An Iterative Hybrid Harmonics Detection Method Based on Discrete Wavelet Transform and Bartlett–Hann Window

The current signal harmonic detection method(s) cannot reduce the errors in the analysis and extraction of mixed harmonics in the power grid. This paper designs a harmonic detection method based on discrete Fourier transform (DFT) and discrete wavelet transform (DWT) using Bartlett–Hann window function. It improves the detection accuracy of the existing methods in the low frequency steady-state part. In addition, it also separates the steady harmonics from the attenuation harmonics of the high frequency part. Simulation results show that the proposed harmonic detection method improves the detection accuracy of the steady-state part by 1.5175% compared to the existing method. The average value of low frequency steady-state amplitude detection of the proposed method is about 95.3375%. At the same time, the individual harmonic components of the signal are accurately detected and recovered in the high frequency part, and separation of the steady-state harmonics and the attenuated harmonics is achieved. This method is beneficial to improve the ability of harmonic analysis in the power grid.

Dynamic relation between global Islamic and conventional sectoral stock and bonds indexes

This paper examines the relationship between 10 Global sectoral conventional and Islamic assets. For each sector, a conventional, an Islamic stock index and a bond are retained. The analyzed relations are done by taking into account diverse investment horizons by using MODWT and GARCH-DCC-type models. Our results indicate that adding bond indexes into a portfolio composed with conventional stock or Islamic stock is efficient. As for the correlations between conventional and Islamic sectoral indexes, they depend on the sector. Relations between returns of securities are quite similar to the relations between high-frequency part of these series and are very volatile at low frequency.

Vibration Analysis of a Horizontal Partially Fluid-Filled Cylindrical Shell Considering Sloshing Effect of Free Surface

The free and forced vibrations of a horizontal partially fluid-filled cylindrical shell with sloshing effect are studied based on the finite element method. The structure and inner fluid taking into account the sloshing effect of the free surface are simulated by the shell and acoustic elements respectively. The natural frequencies of sloshing fluid and shell structure are calculated simultaneously by the FEM. To verify the accuracy of the results, the shell’s natural frequencies are compared with published results. The effects of the structural parameters and fluid depth on the vibration of the coupled system are discussed. The natural frequencies of a sloshing fluid can be divided into low-frequency and high-frequency part, and the low-frequency part refers to the pressure fluctuation caused by the sloshing of the free surface, while the high-frequency part corresponds to the pressure fluctuation of the particles below the free surface. The thinner the shell thickness is, the lower the sloshing frequency of free surface and coupled modal frequency of the shell are. With the increase of the liquid depth, the natural sloshing frequency of the free surface increases slightly while the coupled modal frequency of the shell decreases. The impact of the free surface effect on the coupled vibration cannot be omitted when the shell’s natural frequencies are close to the sloshing frequencies.

A New Method for Multipath Filtering in GPS Static High-Precision Positioning

It is well known that multipath is one of the main sources of errors in GPS static high precision positioning of short baselines. Most algorithms for reducing multipath manipulate the GPS double difference (DD) observation residuals as input signal in GPS signal processing. In the traditional multipath mitigation methods, applying the wavelet transform (WT) to decompose the GPS DD observation residuals for identifying the multipath disturbance cannot effectively filter out the white noise of the high frequency part of the signal, and it is prone to edge effect. In this paper, for extracting multipath, a wavelet packet algorithm based on two-dimensional moving weighted average processing (WP-TD) is proposed. This algorithm can not only effectively filter out the white noise of the high frequency part of the signal, but also weaken the influence of the edge effect. Furthermore, considering the repeatability of multipath error in static positioning, we propose a method for determining the level of wavelet packet decomposition layers which make multipath extraction more effectively. The experimental results show that the corrected positioning accuracy is 14.14% higher than that of the traditional wavelet transform when applying the obtained multipath to DD coordinate sequences for position correction.

Extracting super-resolution details directly from a diffraction-blurred image or part of its frequency spectrum

It is usually believed that the low frequency part of a signal’s Fourier spectrum represents its profile, while the high frequency part represents its details. Conventional light microscopes filter out the high frequency parts of image signals, so that people cannot see the details of the samples (objects being imaged) in the blurred images. However, we find that in a certain “resolvable condition”, a signal’s low frequency and high frequency parts not only represent profile and details respectively. Actually, any one of them also contains the full information (including both profile and details) of the sample’s structure. Therefore, for samples with spatial frequency beyond diffraction-limit, even if the image’s high frequency part is filtered out by the microscope, it is still possible to extract the full information from the low frequency part. On the basis of the above findings, we propose the technique of Deconvolution Super-resolution (DeSu-re), including two methods. One method extracts the full information of the sample’s structure directly from the diffraction-blurred image, while the other extracts it directly from part of the observed image’s spectrum (e.g., low frequency part). Both theoretical analysis and simulation experiment support the above findings, and also verify the effectiveness of the proposed methods.

Extracting super-resolution details directly from a diffraction-blurred image or part of its frequency spectrum

It is usually believed that the low frequency part of a signal’s Fourier spectrum represents its profile, while the high frequency part represents its details. Conventional light microscopes filter out the high frequency parts of image signals, so that people cannot see the details of the samples (objects being imaged) in the blurred images. However, we find that in a certain “resolvable condition”, a signal’s low frequency and high frequency parts not only represent profile and details respectively. Actually, any one of them also contains the full information (including both profile and details) of the sample’s structure. Therefore, for samples with spatial frequency beyond diffraction-limit, even if the image’s high frequency part is filtered out by the microscope, it is still possible to extract the full information from the low frequency part. On the basis of the above findings, we propose the technique of Deconvolution Super-resolution (DeSu-re), including two methods. One method extracts the full information of the sample’s structure directly from the diffraction-blurred image, while the other extracts it directly from part of the observed image’s spectrum (e.g., low frequency part). Both theoretical analysis and simulation experiment support the above findings, and also verify the effectiveness of the proposed methods.

Extracting super-resolution details directly from a diffraction-blurred image or part of its frequency spectrum

It is usually believed that the low frequency part of a signal’s Fourier spectrum represents its profile, while the high frequency part represents its details. Conventional light microscopes filter out the high frequency parts of image signals, so that people cannot see the details of the samples (objects being imaged) in the blurred images. However, we find that in a certain “resolvable condition”, a signal’s low frequency and high frequency parts not only represent profile and details respectively. Actually, any one of them also contains the full information (including both profile and details) of the sample’s structure. Therefore, for samples with spatial frequency beyond diffraction-limit, even if the image’s high frequency part is filtered out by the microscope, it is still possible to extract the full information from the low frequency part. On the basis of the above findings, we propose the technique of Deconvolution Super-resolution (DeSu-re), including two methods. One method extracts the full information of the sample’s structure directly from the diffraction-blurred image, while the other extracts it directly from part of the observed image’s spectrum (e.g., low frequency part). Both theoretical analysis and simulation experiment support the above findings, and also verify the effectiveness of the proposed methods.

Extracting super-resolution details directly from a diffraction-blurred image or part of its frequency spectrum

It is usually believed that the low frequency part of a signal’s Fourier spectrum represents its profile, while the high frequency part represents its details. Conventional light microscopes filter the high frequency parts of image signals, so that people cannot see the details of the samples (objects being imaged) in the blurred images. However, we find that in a certain condition (isolated lighting or named separated lighting), a signal’s low frequency and high frequency parts not only represent profile and details respectively. Actually, any one of them also contains the full information (including both profile and details) of the sample’s structure. Therefore, for samples with spatial frequency beyond diffraction-limit, even if the image’s high frequency part is filtered by the microscope, it is still possible to extract the full information from the low frequency part. Based on the above findings, we propose the technique of Deconvolution Super-resolution (DeSu-re), including two methods. One method extract the full information of the sample’s structure directly from the diffraction-blurred image, while the other extract it directly from part of the observed image’s spectrum, e.g., low frequency part. Both theoretical analysis and simulation experiment support the above findings, and also verify the effectiveness of the proposed methods.

Extracting super-resolution details directly from a diffraction-blurred image or part of its frequency spectrum

It is usually believed that the low frequency part of a signal’s Fourier spectrum represent its profile, while the high frequency part represent its details. Conventional light microscopes filter the high frequency parts of image signals, so that people cannot see the details of the samples (objects being imaged) in the blurred images. However, we find that in a certain condition (isolated lighting or named separated lighting), a signal’s low frequency and high frequency parts not only represent profile and details respectively. Actually, any one of them also contains the full information (including both profile and details) of the sample’s structure. Therefore, for samples with spatial frequency beyond diffraction-limit, even if the image’s high frequency part is filtered by the microscope, it is still possible to extract the full information from the low frequency part. Based on the above findings, we propose the technique of Deconvolution Super-resolution (DeSu-re), including two methods. One method extract the full information of the sample’s structure information directly from the diffraction-blurred image, while the other extract it directly from part of the observed image’s spectrum, e.g., low frequency part. Both theoretical analysis and simulation experiment support the above findings, and also verify the effectiveness of the proposed methods.