Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress
2014 ◽
Vol 53
(4S)
◽
pp. 04EF11
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2008 ◽
Vol 53
(1)
◽
pp. 412-415
◽
Keyword(s):
2011 ◽
Vol 32
(4)
◽
pp. 509-511
◽
Keyword(s):
2006 ◽
Vol 7
(3)
◽
pp. 27-30
◽
Keyword(s):