Performance of BL07A at NewSUBARU with installation of a new multi-layered-mirror monochromator

2021 ◽  
Vol 28 (2) ◽  
pp. 618-623
Author(s):  
Shotaro Tanaka ◽  
Shuto Suzuki ◽  
Tomohiro Mishima ◽  
Kazuhiro Kanda
Keyword(s):  
Synchrotron Radiation ◽  
Energy Range ◽  
Light Source ◽  
Monochromatic Light ◽  
High Vacuum ◽  
Photon Flux ◽  
X Rays ◽  
Monochromatic Beam ◽  
X Ray ◽  
High Photon Flux

Soft X-rays excite the inner shells of materials more efficiently than any other form of light. The investigation of synchrotron radiation (SR) processes using inner-shell excitation requires the beamline to supply a single-color and high-photon-flux light in the soft X-ray region. A new integrated computing multi-layered-mirror (MLM) monochromator was installed at beamline 07A (BL07A) of NewSUBARU, which has a 3 m undulator as a light source for irradiation experiments with high-photon-flux monochromatic light. The MLM monochromator has a high reflectivity index in the soft X-ray region; it eliminates unnecessary harmonic light from the undulator and lowers the temperature of the irradiated sample surfaces. The monochromator can be operated in a high vacuum, and three different mirror pairs are available for different experimental energy ranges; they can be exchanged without exposing the monochromator to the atmosphere. Measurements of the photon current of a photodiode on the sample stage indicated that the photon flux of the monochromatic beam was more than 1014 photons s−1 cm−2 in the energy range 80–400 eV and 1013 photons s−1 cm−2 in the energy range 400–800 eV. Thus, BL07A is capable of performing SR-stimulated process experiments.

scholarly journals NSLS-II MX beamlines FMX for micro-crystallography & AMX for highly automated MX

2014 ◽  
Vol 70 (a1) ◽  
pp. C1733-C1733
Author(s):  
Martin Fuchs ◽  
Robert Sweet ◽  
Lonny Berman ◽  
Dileep Bhogadi ◽  
Wayne Hendrickson ◽  
...  
Keyword(s):  
Energy Range ◽  
Structure Determination ◽  
Optical Systems ◽  
Photon Flux ◽  
X Rays ◽  
Macromolecular Crystallography ◽  
Binding Studies ◽  
X Ray ◽  
Array Detectors ◽  
Broad Energy Range

We present the final design of the x-ray optical systems and experimental stations of the two macromolecular crystallography (MX) beamlines, FMX and AMX, at the National Synchrotron Light Source-II (NSLS-II). Along with its companion x-ray scattering beamline, LIX, this suite of Advanced Beamlines for Biological Investigations with X-rays (ABBIX, [1]) will begin user operation in 2016. The pair of MX beamlines with complementary and overlapping capabilities is located at canted undulators (IVU21) in sector 17-ID. The Frontier Microfocusing Macromolecular Crystallography beamline (FMX) will deliver a photon flux of ~5x10^12 ph/s at a wavelength of 1 Å into a spot of 1 - 50 µm size. It will cover a broad energy range from 5 - 30 keV, corresponding to wavelengths from 0.4 - 2.5 Å. The highly Automated Macromolecular Crystallography beamline (AMX) will be optimized for high throughput applications, with beam sizes from 4 - 100 µm, an energy range of 5 - 18 keV (0.7 - 2.5 Å), and a flux at 1 Å of ~10^13 ph/s. Central components of the in-house-developed experimental stations are a 100 nm sphere of confusion goniometer with a horizontal axis, piezo-slits to provide dynamic beam size changes during diffraction experiments, a dedicated secondary goniometer for crystallization plates, and sample- and plate-changing robots. FMX and AMX will support a broad range of biomedical structure determination methods from serial crystallography on micron-sized crystals, to structure determination of complexes in large unit cells, to rapid sample screening and data collection of crystals in trays, for instance to characterize membrane protein crystals and to conduct ligand-binding studies. Together with the solution scattering program at LIX, the new beamlines will offer unique opportunities for advanced diffraction experiments with micro- and mini-beams, with next generation hybrid pixel array detectors and emerging crystal delivery methods such as acoustic droplet ejection. This work is supported by the US National Institutes of Health.

A scanning transmission X-ray microscope at the Pohang Light Source

2018 ◽  
Vol 25 (3) ◽  
pp. 878-884 ◽  
Author(s):  
Hyun-Joon Shin ◽  
Namdong Kim ◽  
Hee-Seob Kim ◽  
Wol-Woo Lee ◽  
Chae-Soon Lee ◽  
...  
Keyword(s):  
Energy Range ◽  
Light Source ◽  
Photon Energy ◽  
Chemical State ◽  
Photon Energy Range ◽  
X Rays ◽  
X Ray ◽  
Space Resolution ◽  
Scanning Transmission ◽  
Pohang Light Source

A scanning transmission X-ray microscope is operational at the 10A beamline at the Pohang Light Source. The 10A beamline provides soft X-rays in the photon energy range 100–2000 eV using an elliptically polarized undulator. The practically usable photon energy range of the scanning transmission X-ray microscopy (STXM) setup is from ∼150 to ∼1600 eV. With a zone plate of 25 nm outermost zone width, the diffraction-limited space resolution, ∼30 nm, is achieved in the photon energy range up to ∼850 eV. In transmission mode for thin samples, STXM provides the element, chemical state and magnetic moment specific distributions, based on absorption spectroscopy. A soft X-ray fluorescence measurement setup has been implemented in order to provide the elemental distribution of thicker samples as well as chemical state information with a space resolution of ∼50 nm. A ptychography setup has been implemented in order to improve the space resolution down to 10 nm. Hardware setups and application activities of the STXM are presented.

scholarly journals RESONANT MAGNETIC SCATTERING OF POLARIZED SOFT X-RAYS

2000 ◽  
Vol 07 (01n02) ◽  
pp. 175-189 ◽  
Author(s):  
MAURIZIO SACCHI
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Elastic Scattering ◽  
Synchrotron Radiation ◽  
Energy Range ◽  
Magnetic Scattering ◽  
X Rays ◽  
X Ray ◽  
Magnetic Devices ◽  
Recent Extension

Resonant elastic scattering of polarized X-rays is a powerful technique for the study of the magnetic properties of solids. Its recent extension to the soft X-ray energy range has been driven by applications in the field of artificially structured magnetic devices, like multilayers and superlattices. This article reviews recent elastic scattering experiments using synchrotron radiation, performed at the 2p core resonances of transition metals in solids, thin films and ordered multilayers.

LIGA Technologies and Applications

MRS Bulletin ◽  
2001 ◽  
Vol 26 (4) ◽  
pp. 337-340 ◽  
Author(s):  
Jill Hruby
Keyword(s):  
Synchrotron Radiation ◽  
Methyl Methacrylate ◽  
Light Source ◽  
High Energy ◽  
X Rays ◽  
Electromechanical Systems ◽  
X Ray ◽  
Poly Methyl Methacrylate

LIGA, an acronym for the German words for lithography, electroplating, and molding, is a technique used to produce micro-electromechanical systems (MEMS) made from metals, ceramics, or plastics. The LIGA process utilizes x-ray synchrotron radiation as a lithographic light source. Highly collimated, high-energy x-rays from the synchrotron impinge on a patterned mask in proximity to an x-ray-sensitive photoresist, typically poly(methyl methacrylate) (PMMA).

Deep X-ray lithography system with a uniform and high-accuracy fabrication area established in beamline BL11 at NewSUBARU

2019 ◽  
Vol 26 (2) ◽  
pp. 528-534 ◽  
Author(s):  
Masaya Takeuchi ◽  
Akinobu Yamaguchi ◽  
Yuichi Utsumi
Keyword(s):  
Synchrotron Radiation ◽  
Beam Current ◽  
Photon Flux ◽  
X Ray ◽  
Photosensitive Material ◽  
High Photon Flux ◽  
High Uniformity ◽  
Vertical Divergence ◽  
Radiation Induced ◽  
Lithography System

A new lithography system to fabricate high-aspect-ratio 3D microstructures was developed at the NewSUBARU synchrotron radiation facility (University of Hyogo, Japan). The X-ray beam generated by this system has high parallelism (horizontal and vertical divergence angles of 278 µrad and 14 µrad, respectively) and high photon flux (31 mW mm−2 at a beam current of 300 mA). The high photon flux and exposure area of the system were validated and a beam-scan method for a large exposure area with a uniform dose distribution has been proposed. In addition, the deep X-ray lithography performance was characterized using a conventional photosensitive material and the synchrotron-radiation-induced direct etching of polytetrafluoroethylene (PTFE) was demonstrated. An enlargement of the microfabrication area up to 100 mm × 100 mm while contemporarily ensuring high uniformity was achieved.

Absolute soft X-ray measurements using an ion chamber

1998 ◽  
Vol 5 (3) ◽  
pp. 869-871 ◽  
Author(s):  
Norio Saito ◽  
Isao H. Suzuki
Keyword(s):  
Synchrotron Radiation ◽  
Energy Range ◽  
Central Axis ◽  
Rare Gas ◽  
Spectral Purity ◽  
X Rays ◽  
X Ray ◽  
Ion Chamber ◽  
Absolute Intensities ◽  
Photon Intensity

Measurements of soft X-ray absolute intensities have been carried out using a double ion chamber and monochromated synchrotron radiation. The chamber is cylindrical and 1.3 m long. The soft X-ray beam enters the chamber at a position off the central axis, and the produced ions are collected with electrodes on the opposite side to the photon entrance. An index constant for rare gas, the γ-value, which is the average number of electrons emitted from an atom having absorbed a photon, was used for obtaining the absolute photon intensity. The obtained intensity ranges from 1 Gphotons s−1 to 25 Gphotons s−1 in the energy range 72–800 eV. The estimated uncertainty is about 5–20% depending on the intensity and the spectral purity of the soft X-rays.

scholarly journals ARCHAEOLOGICAL APPLICATIONS OF SYNCHROTRON RADIATION AT ELETTRA

2019 ◽  
Author(s):  
F. Zanini
Keyword(s):  
Synchrotron Radiation ◽  
Imaging Techniques ◽  
Vertical Plane ◽  
Source Size ◽  
Fine Tuning ◽  
Photon Flux ◽  
X Rays ◽  
Scientific Publications ◽  
Full Field ◽  
X Ray

The use of synchrotron radiation for the analysis of samples of historical and artistic importance (archaeology, palaeontology, conservation sciences, palaeo-environments) has been increasing over the past years, and experiments related to the study of our cultural heritage (CH) have been routinely performed at many beamlines of Elettra, the Italian synchrotron radiation facility. Fundamental parameters such as the high photon flux, the small source size and the low divergence typical of synchrotrons make it a very efficient source for a range of advanced spectroscopy and imaging techniques, adapted to the dishomogeneity and complexity of the materials under study. The continuous tunability of the source (from infrared to X-rays) is essential for techniques based on a fine tuning of the probing energy to reach high chemical sensitivity such as XANES, EXAFS, STXM, UV/VIS spectrometry. Moreover, the small source size attained in the vertical plane leads to spatial coherence of the photon source itself, giving rise to a series of imaging methods already crucial to the field. The increasing number of scientific publications shows that microfocused hard X-ray spectroscopy (absorption, fluorescence, diffraction), full-field X-ray tomography and infrared spectroscopy are the most popular synchrotron techniques in the field. The Elettra laboratory now offers a platform dedicated to CH researchers in order to support both the proposal application phase and the different steps of the experiment, from sample preparation to data analysis. We will present this activity and the main instrumental setups and experimental techniques in use at Elettra, and describe their impact for the science being applied to ancient materials using synchrotron rad

THE DOPPLER FACTORS AT X-RAY BAND OF THE BLAZARS

2005 ◽  
Vol 14 (06) ◽  
pp. 947-956
Author(s):  
D. C. MEI ◽  
L. ZHANG
Keyword(s):  
Synchrotron Radiation ◽  
Energy Range ◽  
High Energy ◽  
Low Energy ◽  
X Rays ◽  
X Ray ◽  
Inverse Compton Scattering ◽  
Inverse Compton ◽  
Doppler Factor ◽  
Intrinsic Radiation

We study the Doppler factors for a group blazars at soft X-ray band. In our estimates, we have made the assumptions that (i) blazars can be divided into high-energy-peaked (HEP) objects whose synchrotron peak frequencies νp > 1014.7 Hz , and the low-energy-peaked (LEP) objects whose synchrotron peak frequencies νp≤1014.7 Hz , and (ii) the intrinsic radiation from a blazar in the energy range from radio to soft X-ray bands is the synchrotron radiation for HEP objects and the soft X-ray emission comes from inverse Compton scattering for LEP objects. Under the above assumptions, we estimate Doppler factors at optical (δO) and X-rays (δx) for 54 blazars by using the known radio Doppler factors and the observed flux densities in radio, optical and X-ray bands, and Doppler factors [Formula: see text] at X-ray band in which X-rays are assumed to be produced only by the synchrotron radiation. We get [Formula: see text] . The Doppler factors are different in various wavebands, and on average, the Doppler factor decreases with frequency from radio to X-ray bands.

scholarly journals Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source

2020 ◽  
Vol 27 (5) ◽  
pp. 1153-1166 ◽  
Author(s):  
Georg Held ◽  
Federica Venturini ◽  
David C. Grinter ◽  
Pilar Ferrer ◽  
Rosa Arrigo ◽  
...  
Keyword(s):  
Energy Range ◽  
Light Source ◽  
Surface Composition ◽  
Ambient Pressure ◽  
Resolving Power ◽  
Photon Flux ◽  
Xps Spectra ◽  
Near Surface ◽  
X Ray ◽  
X Ray Absorption

The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 1010 photons s−1 over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.

Recent Developments In Monochromatic Microprobe X-Ray Fluorescence (MMXRF)

1998 ◽  
Vol 4 (S2) ◽  
pp. 378-379
Author(s):  
Z. W. Chen ◽  
D. B. Wittry
Keyword(s):  
Materials Science ◽  
High Vacuum ◽  
Three Dimensional ◽  
High Sensitivity ◽  
X Rays ◽  
Fluorescence Excitation ◽  
X Ray ◽  
Quantitative Microanalysis ◽  
Recent Developments ◽  
Fifth Order

A monochromatic x-ray microprobe based on a laboratory source has recently been developed in our laboratory and used for fluorescence excitation. This technique provides high sensitivity (ppm to ppb), nondestructive, quantitative microanalysis with minimum sample preparation and does not require a high vacuum specimen chamber. It is expected that this technique (MMXRF) will have important applications in materials science, geological sciences and biological science.Three-dimensional focusing of x-rays can be obtained by using diffraction from doubly curved crystals. In our MMXRF setup, a small x-ray source was produced by the bombardment of a selected target with a focused electron beam and a toroidal mica diffractor with Johann pointfocusing geometry was used to focus characteristic x-rays from the source. In the previous work ∼ 108 photons/s were obtained in a Cu Kα probe of 75 μm × 43 μm in the specimen plane using the fifth order reflection of the (002) planes of mica.

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