Depth- and Time-Resolved Free Carrier Absorption in 4H SiC Epilayers: A Study of Carrier Recombination and Transport Parameters

1998 ◽  
Vol 264-268 ◽  
pp. 529-532 ◽  
Author(s):  
Vytautas Grivickas ◽  
Jan Linnros ◽  
Augustinas Galeckas
Keyword(s):  
Free Carrier ◽  
Free Carrier Absorption ◽  
Transport Parameters ◽  
Time Resolved ◽  
Carrier Recombination ◽  
Carrier Absorption

Time-resolved measurement of free carrier absorption, diffusivity, and internal quantum efficiency in silicon

2013 ◽  
Vol 103 (9) ◽  
pp. 092101 ◽  
Author(s):  
Jet Meitzner ◽  
Frederick G. Moore ◽  
Brock M. Tillotson ◽  
Stephen D. Kevan ◽  
Geraldine L. Richmond
Keyword(s):  
Quantum Efficiency ◽  
Internal Quantum Efficiency ◽  
Free Carrier ◽  
Free Carrier Absorption ◽  
Time Resolved ◽  
Carrier Absorption

Nonequilibrium Carrier Recombination in Highly Excited Bulk SiC Crystals

2010 ◽  
Vol 645-648 ◽  
pp. 215-218 ◽  
Author(s):  
Kęstutis Jarašiūnas ◽  
Patrik Ščajev ◽  
Vytautas Gudelis ◽  
Paul B. Klein ◽  
Masashi Kato
Keyword(s):  
Cross Sections ◽  
Free Carrier Absorption ◽  
Decay Kinetics ◽  
Recombination Rates ◽  
Time Resolved ◽  
Carrier Recombination ◽  
A Value ◽  
Numerical Fitting ◽  
Carrier Absorption ◽  
Linear And Nonlinear

We applied time-resolved free carrier absorption (FCA) to monitor non-equilibrium carrier dynamics in 4H epilayers and 3C SiC bulk crystals at excess carrier densities in the N = 1017 - 1019 cm-3 range. The numerical fitting of FCA decay kinetics provided the linear and nonlinear carrier recombination rates in the 40-390 K range and the absorption cross-sections eh at 1064 nm. In 4H, the decrease of the bulk lifetime (800 ns) with excitation provided the bimolecular and Auger coefficients B=(1.2±0.4)×10-12 cm3/s and C=(7±4)×10-31cm6/s, respectively, at room temperature. These values for 3C were 55-150 ns, (2.0±0.4)×10-12 cm3/s, and (2±1)×10-32 cm6/s, respectively. The rate of linear and nonlinear recombination increased at lower temperatures. A value of eh =4.4×10-18 cm2 for 3C SiC at 1.064 m was found 2.3 times smaller than that for 4H SiC.

Effect of Epitaxial Stresses on the Time Dynamics of Photoexcited Charge Carriers in InGaAs−Based Superlattices

MRS Advances ◽  
2019 ◽  
Vol 4 (1) ◽  
pp. 15-20
Author(s):  
Arseniy Buryakov ◽  
Dinar Khusyainov ◽  
Elena Mishina ◽  
Alexandr Yachmenev ◽  
Rustam Khabibullin ◽  
...  
Keyword(s):  
Relaxation Times ◽  
Photon Absorption ◽  
Free Carrier Absorption ◽  
Optical Pump ◽  
Time Resolved ◽  
Time Dynamics ◽  
Two Photon Absorption ◽  
Carrier Recombination ◽  
Wide Range ◽  
Carrier Absorption

ABSTRACTWe report on the time-resolved measurements of photocarrier dynamics in InGaAs/InAlAs superlattices with epitaxial stresses in a wide range of optical pump fluences. We demonstrated that the contribution of free carrier absorption and two-photon absorption to the carrier dynamics decreases with an increase of epitaxial stresses. The lowest relaxation times of 1.7 and 8.3 ps, respectively attributed to carrier trapping and carrier recombination, were obtained for the structure with maximum epitaxial stresses.

Optically Detected Temperature Dependences of Carrier Lifetime and Diffusion Coefficient in 4H- and 3C-SiC

2011 ◽  
Vol 679-680 ◽  
pp. 205-208 ◽  
Author(s):  
Jawad ul Hassan ◽  
Patrik Ščajev ◽  
Kęstutis Jarašiūnas ◽  
Peder Bergman
Keyword(s):  
Diffusion Coefficient ◽  
Decay Time ◽  
Carrier Lifetime ◽  
Free Carrier ◽  
Free Carrier Absorption ◽  
Time Resolved ◽  
Temperature Dependences ◽  
Carrier Absorption ◽  
Time Resolved Photoluminescence ◽  
And Diffusion

Free carrier dynamics has been studied in 4H- and 3C-SiC in a wide temperature range using time-resolved photoluminescence, free carrier absorption, and light induced transient grating techniques. Considerably high carrier lifetime was observed in 3C-SiC epitaxial layers grown on 4H-SiC substrates using hot-wall CVD with respect to previously reported values for 3C-SiC grown either on Si or on 6H-SiC substrates. The temperature dependences of carrier lifetime and diffusion coefficient for 4H- and 3C-SiC were compared. Shorter photoluminescence decay time with respect to free carrier absorption decay time was observed in the same 4H-SiC sample, while these techniques revealed similar trends in the carrier lifetime temperature dependencies. However, the latter dependences for hot-wall CVD-grown 3C layers were found different if measured by time resolved photoluminescence and free carrier absorption techniques.

Time-resolved Ellipsometry to Study Extreme Non-equilibrium Electron Dynamics in Nanostructured Semiconductors

2012 ◽  
Vol 1426 ◽  
pp. 395-400
Author(s):  
T. W. Roger ◽  
A. Kaplan
Keyword(s):  
Silicon Nanocrystals ◽  
Crystalline Silicon ◽  
Free Carrier ◽  
Free Carrier Absorption ◽  
Electron Dynamics ◽  
Silicon Phase ◽  
Time Resolved ◽  
Pump Probe ◽  
Carrier Absorption ◽  
Nanostructured Semiconductors

ABSTRACTWe present a femtosecond pump-probe ellipsometer operating over a spectral range of 1.4 – 1.7 eV with a ∼50fs time resolution. The calibration and preliminary findings of the setup are discussed. We tested the apparatus on bulk crystalline silicon (not shown here) and on silicon nanocrystals embedded in an amorphous silicon phase. The ellipsometric angles (ψ, Δ) were determined as a function of time and wavelength. The results suggest that a simple Drude model of free carrier absorption is not sufficient to explain the findings.

4-QAM OFDM Data Switching via Free Carrier Absorption in Si-Rich SiC Waveguide

2021 ◽  
Vol 27 (3) ◽  
pp. 1-11
Author(s):  
Yen-Wei Hsueh ◽  
Chih-Hsien Cheng ◽  
Cai-Syuan Fu ◽  
Huai-Yung Wang ◽  
Bo-Ji Huang ◽  
...  
Keyword(s):  
Free Carrier ◽  
Free Carrier Absorption ◽  
Carrier Absorption ◽  
Data Switching
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