2007 IEEE Design and Diagnostics of Electronic Circuits and Systems
Latest Publications

TOTAL DOCUMENTS

88

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By IEEE

1424411610

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Power Dissipation in Basic Global Clock Distribution Networks

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295287 ◽

2007 ◽

Author(s):

Artur L. Sobczyk ◽

Arkadiusz W. Luczyk ◽

Witold A. Pleskacz

Keyword(s):

Power Dissipation ◽

Distribution Networks ◽

Clock Distribution ◽

Clock Distribution Networks ◽

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A Low Noise and Low Power CMOS Image Sensor with Pixel-level Correlated Double Sampling

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295263 ◽

2007 ◽

Author(s):

Dongsoo Kim ◽

Gunhee Han

Keyword(s):

Low Power ◽

Cmos Image Sensor ◽

Image Sensor ◽

Low Noise ◽

Double Sampling ◽

Correlated Double Sampling ◽

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A Framework for Self-Healing Radiation-Tolerant Implementations on Reconfigurable FPGAs

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295300 ◽

2007 ◽

Author(s):

Manuel G. Gericota ◽

Luis F. Lemos ◽

Gustavo R. Alves ◽

Jose M. Ferreira

Keyword(s):

Self Healing ◽

Radiation Tolerant

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Memory Based Analogue Signal Generation Implementation Issues for BIST

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295321 ◽

2007 ◽

Author(s):

T. O. Shea ◽

I. Grout ◽

J. Ryan

Keyword(s):

Signal Generation ◽

Analogue Signal

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XSIM: An Efficient Crosstalk Simulator for Analysis and Modeling of Signal Integrity Faults in both Defective and Defect-free Interconnects

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295274 ◽

2007 ◽

Author(s):

Ajoy K. Palit ◽

Kishore K. Duganapalli ◽

Walter Anheier

Keyword(s):

Signal Integrity

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Open Defects Caused by Scratches and Yield Modelling in Deep Sub-Micron Integrated Circuit

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295314 ◽

2007 ◽

Author(s):

Wlodzimierz Jonca

Keyword(s):

Integrated Circuit ◽

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Transition Faults Testing Based on Functional Delay Tests

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295315 ◽

2007 ◽

Author(s):

Eduardas Bareisa ◽

Vacius Jusas ◽

Kestutis Motiejunas ◽

Rimantas Seinauskas

Keyword(s):

Transition Faults ◽

Functional Delay ◽

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Intrusion Detection System Intended for Multigigabit Networks

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295313 ◽

2007 ◽

Author(s):

Jan Korenek ◽

Petr Kobiersky

Keyword(s):

Intrusion Detection ◽

Intrusion Detection System ◽

Detection System

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Analysis of Noise Margins Due to Device Parameter Variations in Sub-100nm CMOS Technology

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295258 ◽

2007 ◽

Author(s):

Zhicheng Liang ◽

Makoto Ikeda ◽

Kunihiro Asada

Keyword(s):

Cmos Technology ◽

Device Parameter ◽

Parameter Variations

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Low cost, low power, intelligent brake temperature sensor system for automotive applications

2007 IEEE Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2007.4295309 ◽

2007 ◽

Author(s):

Gyula Bakonyi-Kiss ◽

Zoltan Szucs

Keyword(s):

Low Power ◽

Temperature Sensor ◽

Low Cost ◽

Sensor System ◽

Automotive Applications

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