2006 Bipolar/BiCMOS Circuits and Technology Meeting
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A High-Slew Rate SiGe BiCMOS Operational Amplifier for Operation Down to Deep Cryogenic Temperatures

2006 ◽  
Author(s):  
Ramkumar Krithivasan ◽  
Yuan Lu ◽  
Laleh Najafizadeh ◽  
Chendong Zhu ◽  
John Cressler ◽  
...  
Keyword(s):  
Operational Amplifier ◽  
Cryogenic Temperatures ◽  
Slew Rate ◽  
Sige Bicmos

scholarly journals SiGe BiCMOS for Analog, High-Speed Digital and Millimetre-Wave Applications Beyond 50 GHz

2006 ◽  
Author(s):  
S.P. Voinigescu ◽  
T. Chalvatzis ◽  
K.h.k. Yau ◽  
A. Hazneci ◽  
A. Garg ◽  
...  
Keyword(s):  
High Speed ◽  
Millimetre Wave ◽  
Sige Bicmos

Simultaneous Integration of SiGe High Speed Transistors and High Voltage Transistors

2006 ◽  
Author(s):  
R. Vytla ◽  
T. Meister ◽  
K. Aufinger ◽  
D. Lukashevich ◽  
S. Boguth ◽  
...  
Keyword(s):  
High Voltage ◽  
High Speed ◽  
Simultaneous Integration

Demonstration of three-dimensional 35nF/mm2 MIM Capacitor integrated in BiCMOS Circuits

2006 ◽  
Author(s):  
J.c. Giraudin ◽  
F. Badets ◽  
J.p. Blanc ◽  
E. Chataigner ◽  
A. Bajolet ◽  
...  
Keyword(s):  
Three Dimensional

High Performances 3D Damascene MIM Capacitors Integrated in Copper Back-End Technologies

2006 ◽  
Author(s):  
S. Cremer ◽  
C. Richard ◽  
D. Benoit ◽  
C. Besset ◽  
J.-p. Manceau ◽  
...  
Keyword(s):  
Mim Capacitors

Physical Description of the Mixed-Mode Degradation Mechanism for High Performance Bipolar Transistors

2006 ◽  
Author(s):  
T. Vanhoucke ◽  
G.A.M. Hurkx ◽  
D. Panko ◽  
R. Campos ◽  
A. Piontek ◽  
...  
Keyword(s):  
Mixed Mode ◽  
High Performance ◽  
Degradation Mechanism ◽  
Bipolar Transistors ◽  
Physical Description

Experimental Study of Metallic Emitter SiGeC HBTs

2006 ◽  
Author(s):  
A. Chantre ◽  
F. Aniel ◽  
N. Zerounian ◽  
D. Dutartre ◽  
F. Saguin ◽  
...  
Keyword(s):  
Experimental Study
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