scholarly journals Particle Adhesion Measurements on Insect Wing Membranes Using Atomic Force Microscopy

2012 ◽  
Vol 2012 ◽  
pp. 1-5 ◽  
Author(s):  
Gregory S. Watson ◽  
Bronwen W. Cribb ◽  
Jolanta A. Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Area ◽  
Wing Surface ◽  
Silica Spheres ◽  
Wing Membrane ◽  
Insect Wing ◽  
Force Microscopy ◽  
Plant Matter ◽  
Atomic Force ◽  
Eurema Hecabe

Many insects have evolved refined self-cleaning membrane structuring to contend with an environment that presents a range of potential contaminates. Contamination has the potential to reduce or interfere with the primary functioning of the wing membrane or affect other wing cuticle properties, (for example, antireflection). Insects will typically encounter a variety of air-borne contaminants which include plant matter and soil fragments. Insects with relatively long or large wings may be especially susceptible to fouling due to the high-wing surface area and reduced ability to clean their extremities. In this study we have investigated the adhesion of particles (pollens and hydrophilic silica spheres) to wing membranes of the super/hydrophobic cicada (Thopha sessiliba), butterfly (Eurema hecabe), and the hydrophilic wing of flower wasp (Scolia soror). The adhesional forces with both hydrophobic insects was significantly lower for all particle types than the hydrophilic insect species studied.

Scaling Analysis of a- and poly-Si Surface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
T. Yoshinobu ◽  
A. Iwamoto ◽  
K. Sudoh ◽  
H. Iwasaki
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Area ◽  
Scaling Behavior ◽  
Linear Size ◽  
Scaling Analysis ◽  
Macroscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent

AbstractThe scaling behavior of the surface roughness of a-and poly-Si deposited on Si was investigated by atomic force microscopy (AFM). The interface width W(L), defined as the rms roughness as a function of the linear size of the surface area, was calculated from various sizes of AFM images. W(L) increased as a power of L with the roughness exponent ∝ on shorter length scales, and saturated at a constant value of on a macroscopic scale. The value of roughness exponent a was 0.48 and 0.90 for a-and poly-Si, respectively, and σ was 1.5 and 13.6nm for 350nm-thick a-Si and 500nm-thick poly-Si, respectively. The AFM images were compared with the surfaces generated by simulation.

scholarly journals Correlating nuclear morphology and external force with combined atomic force microscopy and light sheet imaging separates roles of chromatin and lamin A/C in nuclear mechanics

2020 ◽  
Vol 31 (16) ◽  
pp. 1788-1801 ◽  
Author(s):  
Chad M. Hobson ◽  
Megan Kern ◽  
E. Timothy O’Brien ◽  
Andrew D. Stephens ◽  
Michael R. Falvo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Area ◽  
External Force ◽  
Light Sheet ◽  
Nuclear Volume ◽  
Nuclear Morphology ◽  
Lamin A ◽  
Force Microscopy ◽  
Nuclear Mechanics ◽  
Atomic Force

Chromatin and lamin A/C separately resist strain in nuclear volume and surface area, respectively, during compression as studied with combined atomic force microscopy and light sheet imaging. Chromatin decompaction further alters curvature dynamics during indentation.

scholarly journals Study of the geometric and mechanical features of nanoparticles of various nature by atomic force microscopy in PeakForce QNM mode

2020 ◽  
pp. 143-148
Author(s):  
I. A. Chelnokova ◽  
B. V. Ronishenko ◽  
M. N. Starodubtseva
Keyword(s):  
Atomic Force Microscopy ◽  
Silver Nanoparticles ◽  
Free Surface ◽  
Surface Area ◽  
Nanosized Particles ◽  
Adhesion Forces ◽  
Biological Origin ◽  
Force Microscopy ◽  
Atomic Force ◽  
Free Surface Area

Objective: to identify the difference of the numerical values of parameters characterizing the geometric and mechanical (adhesive) properties of inorganic nanosized particles and nanosized particles of biological origin by atomic force microscopy using the mode of the mapping of surface features at nanosized resolution.Material and methods. Exosomes isolated from the blood of Af mice by the method of sequential ultracentrifugation were used as bionanoparticles. Silver nanoparticles were used as inorganic nanoparticles. The nanoparticles were scanned in air with the help of the BioScope Resolve (Bruker) atomic force microscope in the PeakForce QNM in Air mode with the recording of the maps of adhesion forces and imaging of the topography of the studied surfaces.Results. The silver nanoparticles and exosomes had similar but statistically different diameters (45.59 ± 1.04 nm and 41.25 ± 0.91 nm, р < 0.001 t-test). Nevertheless, the silver nanoparticles were characterized by higher values of both height and free surface area in comparison with the corresponding values of the exosome parameters. This leads to a higher value of the spreading ration for exosomes (the average ratio of diameter to height (d/h) was 11.78 for exosomes and 6.67 for nanoparticles (p < 0.001, Mann-Whitney U test) due to greater adhesion properties of the exosome membranes compared to the silver nanoparticles and a lower value of the ratio of the particle volume to its surface area. Averaged over the nanoscale areas of the nanoparticle surface, the adhesion forces of exosomes were higher (3.2 ± 0.57 nN) compared to those of silver nanoparticles (2.2 ± 0.03 nN, p < 0.05, Mann-Whitney U test).Conclusion. The differences in the parameters of the geometric (diameter, height, free surface area) and mechanical properties (adhesion forces) of the silver nanoparticles and exosomes have been revealed, which allows identifying and differentiating of these nanoparticles by the methods of atomic force microscopy during the study of complex biological fluids with possible content of both the types of nanoparticles.

CALCULATION OF SURFACE AREAS FOR POROUS SILICON

1999 ◽  
Vol 13 (28) ◽  
pp. 1005-1009
Author(s):  
Q. R. HOU ◽  
N. CHI
Keyword(s):  
Atomic Force Microscopy ◽  
Simple Model ◽  
Porous Silicon ◽  
Surface Area ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Photoluminescence Intensity ◽  
Force Microscopy ◽  
Surface Areas ◽  
Atomic Force

Based on atomic force microscopy (AFM) images of porous silicon, a simple model has been proposed to calculate the surface areas of porous silicon. In this model, the porous silicon layer is assumed to be made of numerous identical cones with radius r and height h. The surface area changes due to the formation of porous silicon are found to be dependent on (h/r)2 and correlate with the growth of photoluminescence (PL) intensities. The rise and fall in photoluminescence intensity coincide with those of surface area changes qualitatively. This coincidence supports the hypothesis that the luminescence results from the presence of surface-localized or confined molecular emitters.

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