scholarly journals Five-Phase Line Commutated Rectifiers

2019 ◽  
Author(s):  
Mahmoud I. Masoud
Keyword(s):  
Phase Line

Compositional Effects on the Degradation of PVD-Tisin

1997 ◽  
Vol 473 ◽  
Author(s):  
W. F. McArthur ◽  
F. Deng ◽  
K. Ring ◽  
P. M. Pattison ◽  
K. L. Kavanagh
Keyword(s):  
Phase Separation ◽  
Silicon Nitride ◽  
Electron Diffraction ◽  
Titanium Nitride ◽  
Amorphous Matrix ◽  
Barrier Material ◽  
Rutherford Back Scattering ◽  
Phase Line ◽  
Back Scattering ◽  
Target Ratio

ABSTRACTPVD-TixSiyNz films formed by reactive RF-magnetron co-sputtering of Ti and Si in Ar/N2 are evaluated as a diffusion barrier between Cu and Si. A complete range of compositions are obtained by Ti targets inlaid with Si. Film composition is controlled by the target ratio of titanium to silicon and N2 partial pressure. Electrical results versus thermal history for films of∼6–18% Si as well as the composition and microstructure as determined by Rutherford back scattering (RBS), TEM and electron diffraction are reported. These films are an amorphous matrix with imbedded nanocrystals of titanium nitride as-deposited and undergo phase separation to yield titanium nitride and silicon nitride after a 1000°C anneal. As-deposited compositions which lie above the TiN-Si3N4 phase line yield crystals of TiN. Compositions below the TiN-Si3N4 phase line yield crystals of Ti2N. Bulk resistivity as-deposited (<400μω-cm) is acceptable for use as a contact liner/barrier material and improves with annealing. Si pn-diodes metallized with 20nm Ti40Si15N45 and Cu show no significant increase in reverse leakage current at anneal temperatures below 700°C.

scholarly journals Calculation of the T-P phase diagrams for the halogenomethane compounds (CCl-=SUB=-4-n-=/SUB=-Br-=SUB=-n-=/SUB=-, n=0, 1, 2, 4) using the mean field theory -=SUP=-*-=/SUP=-

2019 ◽  
Vol 61 (2) ◽  
pp. 339
Author(s):  
H. Yurtseven ◽  
S.B. Isik ◽  
E. Kilit Dogan
Keyword(s):  
Phase Diagrams ◽  
Mean Field Theory ◽  
Mean Field ◽  
Face Centered Cubic ◽  
Mean Field Model ◽  
Phase Line ◽  
Component Systems ◽  
Two Component Systems ◽  
The Mean ◽  
Face Centered

AbstractThe T – P phase diagrams of the halogenomethane compounds (CCl_4 – _ n Br_ n , n = 0, 1, 2, 4) are calculated using a mean field model. By expanding the free energy in terms of the order parameters for the transitions of the liquid (L), rhombohedral (R), face-centered cubic (FCC) and monoclinic (M) phases in those compounds, the phase line equations are derived and they are fitted to the experimental data from the literature. This method of calculating the T – P phase diagram is satisfactory to explain the T – P measurements for the halogenomethane compounds and it can also be applied to two-component systems.

scholarly journals Three-Level T-Type Inverter Fault Diagnosis and Tolerant Control Using Single-Phase Line Voltage

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 44075-44086
Author(s):  
Kuei-Hsiang Chao ◽  
Long-Yi Chang ◽  
Fu-Qiang Xu
Keyword(s):  
Fault Diagnosis ◽  
Single Phase ◽  
Phase Line ◽  
Line Voltage
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