Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)
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Bit-serial test pattern generation by an accumulator behaving as a non-linear feedback shift register

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030199 ◽

2003 ◽

Cited By ~ 4

Author(s):

G. Dimitrakopoulos ◽

D. Nikolos ◽

D. Bakalis

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Test Pattern Generation ◽

Serial Test ◽

Non Linear ◽

Feedback Shift Register ◽

Bit Serial

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A system level approach in designing dual-duplex fault tolerant embedded systems

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030180 ◽

2003 ◽

Cited By ~ 10

Author(s):

C. Bolchini ◽

L. Pomante ◽

F. Salice ◽

D. Sciuto

Keyword(s):

Embedded Systems ◽

Fault Tolerant ◽

System Level

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Analysis of the equivalences and dominances of transient faults at the RT level

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030216 ◽

2003 ◽

Cited By ~ 1

Author(s):

L. Berrojo ◽

I. Gonzalez ◽

L. Entrena ◽

C. Lopez ◽

F. Corno ◽

...

Keyword(s):

Transient Faults

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A March-based fault location algorithm for static random access memories

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030228 ◽

2003 ◽

Cited By ~ 1

Author(s):

V.A. Vardanian ◽

Y. Zorian

Keyword(s):

Fault Location ◽

Random Access ◽

Static Random Access Memories ◽

Location Algorithm

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Radiation effects facility RADEF

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030212 ◽

2003 ◽

Cited By ~ 9

Author(s):

A. Virtanen

Keyword(s):

Radiation Effects

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Analysis of SEU effects in a pipelined processor

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030193 ◽

2003 ◽

Cited By ~ 19

Author(s):

M. Rebaudengo ◽

M. Sonza Reorda ◽

M. Violante

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Checkers for RF matching networks on an automatic test board

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030202 ◽

2003 ◽

Author(s):

G. Di Gregorio ◽

M.G. La Rosa ◽

B. Russo

Keyword(s):

Automatic Test ◽

Matching Networks ◽

Test Board

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On-line detection and compensation of transient errors in processor pipeline-structures

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030204 ◽

2003 ◽

Cited By ~ 3

Author(s):

C. Galke ◽

M. Pflanz ◽

H.T. Vierhaus

Keyword(s):

Line Detection ◽

Transient Errors ◽

On Line ◽

Pipeline Structures

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A low power pseudo-random BIST technique

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030197 ◽

2003 ◽

Cited By ~ 8

Author(s):

N.Z. Basturkmen ◽

S.M. Reddy ◽

I. Pomeranz

Keyword(s):

Low Power

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An architecture for self-healing digital systems

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030175 ◽

2003 ◽

Cited By ~ 10

Author(s):

P.K. Lala ◽

B.K. Kumar

Keyword(s):

Digital Systems ◽

Self Healing

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Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Bit-serial test pattern generation by an accumulator behaving as a non-linear feedback shift register

A system level approach in designing dual-duplex fault tolerant embedded systems

Analysis of the equivalences and dominances of transient faults at the RT level

A March-based fault location algorithm for static random access memories

Radiation effects facility RADEF

Analysis of SEU effects in a pipelined processor

Checkers for RF matching networks on an automatic test board

On-line detection and compensation of transient errors in processor pipeline-structures

A low power pseudo-random BIST technique

An architecture for self-healing digital systems

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)
Latest Publications