Reverse plasma motion driven by moderately screened rotating electric field in an electrodeless plasma thruster

2015 ◽  
Vol 55 (1) ◽  
pp. 016202 ◽  
Author(s):  
Naofumi Ohnishi ◽  
Ryosuke Nomura ◽  
Takahiro Nakamura ◽  
Hiroyuki Nishida
Author(s):  
Ryosuke NOMURA ◽  
Naofumi OHNISHI ◽  
Takahiro NAKAMURA ◽  
Hiroyuki NISHIDA

2012 ◽  
Author(s):  
Ryosuke Nomura ◽  
Naofumi Ohnishi ◽  
Hiroyuki Nishida

2021 ◽  
pp. 1-47
Author(s):  
Mikhail Borisovich Gavrikov ◽  
Aleksei Aleksandrovich Tayurskiy

A mathematical model is proposed for studying the processes in a stationary plasma thruster (SPT) taking into account the ionization of the working substance - Xenon, based on the hybrid equations of electromagnetic hydrodynamics (EMHD) of the plasma. The 1D2V case of plane symmetry is considered in detail, for which a numerical algorithm for investigating solutions of hybrid EMHD equations is constructed, based on the method of macroparticles. The solution of a number of fundamental issues is given: the calculation of average values, interpolation, construction of the initial distribution of macroparticles, the choice of boundary conditions for the electric field, etc. The results of calculations with and without taking into account the induction fields in the SPT are presented.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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