Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits
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17

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2

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Published By Springer Netherlands

9789048193783, 9789048193790

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How Does Inverse Temperature Dependence Affect Timing Sign-Off

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_13 ◽

2010 ◽

pp. 179-189 ◽

Author(s):

Sean H. Wu ◽

Alexander Tetelbaum ◽

Li-C. Wang

Keyword(s):

Temperature Dependence ◽

Inverse Temperature

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DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_16 ◽

2010 ◽

pp. 221-247

Author(s):

Makoto Takamiya ◽

Koichi Onizuka ◽

Koichi Ishida ◽

Takayasu Sakurai

Keyword(s):

Power Supply ◽

Distributed Power ◽

Hybrid Operation ◽

On Chip ◽

3D Stacking ◽

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Process Variability-Induced Timing Failures – A Challenge in Nanometer CMOS Low-Power Design

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_12 ◽

2010 ◽

pp. 163-177 ◽

Author(s):

Xiaonan Zhang ◽

Xiaoliang Bai

Keyword(s):

Low Power ◽

Low Power Design ◽

Process Variability ◽

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Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_5 ◽

2010 ◽

pp. 67-79 ◽

Author(s):

Kazuhiko Endo ◽

Shin-ichi O’uchi ◽

Yuki Ishikawa ◽

Yongxun Liu ◽

Takashi Matsukawa ◽

...

Keyword(s):

Leakage Current ◽

Double Gate ◽

Sram Cell ◽

Current Reduction

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On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_15 ◽

2010 ◽

pp. 203-217

Author(s):

K. A. Jenkins ◽

Z. Xu ◽

A. P. Jose ◽

K. L. Shepard

Keyword(s):

On Chip ◽

Circuit Technique

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CMOS Logic Gates Leakage Modeling Under Statistical Process Variations

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_14 ◽

2010 ◽

pp. 191-202

Author(s):

Carmelo D’Agostino ◽

Philippe Flatresse ◽

Edith Beigne ◽

Marc Belleville

Keyword(s):

Logic Gates ◽

Process Variations ◽

Statistical Process

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Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_7 ◽

2010 ◽

pp. 97-106

Author(s):

Koji Eriguchi ◽

Masayuki Kamei ◽

Kenji Okada ◽

Hiroaki Ohta ◽

Kouichi Ono

Keyword(s):

Threshold Voltage ◽

Threshold Voltage Shift ◽

Voltage Shift ◽

High K ◽

High K Dielectric

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Metal Gate Effects on a 32 nm Metal Gate Resistor

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_6 ◽

2010 ◽

pp. 81-93

Author(s):

Thuy Dao ◽

Ik_Sung Lim ◽

Larry Connell ◽

Dina H. Triyoso ◽

Youngbog Park ◽

...

Keyword(s):

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Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_1 ◽

2010 ◽

pp. 3-13

Author(s):

Michel Brillouët

Keyword(s):

Design And Technology ◽

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CMOS SOI Technology for WPAN: Application to 60 GHZ LNA

Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits ◽

10.1007/978-90-481-9379-0_9 ◽

2010 ◽

pp. 123-130 ◽

Author(s):

A. Siligaris ◽

C. Mounet ◽

B. Reig ◽

P. Vincent ◽

A. Michel

Keyword(s):

60 Ghz ◽

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