Observation of multiple Bragg reflections accompanying forbidden Si(002) reflection in bent-perfect Si crystal

Strong multiple Bragg reflections (MBRs) which can be realized in a bent-perfect-crystal (BPC) slab provide a monochromatic beam of excellent resolution parameters. For identifying MBR effects in the BPC Si crystal, we used the method of azimuthal rotation of the crystal lattice around the scattering vector of the primary forbidden Si(200) reflection for a fixed chosen wavelength. In this paper, several azimuthal scans searching strong MBR effects with the intention of a possible practical exploitation for very high-resolution diffractometry are presented.

Performance of BL07A at NewSUBARU with installation of a new multi-layered-mirror monochromator

Soft X-rays excite the inner shells of materials more efficiently than any other form of light. The investigation of synchrotron radiation (SR) processes using inner-shell excitation requires the beamline to supply a single-color and high-photon-flux light in the soft X-ray region. A new integrated computing multi-layered-mirror (MLM) monochromator was installed at beamline 07A (BL07A) of NewSUBARU, which has a 3 m undulator as a light source for irradiation experiments with high-photon-flux monochromatic light. The MLM monochromator has a high reflectivity index in the soft X-ray region; it eliminates unnecessary harmonic light from the undulator and lowers the temperature of the irradiated sample surfaces. The monochromator can be operated in a high vacuum, and three different mirror pairs are available for different experimental energy ranges; they can be exchanged without exposing the monochromator to the atmosphere. Measurements of the photon current of a photodiode on the sample stage indicated that the photon flux of the monochromatic beam was more than 1014 photons s−1 cm−2 in the energy range 80–400 eV and 1013 photons s−1 cm−2 in the energy range 400–800 eV. Thus, BL07A is capable of performing SR-stimulated process experiments.

Single-crystal neutron diffraction in diamond anvil cells with hot neutrons

It is demonstrated that it is possible to perform single-crystal measurements in diamond anvil cells (DACs) with a monochromatic beam at modern hot neutron sources that offer the benefit of short neutron wavelengths with high fluxes. A piston–cylinder DAC with conical Boehler–Almax diamonds that allows for a wide accessibility of the reciprocal space has been developed. The diffraction data collected in this cell using hot neutrons are of very good quality and can be used for a full and reliable structure refinement.

Dislocations in SiC Revealed by NaOH Vapor Etching and a Comparison with X-Ray Topography Taken with Various g-Vectors

Threading dislocations (TDs) in 4H-SiC have been studied by comparing etch pits formed by NaOH vapor etching with results of synchrotron monochromatic-beam X-ray topography (XRT) taken under different g-vectors. Burgers vectors determined based on XRT results were utilized to investigate the etch pit characteristics of edge (TED), screw (TSD) and mixed (Burgers vector b=c+a, TMD) threading dislocations. It has been found that pit formation by NaOH vapor etching was very different to that by conventional molten KOH etching. We discuss the possibility of using NaOH vapor etching to distinguish TMDs from TSDs, and report a variety of characteristic etch pits formed by this method and their correlations to dislocation behavior.

Neutron diffraction studies of a double-crystal (+n,–m) setting containing a fully asymmetric diffraction geometry of a bent perfect crystal with output beam expansion

The neutron diffraction properties of a double-crystal (+n,−m) setting, which contains a bent perfect Si(311) crystal in the fully asymmetric diffraction (FAD) geometry with output beam expansion and a bent perfect Si(220) crystal in the symmetric diffraction geometry, are presented. Generally, there are two possibilities for the FAD geometry: either with output beam compression or with output beam expansion. In this case, attention has been focused on the latter. The properties of the (+n,−m) double-bent-crystal arrangement of a bent perfect crystal FAD Si(311) geometry, in combination with a bent Si(220) crystal slab in the symmetric diffraction geometry, were studied. It was found that, after beam expansion, this FAD geometry can provide a monochromatic beam of rather large cross section but very small divergence.