In Situ Investigations of Structures Evolution of Mg Doped Zn4Sb3

2017 ◽  
Vol 727 ◽  
pp. 178-184
Author(s):  
Yu Wang ◽  
Hong Li ◽  
Ying Guo Yang ◽  
Geng Wu Ji ◽  
Kong Chao Shen ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Thermal Annealing ◽  
Electronic Structures ◽  
Grazing Incidence ◽  
Beta Phase ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Thermal Stability Of

The beta-phase of Zn4Sb3 has been regarded as a very promising thermoelectric material since middle nineties, owing to its unique merit: intermediate temperature region (200-400 °C), made of cheap, non-toxic and abundant elements and high thermoelectric property. However, the thermal stability of Zn4Sb3 seems to be an inherent obstacle for the practical application during the working temperatures. Herein, magnesium doped Zn-Sb semiconductor (Mg0.04Zn3.96Sb3) was investigated thoroughly in-situ during thermal annealing up to 600 K, whilst both microstructure and electronic structures were recorded via the combination of synchrotron-based two dimensional X-ray diffraction techniques and the X-ray photoemission spectroscopy. While the time-resolved grazing incidence XRD reveals the preserved crystal structures during thermal annealing to 600 K, XPS measurement demonstrate the robustness of electronic structures. On basis of these findings, it was concluded in the end that the doping of magnesium significantly improves the thermal stability of zinc-antimonite compounds and introduces minor influence on the electronic structure of Zn-Sb alloy. Our study may propose an effective approach towards the wild application of Zn4Sb3 related thermoelectric materials.

scholarly journals Investigation of thermal stability of Cu/W multilayers by in situ X-ray diffraction

2016 ◽  
Vol 72 (a1) ◽  
pp. s418-s418 ◽  
Author(s):  
Claudia Cancellieri ◽  
Frank Moszner ◽  
Mirco Chiodi ◽  
Songhak Yoon ◽  
Daniel Ariosa ◽  
...  
Keyword(s):  
Thermal Stability ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Stability Of

Preparation and Characterization of PET/MMT Nanocomposition Modified by MDI

2014 ◽  
Vol 904 ◽  
pp. 7-9
Author(s):  
Xiao Hua Gu ◽  
Xi Wei Zhang ◽  
Bao Yun Xu ◽  
Peng Zeng
Keyword(s):  
Thermal Stability ◽  
In Situ Polymerization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermogravimetric Analyzer ◽  
Organic Montmorillonite ◽  
Polymerization Method ◽  
Thermal Stability Of

In this paper, the diphenyl methane diisocyanate (MDI) was used to modify montmorillonoid (MMT) and got the organic montmorillonite (OMMT), which was used with the monomers of PET by in situ polymerization method to prepare PET/MMT nanocomposition. The OMMT was analyzed by the X ray diffraction (XRD) to test the change of the spacing layer. Dispersion of MMT in the PET/MMT nanocomposites were studied with XRD and SEM and by means of thermogravimetric analyzer (TGA) on the thermal stability of PET/MMT nanocomposites. The results showed that, MDI modified MMT successfully, and the compatibility of MMT and PET was increased .

Thermal Stability and Internal Stress for Strongly (111) Oriented Cu Films

2003 ◽  
Vol 795 ◽  
Author(s):  
Sinji Takayama ◽  
Makato Oikawa ◽  
Tokuji Himuro
Keyword(s):  
Thermal Stability ◽  
Strain Distribution ◽  
Film Surface ◽  
Grazing Incidence ◽  
Internal Stresses ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cu Films ◽  
X Ray Scattering ◽  
Thermal Stability Of

ABSTRACTInternal stresses and thermal stability of strongly (111) oriented Cu thin films, which are one of promising interconnect materials in advanced ULSI devices, have been studied comparing with those of non-oriented Cu films. Their internal stresses parallel to a film surface were measured by a conventional X-ray diffraction technique (d-spacing vs. sin2ψ method), while the strain distribution with depth by a grazing incidence X-ray scattering (GIXS) methods. Large stress relaxation in strongly (111) oriented Cu films takes place at 200°C without showing any significant grain growth and formation of thermal defects like hillocks. The residual internal stresses of highly oriented (111) Cu films increase almost linearly throughout the thickness up to the substrates. The feature of stress distribution in film depth does not change on annealing. The changes of the residual stresses at each depth are nearly the same as stresses parallel to film surface measured.

Preparation and Thermal Stability of Pyrrole and m-Toluidine Copolymer/Montmorillonite Composites

2014 ◽  
Vol 915-916 ◽  
pp. 780-783
Author(s):  
Hong Wang ◽  
Ming Tian Li ◽  
Yue Lu ◽  
Di Liu
Keyword(s):  
Thermal Stability ◽  
Interfacial Interaction ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Chemical Polymerization ◽  
X Ray ◽  
Ft Ir ◽  
Clay Layers ◽  
Thermal Stability Of

Pyrrole and m-toluidine copolymer (P(PY/MT)) / montmorillonite (MMT) Composites were prepared by in situ chemical polymerization of pyrrole with m-toluidine monomer in the presence of montmorillonite. The structural, morphological and thermal properties of these composites were characterized by X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), and differential scanning calorimetry (DSC). X-ray diffraction result for P(PY/MT)-MMT illuminated the intercalation of P(PY/MT) copolymer between the clay layers. The FT-IR result showed the successful incorporation of montmorillonite clay in the prepared P(PY/MT)/MMT composite. The higher thermal stability of high MMT content rate might be attributed to its higher chain compactness due to the interfacial interaction between the P(PY/MT) and the clay.

scholarly journals Thermal stability of wurtzite Zr1−xAlxN coatings studied by in situ high-energy x-ray diffraction during annealing

2015 ◽  
Vol 118 (3) ◽  
pp. 035309 ◽  
Author(s):  
L. Rogström ◽  
N. Ghafoor ◽  
J. Schroeder ◽  
N. Schell ◽  
J. Birch ◽  
...  
Keyword(s):  
Thermal Stability ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Stability Of
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