Analysis of low-frequency noise in the amorphous indium zinc oxide thin film transistors
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2019 ◽
Vol 66
(5)
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pp. 2192-2197
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2018 ◽
Vol 6
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pp. 271-279
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Vol 30
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pp. 505-507
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Vol 32
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pp. 088506
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Vol 16
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pp. 12871-12874
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