Orientations of Recrystallization Nuclei Studied by 3DXRD

Materials Science Forum ◽

10.4028/www.scientific.net/msf.495-497.1285 ◽

2005 ◽

Vol 495-497 ◽

pp. 1285-1290 ◽

Cited By ~ 1

Author(s):

Dorte Juul Jensen ◽

A.W. Larsen

Keyword(s):

Critical Point ◽

Boundary Migration ◽

X Ray Diffraction ◽

X Ray ◽

Deformation Microstructure ◽

3 Dimensional ◽

Nucleation Mechanisms ◽

Crystallographic Orientations

A critical point in the understanding of recrystallization textures is the development of crystallographic orientations of the nuclei. Here an issue, which has been debated much recently [eg. 1], is if nuclei have orientations identical to those of the deformation microstructures from which they originate or not. Traditional nucleation mechanisms like strain induced boundary migration [2] and particle stimulated nucleation [3] operate with nuclei orientations identical to the “parent”deformation microstructure. This is also what is commonly incorporated in recrystallization modeling. However, a number of studies have found recrystallization nuclei in orientations that were not expected from measurements on deformed structures. Some of these results are reviewed and discussed in this paper, and new in-situ results obtained by the 3 dimensional X-ray diffraction (3DXR) method are presented.

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Recrystallization of AA1050 Studied by 3DXRD

Materials Science Forum ◽

10.4028/www.scientific.net/msf.519-521.1569 ◽

2006 ◽

Vol 519-521 ◽

pp. 1569-1578

Author(s):

Dorte Juul Jensen

Keyword(s):

Single Crystals ◽

High Energy ◽

Nucleation And Growth ◽

X Rays ◽

X Ray Diffraction ◽

Orientation Relationships ◽

X Ray ◽

3 Dimensional ◽

Kinetics Of

By 3 dimensional X-ray diffraction (3DXRD) using high energy X-rays from synchrotron sources it is possible to study in-situ the nucleation and growth during recrystallization. In this paper it is described and discussed how 3DXRD can supplement EBSP measurements of nucleation and growth. Three types of studies are considered: i) orientation relationships between nuclei and parent deformed matrix, ii) recrystallization kinetics of individual bulk grains and iii) filming of growing grains in deformed single crystals.

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A method for in-situ measurements of the growth in the bulk of deformed single crystals at the 3DXRD microscope

MRS Proceedings ◽

10.1557/proc-819-n6.3 ◽

2004 ◽

Vol 819 ◽

Author(s):

S. Schmidt ◽

D. Juul Jensen

Keyword(s):

Spatial Information ◽

Boundary Migration ◽

Three Dimensional ◽

European Synchrotron Radiation Facility ◽

X Ray Diffraction ◽

X Ray ◽

Local Boundary ◽

Migration Rates ◽

Spatial Grain

AbstractWith the Three Dimensional X-ray Diffraction microscope (3DXRD) located at the European Synchrotron Radiation Facility (ESRF) full 3D spatial information of grains in the interior of a sample can be measured non-destructively. In this paper we discuss the possibility of an extension to this scenario, namely in-situ annealing studies, where the 3D spatial grain shape can be monitored as function of time. Consequently, local boundary migration rates can be estimated and compared to the deformed microstructure. Such information may reveal to what extend the deformed microstructure influences the growth of a grain during recrystallization.

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The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071107 ◽

1973 ◽

Vol 31 ◽

pp. 132-133 ◽

Cited By ~ 1

Author(s):

R. E. Herfert

Keyword(s):

Surface Characterization ◽

Analytical Techniques ◽

X Ray Diffraction ◽

Depth Of Penetration ◽

X Ray ◽

The Past ◽

Transmission Electron ◽

Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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The 3-Dimensional Molecular Structure of the Actin Filament Revisited

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100119223 ◽

1985 ◽

Vol 43 ◽

pp. 480-481

Author(s):

U. Aebi ◽

R. Millonig ◽

H. Salvo

Keyword(s):

Actin Filament ◽

Supramolecular Assembly ◽

Specimen Preparation ◽

X Ray Diffraction ◽

Single Filament ◽

X Ray ◽

3 Dimensional ◽

Filament Diameter ◽

Preparation Conditions ◽

Apparent Diameter

To date, most 3-D reconstructions of undecorated actin filaments have been obtained from actin filament paracrystal data (for refs, see 1,2). However, due to the fact that (a) the paracrystals may be several filament layers thick, and (b) adjacent filaments may sustantially interdigitate, these reconstructions may be subject to significant artifacts. None of these reconstructions has permitted unambiguous tracing or orientation of the actin subunits within the filament. Furthermore, measured values for the maximal filament diameter both determined by EM and by X-ray diffraction analysis, vary between 6 and 10 nm. Obviously, the apparent diameter of the actin filament revealed in the EM will critically depend on specimen preparation, since it is a rather flexible supramolecular assembly which can easily be bent or distorted. To resolve some of these ambiguities, we have explored specimen preparation conditions which may preserve single filaments sufficiently straight and helically ordered to be suitable for single filament 3-D reconstructions, possibly revealing molecular detail.

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