Lecture Notes in Electrical Engineering - Emerging Technologies and Circuits
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Published By Springer Netherlands

9789048193783, 9789048193790
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How Does Inverse Temperature Dependence Affect Timing Sign-Off

2010 ◽  
pp. 179-189 ◽  
Author(s):  
Sean H. Wu ◽  
Alexander Tetelbaum ◽  
Li-C. Wang
Keyword(s):  
Temperature Dependence ◽  
Inverse Temperature

DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation

2010 ◽  
pp. 221-247
Author(s):  
Makoto Takamiya ◽  
Koichi Onizuka ◽  
Koichi Ishida ◽  
Takayasu Sakurai
Keyword(s):  
Power Supply ◽  
Distributed Power ◽  
Hybrid Operation ◽  
On Chip ◽  
3D Stacking ◽  
Supply Systems

CMOS Logic Gates Leakage Modeling Under Statistical Process Variations

2010 ◽  
pp. 191-202
Author(s):  
Carmelo D’Agostino ◽  
Philippe Flatresse ◽  
Edith Beigne ◽  
Marc Belleville
Keyword(s):  
Logic Gates ◽  
Process Variations ◽  
Statistical Process

Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric

2010 ◽  
pp. 97-106
Author(s):  
Koji Eriguchi ◽  
Masayuki Kamei ◽  
Kenji Okada ◽  
Hiroaki Ohta ◽  
Kouichi Ono
Keyword(s):  
Threshold Voltage ◽  
Threshold Voltage Shift ◽  
Voltage Shift ◽  
High K ◽  
High K Dielectric

Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction

2010 ◽  
pp. 67-79 ◽  
Author(s):  
Kazuhiko Endo ◽  
Shin-ichi O’uchi ◽  
Yuki Ishikawa ◽  
Yongxun Liu ◽  
Takashi Matsukawa ◽  
...  
Keyword(s):  
Leakage Current ◽  
Double Gate ◽  
Sram Cell ◽  
Current Reduction

On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution

2010 ◽  
pp. 203-217
Author(s):  
K. A. Jenkins ◽  
Z. Xu ◽  
A. P. Jose ◽  
K. L. Shepard
Keyword(s):  
On Chip ◽  
Circuit Technique

Metal Gate Effects on a 32 nm Metal Gate Resistor

2010 ◽  
pp. 81-93
Author(s):  
Thuy Dao ◽  
Ik_Sung Lim ◽  
Larry Connell ◽  
Dina H. Triyoso ◽  
Youngbog Park ◽  
...  
Keyword(s):  
Metal Gate
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