We have designed and built an imaging filter which can can be attached to most standard TEMs, and is capable of operating at primary energies of up to 400 keV. The column-mounted hardware consists of 8 principal parts (Fig. 1): 1) entrance aperture, 2) pre-prism focussing and alignment coils, 3) magnetic prism, 4) spectrum-magnifying quadrupoles, 5) pneumatically retractable energy-selecting slit, 6) quadrupole-sextupole imaging assembly, 7) pneumatically retractable TV-rate CCD camera, and 8) slowscan CCD (SSC) camera. In normal operation, the entrance aperture selects a part of an image (or a diffraction pattern) that is projected by the microscope into the viewing chamber, and a doubly-focused spectrum is produced at the energy selecting slit (with a dispersion of 6 μm / eV at 200 keV). The slit width is piezoelectrically adjustable, and the whole slit assembly can be withdrawn pneumatically from the electron beam. Similar to the TEM column which can either produce an image or a diffraction pattern, the post-slit quadrupole-sextupole assembly can produce either a focussed spectrum at the SSC (or the TV), or a magnified image of the specimen.