Optical power scale realization using the predictable quantum efficient detector

We report realization of scales for optical power of lasers and spectral responsivity of laser power detectors based on a predictable quantum efficient detector (PQED) over the spectral range of 400 nm–800 nm. The PQED is characterized and used to measure optical power of a laser that is further used in calibration of the responsivities of a working standard trap detector at four distinct laser lines, with an expanded uncertainty of about 0.05%. We present a comparison of responsivities calibrated against the PQED at Aalto and the cryogenic radiometer at RISE, Sweden. The measurement results support the concept that the PQED can be used as a primary standard of optical power.

Calibration of a modular trap detector system towards a new realisation of the luminous intensity unit

A modular photometric trap detector system has recently been developed at Physikalisch-Technische Bundesanstalt (PTB). All parts of the detector are now completely calibrated. The new planned traceability chain for the realisation of luminous intensity unit can therefore be established for the first time. This contribution shows the results of the individual calibration steps including the associated measurement uncertainties and correlations. A major part of the calibrations along the traceability chain is done at the upgraded measurement setup TULIP (TUnable Lasers In Photometry). The improvements of the TULIP setup are presented and the effects on the measurement uncertainty are shown. The result of the first complete calibration according to the new traceability chain is compared to previous calibration results both in terms of spectral irradiance responsivity and luminous responsivity. The further steps required towards implementing the new traceability chain and the possible implications are discussed.

High efficiency five-element trap detector with low optical losses

We have constructed a 5-element trap detector using 10 x 10 mm UVG100 photodiodes. The trap exhibits high uniformity of responsivity (±100 part per million) and ultra-low reflectance losses (mostly below 1 part per million) throughout the visible range. Responsivity and quantum efficiency measurements indicate close to ideal performance between 360 nm and 680 nm within the expanded measurement uncertainty of 0.25 %–0.15 %. The UVG trap can be considered as an absolute detector between these wavelengths and as a cheaper and a simpler alternative to the custom-made Predictable Quantum Efficient Detector for use in photometric and radiometric applications.

Measurement-based extrapolation of spectral responsivity by using a low-NEP pyroelectric detector

In case the primary realization of the spectral responsivity scale is not conducted at all target wavelengths but at only a small part of them, one needs to extrapolate values at the specific wavelengths to an extended range. In this work, we present a fully experimental procedure to extrapolate a single value of spectral responsivity at 633 nm into the whole working wavelength range (250 – 1100) nm of Si photodiodes. It is based on spectral responsivity comparison between a Si trap detector and a low-NEP pyroelectric detector of nearly flat spectral response. For this purpose, we developed a setup specialized to compare a Si-trap detector of dc-current output with a pyroelectric detector of ac-voltage output by using a modulated probing light source and a monitoring technique. To keep the probing light chopped even for the dc-photocurrent readout, we adopted a low chopping frequency of 4 Hz and a triggered readout for the Si-trap detector, which leads to a speedy comparison between the Si-trap detector and the pyroelectric detector. For the reference pyroelectric detector, we characterized the spectral absorptivity of the black-coating and the nonlinearity of the lock-in amplifier readout. Compiling all the required information, the spectral responsivity of the Si trap detector could be measured with the minimum uncertainty of 0.3 % (k = 2), which was validated by comparing with that of our previous method based on a numerical extrapolation.

Thin Film Reflectance Model for Trap Detector

The physical model of the spectral responsivity of trap detector consists of multiple parameters such as the internal quantum efficiency and the spectral reflectance. In some measurement models, the spectral reflectance of the trap detector is approximated by fitting a wavelength dependence equation which does not consider the effect of the oxide thickness of the silicon photodiode. To analyse the uncertainty due to the oxide thickness variation, a thin film reflectance model is set up in the Standards and Calibration Laboratory (SCL) for the evaluation of the spectral reflectance of the trap detectors. The model is based on the Fresnel coefficients of a 3-layer thin film structure which consists of air and a thin film oxide layer on a silicon substrate. The reflectance model was implemented as user-defined functions to calculate the spectral reflectance at different oxide thickness. It was also integrated with the SCL’s MCM program to evaluate the uncertainty of the spectral responsivity of trap detectors.