Nondestructive measurement of homoepitaxially grown GaN film thickness with Fourier transform infrared spectroscopy
1995 ◽
Vol 8
(3)
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pp. 333-339
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1986 ◽
Vol 32
(8)
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pp. 6339-6352
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1999 ◽
2016 ◽
1992 ◽
Vol 7
(3)
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pp. 155-157
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2013 ◽
Vol 41
(10)
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pp. 1470