Quantifying Damage Accumulation Using State-of-the-Art FFT Method
2011 ◽
Vol 702-703
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pp. 515-518
Keyword(s):
X Ray
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A 3D microstructure, measured by high-energy x-ray diffraction microscopy, is used as an input to a parallelized viscoplastic Fast Fourier Transform code (VPFFT) to simulate a tensile test. Distributions of strain, damage accumulation, neighbor interactions, and Schmid factor mismatch throughout the microstructure are calculated. These results will form the basis of a direct comparison to microstructure maps that track plastic deformation in the real sample.