scholarly journals Measurement of Transient Photo-Induced Changes in Thin Films at J-PARC — Time-Resolved Neutron Reflectivity Measurements of Silver Photo-Diffusion into Ge-Chalcogenide Films

2015 ◽  
Author(s):  
Yoshifumi Sakaguchi ◽  
Hidehito Asaoka ◽  
Yuki Uozumi ◽  
Yukinobu Kawakita ◽  
Takayoshi Ito ◽  
...  
Keyword(s):  
Thin Films ◽  
Neutron Reflectivity ◽  
Time Resolved ◽  
Chalcogenide Films ◽  
Induced Changes

Studies of silver photodiffusion dynamics in Ag/GexS1−x(x= 0.2 and 0.4) films using neutron reflectometry

2014 ◽  
Vol 92 (7/8) ◽  
pp. 654-658 ◽  
Author(s):  
Y. Sakaguchi ◽  
H. Asaoka ◽  
Y. Uozumi ◽  
Y. Kawakita ◽  
T. Ito ◽  
...  
Keyword(s):  
Visible Light ◽  
Neutron Reflectometry ◽  
Time Dependent ◽  
Source Analysis ◽  
Neutron Reflectivity ◽  
Fast Diffusion ◽  
Diffusion Front ◽  
Time Resolved ◽  
Induced Changes ◽  
Front Model

To better understand the dynamics of silver photodiffusion into amorphous chalcogenide (Ch) films, it is informative to probe the time-dependent distribution of silver in the films while they are simultaneously exposed to visible light. Time-resolved neutron reflectometry is particularly well-suited to this purpose because it can follow time-dependent changes in the multilayer structure (Ag/Ag–Ch/Ch) while excluding the possibility of probe beam induced changes. This paper reports the results of time-resolved neutron reflectivity measurements of two Ag/GexS1−x(x = 0.2 and 0.4) films as they are exposed to a visible light source. Analysis showed that silver diffusion occurs via two distinct processes: a fast diffusion that takes place during the first 2 and 10 min of sample illumination for the x = 0.2 and 0.4 films, respectively; and a subsequent slower change that is observed over the next 18 min (x = 0.2 film) and 107 min (x = 0.4 film). These results suggest the formation of a relatively stable Ag-rich phase in the reaction layer followed by slower diffusion at the interface between Ag-rich and Ag-poor layers. Fourier transform analysis shows that the position of the interface is essentially fixed — a conclusion that contradicts the “diffusion front” model that has been previously postulated.

Neutron reflectivity study of thin films of hydrogen-bonded polymer blends: influence of annealing on composition profile

1992 ◽  
Vol 25 (10) ◽  
pp. 2619-2623 ◽  
Author(s):  
Lei Jong ◽  
Eli M. Pearce ◽  
T. K. Kwei ◽  
W. A. Hamilton ◽  
G. S. Smith ◽  
...  
Keyword(s):  
Thin Films ◽  
Polymer Blends ◽  
Composition Profile ◽  
Neutron Reflectivity ◽  
Hydrogen Bonded

INDUCED CHANGES OF THERMOTROPIC PROPERTIES OF PHASE TRANSITIONS BETWEEN SMECTIC A MESOPHASE AND ISOTROPIC LIQUID: EFFECT OF SURFACES

2006 ◽  
Vol 20 (14) ◽  
pp. 821-833 ◽  
Author(s):  
ARIF NESRULLAJEV ◽  
ŞENER OKTIK
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Transition ◽  
Phase Transitions ◽  
Isotropic Liquid ◽  
Smectic A ◽  
Phase Transition Temperatures ◽  
Smectic A Phase ◽  
Induced Changes ◽  
Thermotropic Properties

In this work, the effect of thin films on the thermotropic and thermo-optical properties and peculiarities of the phase transitions between the smectic A and isotropic liquid have been investigated. Peculiarities of the heterophase regions of the straight smectic A-isotropic liquid and reverse isotropic liquid-smectic A phase transitions have been studied. Change of morphologic properties of the heterophase regions, shift of the phase transition temperatures and the change of temperature widths of these heterophase regions under thin film influence have been observed.

scholarly journals Defects characterization in thin films photovoltaics materials by correlated high-frequency modulated and time resolved photoluminescence: An application to Cu(In,Ga)Se2

2019 ◽  
Vol 669 ◽  
pp. 520-524
Author(s):  
Baptiste Bérenguier ◽  
Nicolas Barreau ◽  
Alexandre Jaffre ◽  
Daniel Ory ◽  
Jean-François Guillemoles ◽  
...  
Keyword(s):  
Thin Films ◽  
High Frequency ◽  
Time Resolved ◽  
Time Resolved Photoluminescence

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Influence of Laser Heat Treatment on Fracture Strength of Ceramic Thin Film

2012 ◽  
Vol 566 ◽  
pp. 145-149
Author(s):  
Hirotaka Tanabe ◽  
Keiji Ogawa ◽  
Yui Izumi ◽  
Tohru Takamatsu ◽  
Heisaburo Nakagawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Fracture Strength ◽  
Strength Loss ◽  
Substrate Material ◽  
Laser Quenching ◽  
Ceramic Thin Films ◽  
Film Hardness ◽  
Induced Changes ◽  
Substrate Hardness

In our previous study, it has been shown that improvement of the adhesive strength and substrate hardness of ceramic coated steels without compromising the film hardness can be achieved by applying laser quenching. In the present research, in order to demonstrate further development of this method, the fracture strength of laser-irradiated ceramic thin films (CrAlN, TiAlN and CrN) was investigated by sphere indentation testing. To prevent heat-induced changes in the substrate hardness, a cemented carbide WC-Co rather than steel was used as substrate material. While the fracture strength of each film decreased significantly through furnace heat treatment, it remained almost unchanged in case of the laser irradiated films. Laser quenching has been shown to effectively reduce the fracture strength loss of the ceramic thin films in coated steels.

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