Preparation and Properties of CCTO-BCTO Ceramics with Ultrahigh Dielectric Constant

2013 ◽  
Vol 760-762 ◽  
pp. 705-708
Author(s):  
La Chen ◽  
Wei Li ◽  
Zhao Xian Xiong ◽  
Chun Xiao Song ◽  
Hong Qiu
Keyword(s):  
Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Optimum Amount ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Impedance Characteristics ◽  
Lcr Meter ◽  
Scanning Electron

Ceramics of (1-x)CaCu3Ti4O12-xBi2/3Cu3Ti4O12, i.e., CCTO-BCTO, with x=0, 0.01, 0.1 and 0.25, respectively, were prepared via the conventional solid-state reaction. The phase structure of the ceramics was identified by X-ray diffraction. The microstructure of the sample was observed with scanning electron microscopy. Dielectric properties and impedance spectroscopy were measured using a LCR Meter, in which 0.9CCTO-0.1BCTO displayed highest dielectric constant (584108) and lowest dielectric loss (0.42) at 1kHz among the four kinds of specimens. Based on series of experimental results, an optimum amount of x was able to improve the dielectric properties of CCTO-BCTO, through adjusting the impedance characteristics of the grain and grain boundary.

Phase Development and Dielectric Properties of 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3 Ceramic

2011 ◽  
Vol 700 ◽  
pp. 58-62
Author(s):  
Rachanusorn Roongtao ◽  
Supagorn Rugmai ◽  
Wanwilai C. Vittayakorn
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
Loss Factor ◽  
X Ray Diffraction ◽  
Phase Purity ◽  
X Ray ◽  
Phase Development ◽  
Scanning Electron

The 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3ceramics has been synthesized through a conventional mixed-oxide by using BT nanopowder and BMN micropowder. The phase purity of the powders and the ceramics was examined using X-ray diffraction (XRD). The 0.98BT-0.02BMN powders were sintered to 92% of the theoretical density at a temperature of 1300 °C for 2 h. The microstructure of the sintered surface was investigated using scanning electron microscopy (SEM). The dielectric constant (εr) and loss factor (tanδ) of the sintered pellets at Curie temperture were 3000 and 0.015, respectively.

scholarly journals Hydrothermal synthesis and characteristics of lanthanumdoped pb(Zr₀.₆₅Ti ₀.₃₅)O₃ ceramics

2021 ◽  
Vol 8 (3) ◽  
pp. 14-19
Author(s):  
Thuy Nguyen Thanh ◽  
Tung Nguyen Van ◽  
Hung Nguyen Trong ◽  
Minh Cao Duy
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Reaction Temperature ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Influence Of Ph ◽  
Scanning Electron

Lanthanum-doped lead zirconate titanate (PLZT) powders were synthesized using thehydrothermal method. The influence of pH, reaction temperature and time, lanthanum concentration on the formation and characteristics of PLZT were investigated. Obtained powders were investigated using X-ray diffraction analysis (XRD), scanning electron microscopy (SEM) techniques and a dielectric analyzer. The results showed that           Pb1-xLax(Zr0.65Ti0.35)O3 with x= 0.0 – 0.1 were well formed under conditions: pH≥13, reaction time of 12hrs, reaction temperature of 180oC. Dielectric constant of PLZT is higher than PZT. The grain size of the PLZT is found to be 1–3.5 µm.

scholarly journals Phase, microstructure and microwave dielectric properties of Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics

2015 ◽  
Vol 33 (1) ◽  
pp. 95-99 ◽  
Author(s):  
Abdul Manan ◽  
Dil Nawaz Khan ◽  
Atta Ullah ◽  
Arbab Safeer Ahmad
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Secondary Phase ◽  
Network Analyzer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microwave Dielectric ◽  
Scanning Electron

AbstractMg0:95Ni0:05Ti0:98Zr0:02O3 ceramics was prepared via conventional solid-state mixed-oxide route. The phase, microstructure and microwave dielectric properties of the sintered samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and a vector network analyzer. The microstructure comprised of circular and elongated plate-like grains. The semi quantitative analysis (EDS) of the circular and elongated grains revealed the existence of Mg0:95Ni0:05T2O5 as a secondary phase along with the parent Mg0:95Ni0:05Ti0:98Zr0:02O3 phase, which was consistent with the XRD findings. In the present study, εr ~17.1, Qufo~195855 ± 2550 GHz and τf ~ -46 ppm/K was achieved for the synthesized Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics sintered at 1325 °C for 4 h.

Temperature Dependence on Dielectric Response of La0.7Ba0.3Mn0.4Ti0.6O3 Ceramic

2015 ◽  
Vol 1107 ◽  
pp. 45-52
Author(s):  
Aaliyawani Ezzerin Sinin ◽  
Walter Charles Primus ◽  
Abdul Halim Shaari ◽  
Zainal Abidin Talib ◽  
Sinin Hamdan
Keyword(s):  
Dielectric Properties ◽  
Temperature Dependence ◽  
Low Frequency ◽  
Sintered Sample ◽  
Solid State Reaction Method ◽  
X Ray Diffraction ◽  
Conventional Solid State Reaction ◽  
Low Frequencies ◽  
X Ray ◽  
Lcr Meter

Ceramic sample of La0.70Ba0.30Mn0.40Ti0.60O3 oxide has been prepared by the conventional solid-state reaction method. The sintered sample was characterized by using x-ray diffraction (XRD) and low frequency LCR meter. XRD result shows that the sample has a cubic structure with the existence of impurity phase. The dielectric properties of La0.70Ba0.30Mn0.40Ti0.60O3 measured from room temperature to 200°C shows that the dielectric permittivity is temperature dependence with strong dispersion at low frequencies. A circuit model based on the universal capacitor response function is also being used to represent the dielectric properties of the sample.

STUDY OF HYDROTHERMAL SYNTHESIS AND PROPERTIES OF Bi2Fe4O9

2010 ◽  
Vol 03 (03) ◽  
pp. 173-176 ◽  
Author(s):  
YIBO WANG ◽  
HUAJUN SUN ◽  
JING ZHOU ◽  
BO LI ◽  
CHENGYONG ZHANG ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transformation ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Impedance Analyzer ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Highly oriented Bi2Fe4O9 nanosheets can be fabricated with Fe(NO3)3 ⋅ 9H2O and Bi(NO3)3 ⋅ 5H2O using the low-temperature hydrothermal method. The as-prepared powders are characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM) and high-resolution transmission electron microscopy (HRTEM), which exhibit an excellent orientation along the (00l) planes. The leakage current density and dielectric properties of the nanosheet samples are measured by Radiant Precision Workstation and HP4291B Impedance Analyzer, respectively. The effects of NaOH concentration on the phase transformation, sheet size and morphologies of the Bi2Fe4O9 crystallites are studied in this paper.

Structure and Properties of Bi0.5Na0.5TiO3-BaTiO3 Compound Ceramics

2011 ◽  
Vol 411 ◽  
pp. 503-507
Author(s):  
Xiao Juan Li ◽  
Zeng Zhe Xi ◽  
Wei Long ◽  
Zhi Gang Zhang ◽  
Jia Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Diffraction Analysis ◽  
Structure And Properties ◽  
X Ray Diffraction ◽  
Oriented Growth ◽  
X Ray ◽  
Scanning Electron

The Bi0.5Na0.5TiO3-xwt%BaTiO3 compound ceramics were prepared. The influence of different BaTiO3 content on structure was evaluated by scanning electron microscopy and X-ray diffraction analysis. The results show oriented is induced by plate-like BaTiO3 template. Signficant improvement of the piezoelectric (d33 = 112 pC/N) and dielectric properties ( max ≈ 5500) was observed. The improvement was attested to the apparent alignment of the BaTiO3 templates and grain oriented growth.

Effects of La0.5Sr0.5CoO3 sol concentration on the microstructure and dielectric properties of Ba0.6Sr0.4TiO3 films prepared by sol-gel method on Ti substrate

2012 ◽  
Vol 1494 ◽  
pp. 253-258
Author(s):  
Dan Jiang ◽  
Songwei Han ◽  
Xuelian Zhao ◽  
Jinrong Cheng
Keyword(s):  
Electron Microscopy ◽  
Dielectric Properties ◽  
Sol Gel ◽  
Sem Analysis ◽  
X Ray Diffraction ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Bst Films ◽  
Scanning Electron

ABSTRACTBa0.6Sr0.4TiO3 (BST) thin films were deposited on La0.5Sr0.5CoO3 (LSCO) buffered Ti substrates. Both BST and LSCO were prepared by sol-gel method. X-ray diffraction (XRD) and scanning electron microscopy (SEM) analysis were used to investigate the effect of LSCO sol concentration on the crystallinity and surface morphology of the films. The results show that with the increase of LSCO sol concentration, BST films show variation of the structure and dielectric properties. BST films for LSCO of 0.2 mol/L exhibit a better crystallinity and improved dielectric properties, with the tunability, dielectric constant and tanδ of 30%, 420 and 0.028 respectively.

scholarly journals Study of structural and dielectric properties of Nickel-doped BaTiO3 material

2019 ◽  
Vol 8 (3) ◽  
pp. 228-233
Author(s):  
Hafes Ed-Dnoub ◽  
Ouafae El Ghadraoui ◽  
Mohammed Zouhairi ◽  
Ahmed Harrach ◽  
Tajeddine Lamcharfi ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Electron Microscope ◽  
Transition Temperature ◽  
Dielectric Properties ◽  
Scanning Electron Microscope ◽  
Frequency Range ◽  
X Ray Diffraction ◽  
X Ray ◽  
Perovskite Type ◽  
Scanning Electron

In this work, the effect of nickel (Ni) insertion on the structural and dielectric properties of BaTiO3 material was investigated. A series of powders of composition Ba1-xNixTiO3 (x = 0, 0.05, 0.1, 0.15 and 0.20) were synthesized by solid method. The analysis by X-Ray Diffraction (XRD) shows that the obtained compounds crystallize in a phase of perovskite type. All the peaks are indexed in a phase of quadratic symmetry. Characterization by the Scanning Electron Microscope (SEM) indicates a heterogeneous microstructure of the grains. The study by spectroscopy of impedance in the frequency range [500Hz-1MHz] highlighted the effect of the nickel insertion on the transition temperature and the dielectric constant value.

Phase Transition and Electrical Properties of Ba0.8Sr0.2TiO3: Comparison of Different Preparation Techniques

2017 ◽  
Vol 866 ◽  
pp. 287-290
Author(s):  
Thanawat Kytae ◽  
Krit Sutjarittangtham ◽  
Theerapol Thurakitseree ◽  
Wilaiwan Leenakul
Keyword(s):  
Electron Microscopy ◽  
Phase Transition ◽  
Electrical Properties ◽  
Molten Salt ◽  
Preparation Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lcr Meter ◽  
Preparation Techniques ◽  
Scanning Electron

This research studied the effect of the different preparation technique on phase transition and electrical properties of Ba0.8Sr0.2TiO3. The samples compared 3 preparation technique, there are conventional mix-oxide, molten-salt and seed-induced method. The samples prepared by molten-salt calcined at 800 °C, the samples prepared by conventional mix-oxide and seed-induced method was calcined at 1200 °C for 3 h. All of samples sintered at 1400 °C for 3 h. The phase formation and morphology of samples were characterized via X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. The dielectric properties of the samples were measurement by LCR-meter.

Microstructural and Dielectrical Properties for Ceramics and Thin Films of the xPbTiO3-(1−x)SrTiO3 Solid Solution

2001 ◽  
Vol 688 ◽  
Author(s):  
E. Martínez ◽  
A. Fundora ◽  
O. Blanco ◽  
S. García ◽  
E. Heredia ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Scanning Electron Microscopy ◽  
Dielectric Properties ◽  
Integrated Circuit ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Technique ◽  
Dielectrical Properties ◽  
Scanning Electron

AbstractSrTiO3 and PbTiO3 perovskites are combined to form the xPbTiO3-(1−x)SrTiO3 (PST) solid solution. The effect of the PbTiO3 content on the microstructural and dielectric properties is studied for different compositions (x=0.1,0.3,0.5,0.7, and 0.9). Microstructural features of the PST system are studied by X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) techniques. Electrical properties are studied by the thermoelectric analysis technique at both fixed frequency and varying frequency to study the behavior of the dielectric constant and dielectric loss.Films of 0.5PbTiO3-0.5SrTiO3 (PST50) have been obtained by RF ion sputtering on different substrates. We investigate the relation between the crystalline structure and the dielectric properties of PST50 films deposited on different metallic films. Scanning Electron Microscopy (SEM) and X-Ray Diffraction were used for the structural analysis of the PST50/TiN/Si and PST50/RuO2/TiN /Si systems. The dielectric properties of the PST50 films were measured for TiN/PST50/TiN/Si, and RuO2/PST50/RuO2/TiN/Si capacitors and the results were correlated to the structure and composition. The charge storage capabilities of the PST50 films are evaluated for possible application in integrated circuit technology.

Sign in / Sign up

Export Citation Format

Share Document