Phase Development and Dielectric Properties of 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3 Ceramic

2011 ◽  
Vol 700 ◽  
pp. 58-62
Author(s):  
Rachanusorn Roongtao ◽  
Supagorn Rugmai ◽  
Wanwilai C. Vittayakorn
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
Loss Factor ◽  
X Ray Diffraction ◽  
Phase Purity ◽  
X Ray ◽  
Phase Development ◽  
Scanning Electron

The 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3ceramics has been synthesized through a conventional mixed-oxide by using BT nanopowder and BMN micropowder. The phase purity of the powders and the ceramics was examined using X-ray diffraction (XRD). The 0.98BT-0.02BMN powders were sintered to 92% of the theoretical density at a temperature of 1300 °C for 2 h. The microstructure of the sintered surface was investigated using scanning electron microscopy (SEM). The dielectric constant (εr) and loss factor (tanδ) of the sintered pellets at Curie temperture were 3000 and 0.015, respectively.

scholarly journals Hydrothermal synthesis and characteristics of lanthanumdoped pb(Zr₀.₆₅Ti ₀.₃₅)O₃ ceramics

2021 ◽  
Vol 8 (3) ◽  
pp. 14-19
Author(s):  
Thuy Nguyen Thanh ◽  
Tung Nguyen Van ◽  
Hung Nguyen Trong ◽  
Minh Cao Duy
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Reaction Temperature ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Influence Of Ph ◽  
Scanning Electron

Lanthanum-doped lead zirconate titanate (PLZT) powders were synthesized using thehydrothermal method. The influence of pH, reaction temperature and time, lanthanum concentration on the formation and characteristics of PLZT were investigated. Obtained powders were investigated using X-ray diffraction analysis (XRD), scanning electron microscopy (SEM) techniques and a dielectric analyzer. The results showed that           Pb1-xLax(Zr0.65Ti0.35)O3 with x= 0.0 – 0.1 were well formed under conditions: pH≥13, reaction time of 12hrs, reaction temperature of 180oC. Dielectric constant of PLZT is higher than PZT. The grain size of the PLZT is found to be 1–3.5 µm.

Preparation and Properties of CCTO-BCTO Ceramics with Ultrahigh Dielectric Constant

2013 ◽  
Vol 760-762 ◽  
pp. 705-708
Author(s):  
La Chen ◽  
Wei Li ◽  
Zhao Xian Xiong ◽  
Chun Xiao Song ◽  
Hong Qiu
Keyword(s):  
Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Optimum Amount ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Impedance Characteristics ◽  
Lcr Meter ◽  
Scanning Electron

Ceramics of (1-x)CaCu3Ti4O12-xBi2/3Cu3Ti4O12, i.e., CCTO-BCTO, with x=0, 0.01, 0.1 and 0.25, respectively, were prepared via the conventional solid-state reaction. The phase structure of the ceramics was identified by X-ray diffraction. The microstructure of the sample was observed with scanning electron microscopy. Dielectric properties and impedance spectroscopy were measured using a LCR Meter, in which 0.9CCTO-0.1BCTO displayed highest dielectric constant (584108) and lowest dielectric loss (0.42) at 1kHz among the four kinds of specimens. Based on series of experimental results, an optimum amount of x was able to improve the dielectric properties of CCTO-BCTO, through adjusting the impedance characteristics of the grain and grain boundary.

scholarly journals Phase, microstructure and microwave dielectric properties of Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics

2015 ◽  
Vol 33 (1) ◽  
pp. 95-99 ◽  
Author(s):  
Abdul Manan ◽  
Dil Nawaz Khan ◽  
Atta Ullah ◽  
Arbab Safeer Ahmad
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Secondary Phase ◽  
Network Analyzer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microwave Dielectric ◽  
Scanning Electron

AbstractMg0:95Ni0:05Ti0:98Zr0:02O3 ceramics was prepared via conventional solid-state mixed-oxide route. The phase, microstructure and microwave dielectric properties of the sintered samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and a vector network analyzer. The microstructure comprised of circular and elongated plate-like grains. The semi quantitative analysis (EDS) of the circular and elongated grains revealed the existence of Mg0:95Ni0:05T2O5 as a secondary phase along with the parent Mg0:95Ni0:05Ti0:98Zr0:02O3 phase, which was consistent with the XRD findings. In the present study, εr ~17.1, Qufo~195855 ± 2550 GHz and τf ~ -46 ppm/K was achieved for the synthesized Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics sintered at 1325 °C for 4 h.

STUDY OF HYDROTHERMAL SYNTHESIS AND PROPERTIES OF Bi2Fe4O9

2010 ◽  
Vol 03 (03) ◽  
pp. 173-176 ◽  
Author(s):  
YIBO WANG ◽  
HUAJUN SUN ◽  
JING ZHOU ◽  
BO LI ◽  
CHENGYONG ZHANG ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transformation ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Impedance Analyzer ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Highly oriented Bi2Fe4O9 nanosheets can be fabricated with Fe(NO3)3 ⋅ 9H2O and Bi(NO3)3 ⋅ 5H2O using the low-temperature hydrothermal method. The as-prepared powders are characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM) and high-resolution transmission electron microscopy (HRTEM), which exhibit an excellent orientation along the (00l) planes. The leakage current density and dielectric properties of the nanosheet samples are measured by Radiant Precision Workstation and HP4291B Impedance Analyzer, respectively. The effects of NaOH concentration on the phase transformation, sheet size and morphologies of the Bi2Fe4O9 crystallites are studied in this paper.

Structure and Properties of Bi0.5Na0.5TiO3-BaTiO3 Compound Ceramics

2011 ◽  
Vol 411 ◽  
pp. 503-507
Author(s):  
Xiao Juan Li ◽  
Zeng Zhe Xi ◽  
Wei Long ◽  
Zhi Gang Zhang ◽  
Jia Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Diffraction Analysis ◽  
Structure And Properties ◽  
X Ray Diffraction ◽  
Oriented Growth ◽  
X Ray ◽  
Scanning Electron

The Bi0.5Na0.5TiO3-xwt%BaTiO3 compound ceramics were prepared. The influence of different BaTiO3 content on structure was evaluated by scanning electron microscopy and X-ray diffraction analysis. The results show oriented is induced by plate-like BaTiO3 template. Signficant improvement of the piezoelectric (d33 = 112 pC/N) and dielectric properties ( max ≈ 5500) was observed. The improvement was attested to the apparent alignment of the BaTiO3 templates and grain oriented growth.

Enhanced Dielectric Properties of Sintered MgFe1.98Nd0.02O4 Nanoparticles

2020 ◽  
Vol 42 (1) ◽  
pp. 87-87
Author(s):  
U Rafiq U Rafiq ◽  
M Hanif M Hanif ◽  
M Anis ur Rehman and A Ul Haq M Anis ur Rehman and A Ul Haq
Keyword(s):  
Dielectric Properties ◽  
Loss Factor ◽  
Room Temperature ◽  
Grain Shape ◽  
Sol Gel ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
Phase Purity ◽  
X Ray ◽  
Scanning Electron

Spinal MgFe1.98Nd0.02O4 was prepared by simplified sol-gel method. To measure the dielectric properties samples were sintered from 700-800 oC in the steps of 50 oC. The sample’s phase purity, crystallographic phase and crystallite size was measured by X-ray diffraction method (XRD). The pellets were analyzed in Scanning Electron Microscope for their surface morphology and grain shape. Dielectric properties were measured from 20 Hz to 3 MHz at room temperature. Samples sintered at 750 oC, showed highest value of AC conductivity which indicated that the material is suitable for use in sensors. However, minimum value of dielectric loss factor was obtained at 800 and#176;C which makes it more suitable for antenna applications.

Microstructural and Dielectrical Properties for Ceramics and Thin Films of the xPbTiO3-(1−x)SrTiO3 Solid Solution

2001 ◽  
Vol 688 ◽  
Author(s):  
E. Martínez ◽  
A. Fundora ◽  
O. Blanco ◽  
S. García ◽  
E. Heredia ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Integrated Circuit ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Technique ◽  
Dielectrical Properties ◽  
Scanning Electron

AbstractSrTiO3 and PbTiO3 perovskites are combined to form the xPbTiO3-(1−x)SrTiO3 (PST) solid solution. The effect of the PbTiO3 content on the microstructural and dielectric properties is studied for different compositions (x=0.1,0.3,0.5,0.7, and 0.9). Microstructural features of the PST system are studied by X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) techniques. Electrical properties are studied by the thermoelectric analysis technique at both fixed frequency and varying frequency to study the behavior of the dielectric constant and dielectric loss.Films of 0.5PbTiO3-0.5SrTiO3 (PST50) have been obtained by RF ion sputtering on different substrates. We investigate the relation between the crystalline structure and the dielectric properties of PST50 films deposited on different metallic films. Scanning Electron Microscopy (SEM) and X-Ray Diffraction were used for the structural analysis of the PST50/TiN/Si and PST50/RuO2/TiN /Si systems. The dielectric properties of the PST50 films were measured for TiN/PST50/TiN/Si, and RuO2/PST50/RuO2/TiN/Si capacitors and the results were correlated to the structure and composition. The charge storage capabilities of the PST50 films are evaluated for possible application in integrated circuit technology.

scholarly journals SYNTHESIS AND DIELECTRIC PROPERTIES OF FOUR-LAYERED AURIVILLIUS SrBi4Ti4O15 DOPED Nd3+ AND Mn4+

2016 ◽  
Vol 11 (2) ◽  
pp. 127
Author(s):  
Sestry Misfadhila ◽  
Evi Adhelina ◽  
Yestria Rilda ◽  
Syukri Arief ◽  
Zulhadjri Zulhadjri
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Xrd Analysis ◽  
Orthorhombic Symmetry ◽  
Molten Salt Method ◽  
X Ray Diffraction ◽  
Aurivillius Phase ◽  
X Ray ◽  
Scanning Electron

<p>Synthesis of four-layered Aurivillius compound doped with Nd<sup>3+</sup> and Mn<sup>4+ </sup>cations, SrBi<sub>3.5</sub>Nd<sub>0.5</sub>Ti<sub>4-x</sub>Mn<sub>x</sub>O<sub>15</sub> (<em>x</em> = 0; 0.5; 1) was carried out using molten salt method with a mixture of Na<sub>2</sub>SO<sub>4</sub>/K<sub>2</sub>SO<sub>4</sub> as a flux. The synthesized products were characterized using X-ray diffraction (XRD) and refined by <em>Le Bail</em> technique. The results of XRD analysis show that the four-layered Aurivillius compound formed, however there are additional peaks identified as perovskite and Bi<sub>7.68</sub>Ti<sub>0.32</sub>O<sub>12.16</sub>  phases for <em>x</em> = 0 and perovskite and Sr<sub>4</sub>Ti<sub>3</sub>O<sub>10</sub>phases for <em>x</em> = 0.5 and 1. The results of refinement show that four-layered Aurivillius phase formed has orthorhombic symmetry with <em>A2<sub>1</sub>am</em> space group. Scanning Electron Microscopy (SEM) shows the plate like morphology that are characteristic of Aurivillius compound. Dielectric constant of the samples show increasing value as increasing of Mn<sup>4+</sup> concentration.</p>

Effects of B2O3 Contents on Crystallization Behaviors and Dielectric Properties of CaO-B2O3-SiO2 Glass Ceramics

2016 ◽  
Vol 680 ◽  
pp. 301-305 ◽  
Author(s):  
Ai Qing Jia ◽  
Wei Jun Zhang ◽  
Xing Yu Cheng ◽  
Zhuo Feng Liu
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Boron Content ◽  
Glass Ceramics ◽  
Molar Ratio ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Scanning Electron

The CaO-B2O3-SiO2 glass ceramics system with four different boron contents (14 wt. %, 16.4 wt. %, 18.6 wt. %, 21 wt. %) were prepared under 900oC. The properties and microstructures are characterized by Differential Scanning Calorimeter (DSC), X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). The effects of boron contents on the composition of crystalline phases and the properties of CaO-B2O3-SiO2 glass ceramics system were studied. The results show that when the molar ratio of CaO/SiO2 is 1.06, as the content of B2O3 increases, the major crystalline phases experiences the transformation from CaSiO3 to CaB2O4 and the content of α-SiO2 crystalline phase decreases, and the dielectric constant increases firstly but it decreases after the content of B2O3 reaches to 18.6 wt. %, while the dielectric loss tgδ of decreases gradually with the addition of boron content. When the content of B2O3 is 16.4 wt. %, the CaO-B2O3-SiO2 glass ceramics with a bulk density of 2.47 g/cm3 exhibits good dielectric properties (1 MHz): εr=6.03, tgδ=3.49×10-3.

Study of Structural, Surface Morphological and Dielectric Properties of Cu-Doped Tin Oxide Nanoparticles

2015 ◽  
Vol 34 ◽  
pp. 91-97 ◽  
Author(s):  
Suresh Sagadevan
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dielectric Properties ◽  
Wavelength Region ◽  
Average Crystalline Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Cu doped SnO2nanoparticles were prepared using the chemical precipitation method. The Cu doped SnO2nanoparticles have been characterized by powder X-ray diffraction (XRD) analysis, Scanning electron microscopy (SEM), elemental dispersive X-ray (EDX) analysis, Transmission electron microscopy (TEM), UV-Visible absorption spectrum and Dielectric studies. The average crystalline size of Cu doped SnO2nanoparticles was calculated from the X-ray diffraction (XRD) pattern and found to be 15 nm and it was further confirmed from the transmission electron microscopy (TEM) studies. The scanning electron microscopy (SEM) analysis showed that the nanoparticles agglomerate forming spherical-shaped particles. The elemental composition of Cu doped SnO2nanoparticles was analyzed by Energy Dispersive X-ray (EDX) spectrum. The optical absorption study clearly shows that the absorption edge shift towards the higher wavelength region. The dielectric properties of Cu doped SnO2nanoparticles have been studied in the different frequency at different temperatures. The dielectric constant and dielectric loss of the Cu doped SnO2nanoparticles decreases with increase in frequency. Cu doped SnO2nanoparticles were prepared using the chemical precipitation method. The Cu doped SnO2nanoparticles have been characterized by powder X-ray diffraction (XRD) analysis, Scanning electron microscopy (SEM), elemental dispersive X-ray (EDX) analysis, Transmission electron microscopy (TEM), UV-Visible absorption spectrum and Dielectric studies. The average crystalline size of Cu doped SnO2nanoparticles was calculated from the X-ray diffraction (XRD) pattern and found to be 15 nm and it was further confirmed from the transmission electron microscopy (TEM) studies. The scanning electron microscopy (SEM) analysis showed that the nanoparticles agglomerate forming spherical-shaped particles. The elemental composition of Cu doped SnO2nanoparticles was analyzed by Energy Dispersive X-ray (EDX) spectrum. The optical absorption study clearly shows that the absorption edge shift towards the higher wavelength region. The dielectric properties of Cu doped SnO2nanoparticles have been studied in the different frequency at different temperatures. The dielectric constant and dielectric loss of the Cu doped SnO2nanoparticles decreases with increase in frequency.

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