafer samples, we examined the cleavage on the {111} plane in two ways. As a result the cleavage, by pushing the side of the sample wafer, was found to be preferable in obtaining a flat {111} cross-section from both (111) and (001) wafers. Our devices in the mounting angle and the guiding line for the cleavage are also described in detail, Using this XSTM, we observed the {111} cleaved cross-sectional surface of the B-implanted Si(111) wafer, The local surface structure was found to change on the cleaved cross-section from the 7 × 7 to the [Formula: see text] reconstruction through the disordered phase, The change was found to be consistent with the depth profile of the implanted B in the Si water. The arrangement of B and Si atoms in the disordered phase was determined by the site and the sample bias dependence of protrusions in STM images.


Author(s):  
V. Mizuhira ◽  
Y. Futaesaku

Previously we reported that tannic acid is a very effective fixative for proteins including polypeptides. Especially, in the cross section of microtubules, thirteen submits in A-tubule and eleven in B-tubule could be observed very clearly. An elastic fiber could be demonstrated very clearly, as an electron opaque, homogeneous fiber. However, tannic acid did not penetrate into the deep portion of the tissue-block. So we tried Catechin. This shows almost the same chemical natures as that of proteins, as tannic acid. Moreover, we thought that catechin should have two active-reaction sites, one is phenol,and the other is catechole. Catechole site should react with osmium, to make Os- black. Phenol-site should react with peroxidase existing perhydroxide.


Author(s):  
Tamotsu Ohno

The energy distribution in an electron; beam from an electron gun provided with a biased Wehnelt cylinder was measured by a retarding potential analyser. All the measurements were carried out with a beam of small angular divergence (<3xl0-4 rad) to eliminate the apparent increase of energy width as pointed out by Ichinokawa.The cross section of the beam from a gun with a tungsten hairpin cathode varies as shown in Fig.1a with the bias voltage Vg. The central part of the beam was analysed. An example of the integral curve as well as the energy spectrum is shown in Fig.2. The integral width of the spectrum ΔEi varies with Vg as shown in Fig.1b The width ΔEi is smaller than the Maxwellian width near the cut-off. As |Vg| is decreased, ΔEi increases beyond the Maxwellian width, reaches a maximum and then decreases. Note that the cross section of the beam enlarges with decreasing |Vg|.


2009 ◽  
Author(s):  
Marci Culley ◽  
Holly Angelique ◽  
Courte Voorhees ◽  
Brian John Bishop ◽  
Peta Louise Dzidic ◽  
...  

The work of multilayer glass structures for central and eccentric compression and bending are considered. The substantiation of the chosen research topic is made. The description and features of laminated glass for the structures investigated, their characteristics are presented. The analysis of the results obtained when testing for compression, compression with bending, simple bending of models of columns, beams, samples of laminated glass was made. Overview of the types and nature of destruction of the models are presented, diagrams of material operation are constructed, average values of the resistance of the cross-sections of samples are obtained, the table of destructive loads is generated. The need for development of a set of rules and guidelines for the design of glass structures, including laminated glass, for bearing elements, as well as standards for testing, rules for assessing the strength, stiffness, crack resistance and methods for determining the strength of control samples is emphasized. It is established that the strength properties of glass depend on the type of applied load and vary widely, and significantly lower than the corresponding normative values of the strength of heat-strengthened glass. The effect of the connecting polymeric material and manufacturing technology of laminated glass on the strength of the structure is also shown. The experimental values of the elastic modulus are different in different directions of the cross section and in the direction perpendicular to the glass layers are two times less than along the glass layers.


CFA Digest ◽  
2008 ◽  
Vol 38 (3) ◽  
pp. 55-56
Author(s):  
Kathryn Dixon Jost

Sign in / Sign up

Export Citation Format

Share Document