scholarly journals SECONDARY ELECTRON EMISSION FROM THIN ALUMINIUM FOILS PRODUCED BY HIGH ENERGY ELECTRON BEAMS

2021 ◽  
pp. 38-41
Author(s):  
S.H. Karpus ◽  
G.D. Kovalenko ◽  
Yu.H. Kazarinov ◽  
V.M. Dubina ◽  
V.Y. Kasilov ◽  
...  
Keyword(s):  
Experimental Data ◽  
Electron Beam ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
High Energy ◽  
Secondary Emission ◽  
Primary Electron ◽  
Primary Electron Beam ◽  
Thin Foils

The description of the experimental equipment and technique for measuring the secondary emission of elec-trons (SEE) with application of accelerated electrons at the linear accelerator of the IHEPNP NSC KIPT with ener-gies up to 30 MeV and a standard secondary emission monitor [1] are presented. Experimental data of secondary electron emission yields from thin aluminum targets (8 and 50 μm) for primary electron beam energies of 16 and 25 MeV have been experimentally measured. The analysis of the experimental data and their comparison with the theory are carried out. It is shown that the proposed technique for measuring the yields of secondary electron emis-sion is useful and applied for study of low-energy and δ-electrons yields from thin foils, as well as to research the effect of the density effect depending on the energy of the primary electron beam.

Historical Introduction

1977 ◽  
Vol 35 ◽  
pp. 2-5
Author(s):  
R. D. Heidenreich
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
50Th Anniversary ◽  
Secondary Emission ◽  
Wave Nature ◽  
Nobel Prize In Physics ◽  
Primary Electrons ◽  
The U.S ◽  
Mutual Agreement

This program has been organized by the EMSA to commensurate the 50th anniversary of the experimental verification of the wave nature of the electron. Davisson and Germer in the U.S. and Thomson and Reid in Britian accomplished this at about the same time. Their findings were published in Nature in 1927 by mutual agreement since their independent efforts had led to the same conclusion at about the same time. In 1937 Davisson and Thomson shared the Nobel Prize in physics for demonstrating the wave nature of the electron deduced in 1924 by Louis de Broglie.The Davisson experiments (1921-1927) were concerned with the angular distribution of secondary electron emission from nickel surfaces produced by 150 volt primary electrons. The motivation was the effect of secondary emission on the characteristics of vacuum tubes but significant deviations from the results expected for a corpuscular electron led to a diffraction interpretation suggested by Elasser in 1925.

MAXIMUM SECONDARY ELECTRON YIELDS FROM SEMICONDUCTORS AND INSULATORS

2016 ◽  
Vol 24 (04) ◽  
pp. 1750045 ◽  
Author(s):  
A. G. XIE ◽  
Z. H. LIU ◽  
Y. Q. XIA ◽  
M. M. ZHU
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Maximum Yield ◽  
Secondary Electron Emission ◽  
High Energy ◽  
Secondary Electrons ◽  
Backscattered Electrons ◽  
Universal Formula ◽  
Yield Formula ◽  
Primary Electrons

Based on the processes and characteristics of secondary electron emission and the formula for the yield due to primary electrons hitting on semiconductors and insulators, the universal formula for maximum yield [Formula: see text] due to primary electrons hitting on semiconductors and insulators was deduced, where [Formula: see text] is the maximum ratio of the number of secondary electrons produced by primary electrons to the number of primary electrons. On the basis of the formulae for primary range in different energy ranges of [Formula: see text], characteristics of secondary electron emission and the deduced universal formula for [Formula: see text], the formulae for [Formula: see text] in different energy ranges of [Formula: see text] were deduced, where [Formula: see text] is the primary incident energy at which secondary electron yields from semiconductors and insulators, [Formula: see text], are maximized to maximum secondary electron yields from semiconductors and insulators, [Formula: see text]; and [Formula: see text] is the maximum ratio of the number of total secondary electrons produced by primary electrons and backscattered electrons to the number of primary electrons. According to the deduced formulae for [Formula: see text], the relationship among [Formula: see text], [Formula: see text] and high-energy back-scattering coefficient [Formula: see text], the formulae for parameters of [Formula: see text] and the experimental data as well as the formulae for [Formula: see text] in different energy ranges of [Formula: see text] as a function of [Formula: see text], [Formula: see text], [Formula: see text] and [Formula: see text] were deduced, where [Formula: see text] and [Formula: see text] are the original electron affinity and the width of forbidden band, respectively. The scattering of [Formula: see text] was analyzed, and calculated [Formula: see text] values were compared with the values measured experimentally. It was concluded that the deduced formulae for [Formula: see text] were found to be universal for [Formula: see text].

Application of WFS for Simultaneous Work Function and Secondary Electron Emission Measurement on Ba Covered Tungsten

2005 ◽  
Vol 473-474 ◽  
pp. 293-296
Author(s):  
György Vida ◽  
Ildikó Beck ◽  
V. Katalin Josepovits ◽  
Miklós Győr
Keyword(s):  
Work Function ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Secondary Emission ◽  
Operating Conditions ◽  
Emission Measurement ◽  
Pressure Discharge ◽  
Emission Yield ◽  
Burning Voltage

In the present paper the secondary emission and work function of W covered with different thickness Ba layers are compared. The secondary emission and work function were measured by Work Function Spectroscopy (WFS). It is clearly pointed out that the thin Ba coating causes the the enhancement of electron induced secondary electron emission. In high pressure discharge lamps high secondary emission and high thermionic current are required for reliable operating conditions, i.e., for reaching the nominal burning voltage and current etc. The results prove that the Ba spreading on the W surface from an alkali earth tungstate material is advantageous for lowering the work function and, simultaneously, for increasing the secondary emission yield.

Secondary electron emission from thin foils under fast-ion bombardment

1989 ◽  
Vol 39 (10) ◽  
pp. 6316-6320 ◽  
Author(s):  
A. Clouvas ◽  
H. Rothard ◽  
M. Burkhard ◽  
K. Kroneberger ◽  
C. Biedermann ◽  
...  
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Ion Bombardment ◽  
Thin Foils ◽  
Fast Ion
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