Erratum: “Comparison of Multilayer Dielectric Thin Films for Future Metal–Insulator–Metal Capacitors: Al2O3/HfO2/Al2O3versus SiO2/HfO2/SiO2”

2011 ◽  
Vol 50 (12R) ◽  
pp. 129202
Author(s):  
Sang-Uk Park ◽  
Hyuk-Min Kwon ◽  
In-Shik Han ◽  
Yi-Jung Jung ◽  
Ho-Young Kwak ◽  
...  
2011 ◽  
Vol 50 (10S) ◽  
pp. 10PB06 ◽  
Author(s):  
Sang-Uk Park ◽  
Hyuk-Min Kwon ◽  
In-Shik Han ◽  
Yi-Jung Jung ◽  
Ho-Young Kwak ◽  
...  

2011 ◽  
Vol 519 (11) ◽  
pp. 3831-3834 ◽  
Author(s):  
M. Lukosius ◽  
C. Baristiran Kaynak ◽  
Ch. Wenger ◽  
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S. Rushworth ◽  
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2018 ◽  
Author(s):  
Z. Nurbaya ◽  
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M. D. Rozana ◽  
S. A. H. Alrokayan ◽  
H. A. Khan ◽  
...  

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