exafs measurement
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AIP Advances ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 055313 ◽  
Author(s):  
Yun Hu ◽  
Shaoen Jiang ◽  
Jiyan Zhang ◽  
Quanxi Xue ◽  
Zhebin Wang ◽  
...  
Keyword(s):  
X Ray ◽  

Impact ◽  
2020 ◽  
Vol 2020 (1) ◽  
pp. 68-70
Author(s):  
Takahiro Maruyama

Nanomaterials are the up-and-coming players in materials science and increasingly found in everyday products such as energy devices, photocatalyst and sporting equipment. They are also predicted to play a major future role in electronics and microfabrication fields. The term nanomaterials usually describe materials of which a single unit ranges in size from 1 to 100 nanometres (nm). A specific nanomaterial called a carbon nanotube is exactly this, a tube made of carbon with a diameter measurable in nanometres. While carbon nanotubes can be further segregated into further subtypes with varying properties, generally speaking they are among the strongest and stiffest materials known in terms of tensile strength and elasticity. These miniature tubes also have promising electrical and optical properties in that they can operate as semiconductors, thermal conductors or even be employed for absorption and fluorescence applications. Because of this broad range of useful properties, the design and use of carbon nanotubes for a variety of applications and industries is receiving lots of attention. Professor Takahiro Maruyama, who is based at both the Nanomaterial Research Centre and the Department of Applied Chemistry, Meijo University in Japan, is leading a team conducting research in this field.


2018 ◽  
Vol 33 (1) ◽  
pp. 84-89 ◽  
Author(s):  
Hiroyuki Asakura ◽  
Naomi Kawamura ◽  
Masaichiro Mizumaki ◽  
Kiyofumi Nitta ◽  
Kenji Ishii ◽  
...  

A feasibility study of a “range-extended” EXAFS measurement was conducted on the Pt L3-edge of Pt/Al2O3 in the presence of Au2O3.


2015 ◽  
Author(s):  
A. K. Poswal ◽  
Ankur Agrawal ◽  
D. Bhattachryya ◽  
S. N. Jha ◽  
N. K. Sahoo

2013 ◽  
Vol 225 ◽  
pp. 558-566 ◽  
Author(s):  
Md. Rabiul Awual ◽  
Tohru Kobayashi ◽  
Hideaki Shiwaku ◽  
Yuji Miyazaki ◽  
Ryuhei Motokawa ◽  
...  

2012 ◽  
Vol 2 (1) ◽  
Author(s):  
Qingyu Kong ◽  
Francois Baudelet ◽  
Jun Han ◽  
Sebastien Chagnot ◽  
Laurent Barthe ◽  
...  

2007 ◽  
Vol 1043 ◽  
Author(s):  
Hirotaka Ohno ◽  
Daiju Matsumura ◽  
Yasuo Nishihata ◽  
Jun'ichiro Mizuki ◽  
Norito Ishikawa ◽  
...  

AbstractCeO2 thin films were irradiated with 200MeV Xe ions. Effects of the irradiation were studied by using Extended X-ray Absorption Fine Structure (EXAFS) measurement at SPring8 synchrotron radiation facility. EXAFS spectra for the irradiated thin films near the Ce K-edge show that the coordination number for oxygen atoms around Ce atom decreases and that the Ce-O Debye-Waller factor increases by the irradiation. The atomic distance between oxygen atom and Ce atom does not vary within the accuracy of EXAFS measurement. The effect of high density electronic excitation on the structure of CeO2 is discussed.


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