Impact of granular work function variation in a gate electrode on low-frequency noise for fin field-effect transistors
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2000 ◽
Vol 40
(11)
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pp. 1897-1903
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2012 ◽
Vol 51
(6S)
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pp. 06FE18
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2015 ◽
2011 ◽
Vol 61
(1)
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pp. 106-110
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