Preparation and Characterization of Multilayer Graphene by Mechanical Milling and Related Applications for Ceramic Composites

As graphene nanomaterials present exceptional mechanical, thermal and electric properties therefore it can be an excellent reinforcement material for ceramic composites. The research of ceramic composites incorporated with carbon-based fillers has focused on carbon nanotubes until now. In this work silicon nitride-based nanocomposites have been prepared with different ammount (1 and 3 wt%) of multilayer graphene (MLG) made by mechanical milling-based method as well as exfoliated graphite nanoplatelets (xGnP) and nanographene platelets (Angstron) in comparison. The morphology and microstructure of the sintered samples were studied by scanning electron microscope and transmission electron microscope. Phase compositions were determined by X-ray diffractometer. The bending strength and elastic modulus of MLG-silicon nitride composites showed enhanced values compared to the other graphene reinforced silicon nitride ceramic composites.

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Fabrication and Characterization of Short Silicon Nitride Fibers from Direct Nitridation of Ferrosilicon in N2 Atmosphere

Materials ◽

10.3390/ma11102003 ◽

2018 ◽

Vol 11 (10) ◽

pp. 2003

Author(s):

Jiasuo Guan ◽

Yaohui Wang ◽

Laifei Cheng ◽

Yupeng Xie ◽

Litong Zhang

Keyword(s):

Electron Microscope ◽

Silicon Nitride ◽

Transmission Electron Microscope ◽

Selected Area Electron Diffraction ◽

Transmission Electron ◽

N2 Atmosphere ◽

Low Degree ◽

Degree Of Crystallization ◽

Direct Nitridation

Short silicon nitride fibers were fabricated by direct nitridation of ferrosilicon in N2 atmosphere, and their structure and possible growth mechanism were characterized and investigated. The rod-like fibers which were α-Si3N4 with a low degree of crystallization and a high aspect ratio had a diameter of about 4 μm and a length close to a few millimeters. Belt-like fibers with a width about 5 μm and a thickness about 1 μm were also found in the nitrides. Scanning electron microscope (SEM), transmission electron microscope (TEM), high resolution transmission electron microscope (HRTEM), and selected area electron diffraction (SAED) investigations indicated that the fibers were single-crystalline α-Si3N4 with few amorphous distributed in the edge region, and the fibers grew by vapor–liquid–solid (VLS) mechanism.

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An Electron Microscope Study of Interdiffusion and Compound Formation in Ta-Au Thin Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070606 ◽

1973 ◽

Vol 31 ◽

pp. 32-33 ◽

Cited By ~ 1

Author(s):

T. C. Tisone ◽

S. Lau

Keyword(s):

Electron Microscope ◽

Electron Microscope Study ◽

Thermally Grown Oxide ◽

Ion Milling ◽

Compound Formation ◽

Technology Application ◽

Transmission Electron ◽

Before And After ◽

Au Thin Films

In a study of the properties of a Ta-Au metallization system for thin film technology application, the interdiffusion between Ta(bcc)-Au, βTa-Au and Ta2M-Au films was studied. Considered here is a discussion of the use of the transmission electron microscope(TEM) in the identification of phases formed and characterization of the film microstructures before and after annealing.The films were deposited by sputtering onto silicon wafers with 5000 Å of thermally grown oxide. The film thicknesses were 2000 Å of Ta and 2000 Å of Au. Samples for TEM observation were prepared by ultrasonically cutting 3mm disks from the wafers. The disks were first chemically etched from the silicon side using a HNO3 :HF(19:5) solution followed by ion milling to perforation of the Au side.

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Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100175259 ◽

1990 ◽

Vol 48 (4) ◽

pp. 424-424

Author(s):

George Guthrie ◽

David Veblen

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Microscope ◽

Electron Diffraction ◽

Light Microscopy ◽

Fluid Inclusions ◽

Energy Dispersive Spectrometer ◽

Analytical Transmission Electron Microscopy ◽

Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

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Characterization of Li-rich layered oxides by using transmission electron microscope

Green Energy & Environment ◽

10.1016/j.gee.2017.05.005 ◽

2017 ◽

Vol 2 (3) ◽

pp. 174-185 ◽

Cited By ~ 5

Author(s):

Hu Zhao ◽

Bao Qiu ◽

Haocheng Guo ◽

Kai Jia ◽

Zhaoping Liu ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Layered Oxides ◽

Transmission Electron

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Characterization of JEOL 3000f TEM Equipped for Electron Holography

Microscopy and Microanalysis ◽

10.1017/s1431927600033638 ◽

2000 ◽

Vol 6 (S2) ◽

pp. 228-229

Author(s):

M. A. Schofield ◽

Y. Zhu

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Design Of Experiment ◽

Electron Holography ◽

Fringe Spacing ◽

Interference Fringes ◽

Transmission Electron ◽

Careful Design

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

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Fabrication and characterization of sample-supporting film made of silicon nitride for large-area observation in transmission electron microscopy

Microscopy ◽

10.1093/jmicro/dfy039 ◽

2018 ◽

Author(s):

Yuji Konyuba ◽

Tomohiro Haruta ◽

Yuta Ikeda ◽

Tomohisa Fukuda

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Silicon Nitride ◽

Large Area ◽

Transmission Electron ◽

Fabrication And Characterization

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In situ electrical property characterization of individual nanostructures using a sliding probe inside a transmission electron microscope

2010 IEEE Nanotechnology Materials and Devices Conference ◽

10.1109/nmdc.2010.5652591 ◽

2010 ◽

Cited By ~ 2

Author(s):

Zheng Fan ◽

Xinyong Tao ◽

Yiping Li ◽

Yingchao Yang ◽

Jun Du ◽

...

Keyword(s):

Electron Microscope ◽

Electrical Property ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Property Characterization

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MICROWAVE ASSISTED SYNTHESIS AND STRUCTURAL CHARACTERIZATION OF NICKEL OXIDE NANOPARTICLES

Kongunadu Research Journal ◽

10.26524/krj117 ◽

2016 ◽

Vol 3 (1) ◽

pp. 12-14

Author(s):

Kalpanadevi K ◽

Manimekalai R

Keyword(s):

Electron Microscope ◽

Nickel Oxide ◽

Structural Characterization ◽

Nano Particles ◽

Microwave Assisted Synthesis ◽

Nio Nanoparticles ◽

Nickel Oxide Nanoparticles ◽

Transmission Electron ◽

Good Crystallinity

Nickel oxide (NiO) nano-particles were produced via a simple microwave method from the Ni(OH)2 precursor, which was obtained by slow drop-wise addition of 0.1M sodium hydroxide to 0.1M nickel nitrate. The mixture was vigorously stirred until the pH reached 7.2. The mixture was then irradiated with microwave to deposit Ni(OH)2 at a better precipitation rate. Drying the precipitate at 320°C resulted in formation of NiO nanoparticles. High Resolution Transmission Electron Microscope (HRTEM), Scanning Electron Microscope (SEM) and X-ray diffraction (XRD), employed for the structural characterization of the as-prepared NiO nanoparticles, revealed their good crystallinity and high-purity. Microwave irradiation increased homogeneity and decreased the mean particle size of the produced NiO particles.

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