Near Surface Interface Studies Using Glancing Angle X-Ray Techniques: Application to Corrosion of Alloys and Ion Beam Mixing of Multilayers

1993 ◽  
Vol 126-128 ◽  
pp. 595-598 ◽  
Author(s):  
P.N. Gibson ◽  
T.A. Crabb ◽  
E. McAlpine ◽  
R. Falcone
1989 ◽  
Vol 213 (2-3) ◽  
pp. A230
Author(s):  
M. StróŻak ◽  
P. MikoŁajczak ◽  
M. Subotowicz
Keyword(s):  
Ion Beam ◽  

2000 ◽  
Vol 70 (1) ◽  
pp. 59-63 ◽  
Author(s):  
Y.S. Lee ◽  
K.Y. Lim ◽  
Y.D. Chung ◽  
C.N. Whang ◽  
Y. Jeon

2005 ◽  
Vol 04 (03) ◽  
pp. 269-286 ◽  
Author(s):  
F. WATT ◽  
A. A. BETTIOL ◽  
J. A. VAN KAN ◽  
E. J. TEO ◽  
M. B. H. BREESE

To overcome the diffraction constraints of traditional optical lithography, the next generation lithographies (NGLs) will utilize any one or more of EUV (extreme ultraviolet), X-ray, electron or ion beam technologies to produce sub-100 nm features. Perhaps the most under-developed and under-rated is the utilization of ions for lithographic purposes. All three ion beam techniques, FIB (Focused Ion Beam), Proton Beam Writing (p-beam writing) and Ion Projection Lithography (IPL) have now breached the technologically difficult 100 nm barrier, and are now capable of fabricating structures at the nanoscale. FIB, p-beam writing and IPL have the flexibility and potential to become leading contenders as NGLs. The three ion beam techniques have widely different attributes, and as such have their own strengths, niche areas and application areas. The physical principles underlying ion beam interactions with materials are described, together with a comparison with other lithographic techniques (electron beam writing and EUV/X-ray lithography). IPL follows the traditional lines of lithography, utilizing large area masks through which a pattern is replicated in resist material which can be used to modify the near-surface properties. In IPL, the complete absence of diffraction effects coupled with ability to tailor the depth of ion penetration to suit the resist thickness or the depth of modification are prime characteristics of this technique, as is the ability to pattern a large area in a single brief irradiation exposure without any wet processing steps. p-beam writing and FIB are direct write (maskless) processes, which for a long time have been considered too slow for mass production. However, these two techniques may have some distinct advantages when used in combination with nanoimprinting and pattern transfer. FIB can produce master stamps in any material, and p-beam writing is ideal for producing three-dimensional high-aspect ratio metallic stamps of precise geometry. The transfer of large scale patterns using nanoimprinting represents a technique of high potential for the mass production of a new generation of high area, high density, low dimensional structures. Finally a cross section of applications are chosen to demonstrate the potential of these new generation ion beam nanolithographies.


1989 ◽  
Vol 213 (2-3) ◽  
pp. 580-587 ◽  
Author(s):  
M. Stróżak ◽  
P. Mikołajczak ◽  
M. Subotowicz
Keyword(s):  
Ion Beam ◽  

2010 ◽  
Vol 207 (3) ◽  
pp. 743-747 ◽  
Author(s):  
D. A. Zatsepin ◽  
S. Kaschieva ◽  
M. Zier ◽  
B. Schmidt ◽  
H.-J. Fitting

Author(s):  
L. K. Mansur ◽  
E. H. Lee

Ion implantation, ion beam mixing, and ion beam stimulated reactions can be discussed as somewhat distinct but related processes. The first two emphasize compositional changes in near-surface regions. The last relies mainly on microstructural and precipitation reactions caused by atomic displacements. In this last area much of the work has been carried out in metallic alloys. Here we summarize experiments in our laboratory that cover several ion-beam-induced reactions in Fe-15Ni-15Cr base alloys, to provide a perspective on related work in materials other than silicon. The techniques and mechanistic interpretations of results are applicable to a variety of materials.This is a powerful way to examine the interplay of characteristic relaxation times. Intervals of high point defect production and resultant processes, such as solute segregation and drift-directed clustering, are alternated with thermal annealing. Remarkable changes with respect to either steady bombardment or thermal aging at the same temperature can be produced. Figure 1(a) shows theoretically calculated fluctuating vacancy concentration in a steady irradiation.


1999 ◽  
Vol 570 ◽  
Author(s):  
A. Judy ◽  
M.V. Ramana Murty ◽  
E. Butler ◽  
J. Pomeroy ◽  
B.H. Cooper ◽  
...  

ABSTRACTUsing Scanning Tunneling Microscopy(STM) and X-ray diffraction(XRD), we have studied the development of surface roughness on Au(111) during 500eV Ar+ ion irradiation at different angles. During normal incidence erosion the surface roughens and pattern formation occurs. The surface morphology is a mixture of mounds and pits superimposed onto a larger structure of channels and valleys. The characteristic spacing between features grows with a power law behavior t27, where t is the amount of time the sample was irradiated, in agreement with previous measurements[l]. At glancing angles, erosion proceeds smoothly, but not in layer-by-layer fashion. Finally, a combination of glancing angle and normal incidence erosion is used to create a rippled morphology


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