scholarly journals Three-Photon Absorption in Nanostructure Wide-Band Gap Semiconductor ZnO Using Femtosecond Laser

2011 ◽  
Vol 5 (6) ◽  
Author(s):  
Abdulla M. Suhail ◽  
Hani J. Kbashi ◽  
Raied K. Jamal
2012 ◽  
Vol 261 ◽  
pp. 705-707 ◽  
Author(s):  
Hidetoshi Takayama ◽  
Toshiro Maruyama

2004 ◽  
Author(s):  
Egidijus Vanagas ◽  
Jouji Kawai ◽  
Yury Zaparozhchanka ◽  
Dmitry Tuzhilin ◽  
Hirofumi Musasa ◽  
...  

2010 ◽  
Author(s):  
Qingliang Zhao ◽  
Tao Jiang ◽  
Zhiwei Dong ◽  
Rongwei Fan ◽  
Xin Yu

1994 ◽  
Vol 73 (17) ◽  
pp. 2352-2355 ◽  
Author(s):  
Ph. Daguzan ◽  
S. Guizard ◽  
K. Krastev ◽  
P. Martin ◽  
G. Petite ◽  
...  

2005 ◽  
Vol 44 (2) ◽  
pp. 910-913 ◽  
Author(s):  
Toshio Kurobori ◽  
Tomoya Yamakage ◽  
Yukio Hirose ◽  
Ken-ichi Kawamura ◽  
Masahiro Hirano ◽  
...  

Author(s):  
Joanna L. Batstone

Interest in II-VI semiconductors centres around optoelectronic device applications. The wide band gap II-VI semiconductors such as ZnS, ZnSe and ZnTe have been used in lasers and electroluminescent displays yielding room temperature blue luminescence. The narrow gap II-VI semiconductors such as CdTe and HgxCd1-x Te are currently used for infrared detectors, where the band gap can be varied continuously by changing the alloy composition x.Two major sources of precipitation can be identified in II-VI materials; (i) dopant introduction leading to local variations in concentration and subsequent precipitation and (ii) Te precipitation in ZnTe, CdTe and HgCdTe due to native point defects which arise from problems associated with stoichiometry control during crystal growth. Precipitation is observed in both bulk crystal growth and epitaxial growth and is frequently associated with segregation and precipitation at dislocations and grain boundaries. Precipitation has been observed using transmission electron microscopy (TEM) which is sensitive to local strain fields around inclusions.


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