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Study on random telegraph noise of high-κ/metal-gate gate-all-around poly-Si nanowire transistors
Japanese Journal of Applied Physics
◽
10.7567/1347-4065/ab5b67
◽
2020
◽
Vol 59
(SG)
◽
pp. SGGA04
Author(s):
You-Tai Chang
◽
Yueh-Lin Tsai
◽
Kang-Ping Peng
◽
Chun-Jung Su
◽
Pei-Wen Li
◽
...
Keyword(s):
Metal Gate
◽
Random Telegraph Noise
◽
Si Nanowire
◽
Nanowire Transistors
◽
Telegraph Noise
Download Full-text
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Cited By
References
Study on Random Telegraph Noise of High-κ/Metal-Gate Gate-All-Around Poly-Si Nanowire Transistors
10.7567/ssdm.2019.ps-1-03
◽
2019
◽
Author(s):
Y.-T. Chang
◽
Y.-L. Tsai
◽
K.-P. Peng
◽
P.-W. Li
◽
H.-C. Lin
Keyword(s):
Metal Gate
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Random Telegraph Noise
◽
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◽
Nanowire Transistors
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New understanding of the statistics of random telegraph noise in Si nanowire transistors - the role of quantum confinement and non-stationary effects
2011 International Electron Devices Meeting
◽
10.1109/iedm.2011.6131599
◽
2011
◽
Cited By ~ 1
Author(s):
Changze Liu
◽
Runsheng Wang
◽
Jibin Zou
◽
Ru Huang
◽
Chunhui Fan
◽
...
Keyword(s):
Quantum Confinement
◽
Random Telegraph Noise
◽
Si Nanowire
◽
Nanowire Transistors
◽
Telegraph Noise
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Trapping Depth and Transition Probability of Four-Level Random Telegraph Noise in a Gate-All-Around Poly-Si Nanowire Transistor
IEEE Transactions on Nanotechnology
◽
10.1109/tnano.2020.2987824
◽
2020
◽
Vol 19
◽
pp. 338-343
Author(s):
You-Tai Chang
◽
Yueh-Lin Tsai
◽
Kang-Ping Peng
◽
Chun-Jung Su
◽
Pei-Wen Li
◽
...
Keyword(s):
Transition Probability
◽
Random Telegraph Noise
◽
Si Nanowire
◽
Nanowire Transistor
◽
Telegraph Noise
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Characterization of Random Telegraph Noise in Scaled High- /Metal-Gate MOSFETs with SiO2/HfO2 Gate Dielectrics
ECS Transactions
◽
10.1149/05201.0941ecst
◽
2013
◽
Vol 52
(1)
◽
pp. 941-946
◽
Cited By ~ 4
Author(s):
M. Li
◽
R. Wang
◽
J. Zou
◽
R. Huang
Keyword(s):
Gate Dielectrics
◽
Metal Gate
◽
Random Telegraph Noise
◽
Telegraph Noise
◽
High Metal
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Characterization of Four-Level Random Telegraph Noise in a Gate-All-Around Poly-Si Nanowire Transistor
2019 Silicon Nanoelectronics Workshop (SNW)
◽
10.23919/snw.2019.8782974
◽
2019
◽
Cited By ~ 1
Author(s):
You-Tai Chang
◽
Pei-Wen Li
◽
Horng-Chih Lin
Keyword(s):
Random Telegraph Noise
◽
Si Nanowire
◽
Nanowire Transistor
◽
Telegraph Noise
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Impact of Trap Behavior on Random Telegraph Noise in High-k/Metal Gate pMOSFETs
Journal of Nanoelectronics and Optoelectronics
◽
10.1166/jno.2018.2128
◽
2018
◽
Vol 13
(4)
◽
pp. 454-457
Author(s):
Tsung-Hsien Kao
◽
Sheng-Po Chang
◽
Shoou-Jinn Chang
Keyword(s):
Metal Gate
◽
Random Telegraph Noise
◽
High K
◽
Telegraph Noise
Download Full-text
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
Applied Physics Letters
◽
10.1063/1.4893445
◽
2014
◽
Vol 105
(6)
◽
pp. 062109
Author(s):
Tsung-Hsien Kao
◽
Shoou-Jinn Chang
◽
Yean-Kuen Fang
◽
Po-Chin Huang
◽
Chien-Ming Lai
◽
...
Keyword(s):
Field Effect
◽
Field Effect Transistors
◽
Noise Analysis
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Metal Gate
◽
Random Telegraph Noise
◽
High K
◽
Telegraph Noise
◽
P Type
Download Full-text
Characterization the random telegraph noise in 32nm high-k/metal gate CMOSFETs
10.7567/ssdm.2010.p-3-14
◽
2010
◽
Author(s):
W. K. Yeh
◽
C. W. Hsu
◽
Y. K. Fang
◽
C. Y. Chen
◽
C. T. Lin
◽
...
Keyword(s):
Metal Gate
◽
Random Telegraph Noise
◽
High K
◽
Telegraph Noise
Download Full-text
Correlation between 1/f Noise Parameters and Random Telegraph Noise in 28-nm High-k/Metal Gate pMOSFETs with Embedded SiGe Source/Drain
10.7567/ssdm.2013.ps-3-4
◽
2013
◽
Author(s):
S.C. Tsai
◽
S.L. Wu
◽
J.F. Chen
◽
K.S. Tsai
◽
T.H. Kao
◽
...
Keyword(s):
Metal Gate
◽
Random Telegraph Noise
◽
Noise Parameters
◽
High K
◽
Telegraph Noise
◽
28 Nm
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Study on interfacial trap location induced subthreshold slope degradation extracted by random telegraph noise for high-k/metal gate FinFET devices
Microelectronics Reliability
◽
10.1016/j.microrel.2020.113728
◽
2020
◽
Vol 111
◽
pp. 113728
Author(s):
Yi-Lin Yang
◽
Wenqi Zhang
◽
Yu-Lin Chen
◽
Wen-Kuan Yeh
Keyword(s):
Subthreshold Slope
◽
Metal Gate
◽
Random Telegraph Noise
◽
High K
◽
Telegraph Noise
◽
Trap Location
Download Full-text
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