Fabrication and Use of Atomically Smooth Steps on 6H-SiC for Calibration of z-Displacements in Scanning Probe Microscopy

2010 ◽  
Vol 645-648 ◽  
pp. 767-770 ◽  
Author(s):  
Sergey P. Lebedev ◽  
P.A. Dement’ev ◽  
Alexander A. Lebedev ◽  
V.N. Petrov ◽  
Alexander N. Titkov
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
High Temperature Annealing ◽  
Structured Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Annealing Procedure ◽  
Test Objects

Atomic-force microscopy and scanning tunnel electron microscopy have been used to study the surface of single-crystal 6H-SiC (0001) substrates subjected to step-by-step high-temperature annealing in vacuum. An annealing procedure leading to surface structuring by atomically smooth steps with heights of 0.75 and 1.5 nm has been found. It is suggested to use the structured surfaces as test objects for z-calibration of scanning probe microscopes.

scholarly journals Исследование пленок диметилдиимида перилентетракарбоновой кислоты методами циклической термодесорбции и сканирующей зондовой микроскопии

2018 ◽  
Vol 60 (2) ◽  
pp. 255
Author(s):  
А.Е. Почтенный ◽  
А.Н. Лаппо ◽  
И.П. Ильюшонок
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Bandgap Width ◽  
Kelvin Probe ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Spectroscopy

AbstractSome results of studying the direct-current (DC) conductivity of perylenetetracarboxylic acid dimethylimide films by cyclic oxygen thermal desorption are presented. The microscopic parameters of hopping electron transport over localized impurity and intrinsic states were determined. The bandgap width and the sign of major current carriers were determined by scanning probe microscopy methods (atomic force microscopy, scanning probe spectroscopy, and photoassisted Kelvin probe force microscopy). The possibility of the application of photoassisted scanning tunneling microscopy for the nanoscale phase analysis of photoconductive films is discussed.

scholarly journals Microscopia de varredura por sonda (SPM) aplicada a aços inoxidáveis dúplex

2007 ◽  
Vol 60 (1) ◽  
pp. 183-187
Author(s):  
Fabricio Simão dos Santos ◽  
Simoni Maria Gheno ◽  
Sebastião Elias Kuri
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Nesse trabalho, a microscopia de varredura por sonda (Scanning Probe Microscopy - SPM), nos modos contato (Atomic Force Microscopy - AFM) e de força magnética (Magnetic Force Microscopy - MFM), foi utilizada para analisar a microestrutura de um aço inoxidável dúplex 2205 solubilizado e envelhecido. Foi feita uma análise por AFM da superfície do aço solubilizado após crescimento de filme passivo. Por AFM, obteve-se indicação de crescimento de filme sobre a microestrutura do aço solubilizado, enquanto por MFM a distribuição de fases pôde ser observada sem a necessidade de ataque da superfície.

2012 Microscopy Today Innovation Awards

2012 ◽  
Vol 20 (5) ◽  
pp. 46-51
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Force Microscopy ◽  
The Third ◽  
Atomic Force ◽  
Transmission Electron ◽  
Analytical Microscopy ◽  
Microscopy Techniques

Microscopy Today congratulates the third annual group of Innovation Award winners. The ten innovations described below move several microscopy techniques forward: atomic force microscopy, transmission electron microscopy, light microscopy, scanning probe microscopy, electron microscopy, and analytical microscopy. These innovations will make imaging and analysis more powerful, more flexible, more productive, and easier to accomplish.

scholarly journals Pushing the Envelope in Atomic Force Microscopy

2009 ◽  
Vol 17 (2) ◽  
pp. 26-29
Author(s):  
Monteith G. Heaton ◽  
Jason P. Cleveland
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Molecular Forces ◽  
New Instruments

Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. However, aside from some interesting tweaks, add-ons and repackaging, the field has seen no fundamentally new instruments for several years. For the extremely high-resolution AFM/SPMs, there has literally been no completely new microscope for well over a decade. We report here on the new CypherTM AFM from Asylum Research (Figure 1). that delivers upgrades from the existing field of older AFM/SPMs on a variety of levels.

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