Analysis of Chlorine Ions in Antimony-Doped Tin Oxide Thin Film Using Synchrotron Grazing Incidence X-ray Diffraction

2012 ◽  
Vol 51 (10S) ◽  
pp. 10NE28 ◽  
Author(s):  
Yang-Yi Lin ◽  
Albert T. Wu ◽  
Ching-Shun Ku ◽  
Hsin-Yi Lee
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Grazing Incidence ◽  
Oxide Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Chlorine Ions

Analysis of Chlorine Ions in Antimony-Doped Tin Oxide Thin Film Using Synchrotron Grazing Incidence X-ray Diffraction

2012 ◽  
Vol 51 ◽  
pp. 10NE28 ◽  
Author(s):  
Yang-Yi Lin ◽  
Albert T. Wu ◽  
Ching-Shun Ku ◽  
Hsin-Yi Lee
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Grazing Incidence ◽  
Oxide Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Chlorine Ions

Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate

1995 ◽  
Vol 39 ◽  
pp. 659-664 ◽  
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Shoichi Kal ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Film Studies ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Evaluation ◽  
Crystalline Substrate ◽  
Scattering Volume

Thin film technology is rapidly evolving today, and the characterization of the thin film and its surface have become very important issue not only from scientific but also technological viewpoints. Although x-ray diffraction measurements have been used as suitable evaluation methods in crystallography studies, its application to the structural evaluation of the thin films, especially organic one having the low electron densities, is not easy due to the small amounts of scattering volume and the high obstructive scattering noise from the substrate. However, the x-ray diffraction measurements under grazing incidence will aid not only in overcoming the such problems but also in analyzing in-plane structure of the thin films. Therefore, so-called grazing incidence x-ray diffraction (GIXD) has been recognized as one of the most powerful tools for the surface and thin film studies.

Progress in study of mono- and multilayers and thin film structure by X-ray reflectivity, grazing incidence X-ray diffraction and spectroscopy

2014 ◽  
Vol 83 (12) ◽  
Author(s):  
M A Shcherbina ◽  
S N Chvalun ◽  
Sergey Anatol'evich Ponomarenko ◽  
Mikhail Valentinovich Kovalchuk
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Film Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film Structure

Properties of Nanosized Tin Oxide Thin Film Prepared by Reactive Magnetron Sputtering

2007 ◽  
Author(s):  
Xiao Di Liu ◽  
Dacheng Zhang
Keyword(s):  
Magnetron Sputtering ◽  
Quartz Glass ◽  
Tin Oxide ◽  
Reactive Magnetron Sputtering ◽  
Oxide Thin Film ◽  
Reactive Magnetron ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Different Temperatures

Nanosized tin oxide thin films were fabricated on silicon and quartz glass substrates by direct current reactive magnetron sputtering method, and then were calcined at different temperatures ranging from 400°C to 900°C. The results analyzed by X ray photoemission spectra (XPS), scanning electron microscope (SEM), Spectroscopic ellipsometer, Powder X-ray diffraction (XRD), and HP4145B semiconductor parameter analyzer measurements show that the sample with quartz glass substrate and calcinated at 650°C possesses better properties and suitable to be used in our gas sensor.

scholarly journals Cation disorder in CZTS materials from anomalous diffraction at KMC-2 (BESSY)

2014 ◽  
Vol 70 (a1) ◽  
pp. C1774-C1774
Author(s):  
Daniel Többens ◽  
Kai Neldner ◽  
Laura Valle-Rios ◽  
Susan Schorr
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Grazing Incidence ◽  
Thin Film Solar Cells ◽  
Anomalous Scattering ◽  
X Ray Diffraction ◽  
Promising Alternative ◽  
X Ray ◽  
Cu And Zn ◽  
Absorption Edges

The compound semiconductor Cu2ZnSnS4 (CZTS) is a promising alternative for absorber layers in thin film solar cells, as it has a nearly ideal band gap of about 1.5 eV, a high absorption coefficient for visible light, and contains only earth abundant and non-toxic elements. Besides chemical composition and phase purity, the efficiency of CZTS thin film solar cells depends strongly on the concentration of Cu- and Zn-antisites and copper vacancies in the kesterite-type structure. However, Cu(I) and Zn(II) are isoelectric and thus cannot be distinguished by conventional X-ray diffraction. In prior work we determined Cu-Zn-distribution successfully from neutron scattering [1]. Here we present experiments utilizing anomalous X-ray diffraction on the K-edges of Cu and Zn. Anomalous scattering coefficients are heavily wavelength-dependent close to the absorption edges of the respective element. This is utilized for contrast enhancement. Usage of multiple wavelengths above, below and between the absorption edges of Cu and Zn ensures significant overdetermination, so that the Cu-, Zn-, and vacancy concentrations can be refined reliably for the independent crystallographic sites. Experiments were conducted at the diffraction end station of the KMC-2 beamline [2] at BESSY (Berlin, Germany). KMC-2 provides X-ray radiation with both very stable energies and intensities. The accessible energy range of 4 – 14 keV is ideally suited for the K-edges of Cu (8979 eV) and Zn (9659 eV). A 6-circle goniometer in psi-geometry allows both powder and grazing incidence diffraction, so that bulk samples and thin films can be measured. The instrument can be equipped with either a scintillation point detector (Cyberstar) or an area detector (Bruker Vantec), allowing to optimize resolution and intensity to the needs of the experiment.

Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X-ray Diffraction Technique

2011 ◽  
Author(s):  
C. G. Ching ◽  
S. S. Ng ◽  
Z. Hassan ◽  
H. Abu Hassan ◽  
N. H. Al-Hardan ◽  
...  
Keyword(s):  
Thin Film ◽  
Silicon Carbide ◽  
Zinc Oxide ◽  
Structural Properties ◽  
Oxide Thin Film ◽  
X Ray Diffraction ◽  
Zinc Oxide Thin Film ◽  
X Ray

In-plane anisotropy in thin-film media analyzed by grazing incidence X-ray diffraction [CoCrTaPt/Cr]

1997 ◽  
Vol 33 (5) ◽  
pp. 2971-2973 ◽  
Author(s):  
T. Hirose ◽  
H. Teranishi ◽  
M. Ohsawa ◽  
A. Ueda ◽  
O. Ishiwata ◽  
...  
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Plane Anisotropy
Sign in / Sign up

Export Citation Format

Share Document