Epi-film thickness measurements using emission Fourier transform infrared spectroscopy. I. Sensor characterization
1995 ◽
Vol 8
(3)
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pp. 333-339
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1990 ◽
Vol 19
(2)
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pp. 181-185
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1995 ◽
Vol 8
(3)
◽
pp. 340-345
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1986 ◽
Vol 32
(8)
◽
pp. 6339-6352
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1999 ◽
2016 ◽