Characterization of self-heating in GaN high electron mobility transistors using channel resistance measurement

2019 ◽  
Vol 58 (SC) ◽  
pp. SCCB11 ◽  
Author(s):  
Mei Wu ◽  
Meng Zhang ◽  
Qing Zhu ◽  
Ling Yang ◽  
Xiaohua Ma ◽  
...  
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
Resistance Measurement ◽  
High Electron ◽  
High Electron Mobility ◽  
Self Heating ◽  
Electron Mobility Transistors ◽  
Channel Resistance

scholarly journals Characterization of self-heating in cryogenic high electron mobility transistors using Schottky thermometry

2021 ◽  
Vol 130 (15) ◽  
pp. 155107
Author(s):  
Alexander Y. Choi ◽  
Iretomiwa Esho ◽  
Bekari Gabritchidze ◽  
Jacob Kooi ◽  
Austin J. Minnich
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Self Heating ◽  
Electron Mobility Transistors
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