Small Delay Tracing Defect Testing
Keyword(s):
This Small Delay Tracing Defect Testing detect small delay defects by creating internal signal races. The races are created by launching transitions along simultaneous two paths, a reference path and a test path. The arrival times of the transitions on a ‘convergence’ or common gate determine the result of the race. On the output of the convergence gate, a static hazard created by a small delay defect presence on the test path which is directed to the input of a scan-latch. A glitch detector is added to the scan latch which records the presence or absence of the glitch.
2011 ◽
pp. 21-36
◽
Keyword(s):
Keyword(s):
Keyword(s):
2011 ◽
Vol 28
(2)
◽
pp. 52-61
◽
2012 ◽
Vol 29
(1)
◽
pp. 65-67
◽