CALCULATION OF SURFACE AREAS FOR POROUS SILICON
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Based on atomic force microscopy (AFM) images of porous silicon, a simple model has been proposed to calculate the surface areas of porous silicon. In this model, the porous silicon layer is assumed to be made of numerous identical cones with radius r and height h. The surface area changes due to the formation of porous silicon are found to be dependent on (h/r)2 and correlate with the growth of photoluminescence (PL) intensities. The rise and fall in photoluminescence intensity coincide with those of surface area changes qualitatively. This coincidence supports the hypothesis that the luminescence results from the presence of surface-localized or confined molecular emitters.
2012 ◽
Vol 576
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pp. 519-522
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2016 ◽
Vol 63
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pp. 67-76
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1999 ◽
Vol 63
(16)
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pp. 2337-2351
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2018 ◽
Vol 54
(12)
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pp. 109
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Keyword(s):
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