Investigating electron depletion effect in amorphous indium–gallium–zinc-oxide thin-film transistor with a floating capping metal by technology computer-aided design simulation and leakage reduction
2014 ◽
Vol 53
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pp. 064302
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pp. 65-71
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2020 ◽
Vol 41
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pp. 856-859
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Vol 30
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pp. 2003285
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Vol 213
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pp. 1873-1877
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Vol 48
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pp. 1231-1233
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