2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Latest Publications

TOTAL DOCUMENTS

72
(FIVE YEARS 0)

H-INDEX

5
(FIVE YEARS 0)

Published By IEEE

9781467386098
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

scholarly journals Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

2016 ◽  
Author(s):  
Alessandro Grossi ◽  
Eduardo Perez ◽  
Cristian Zambelli ◽  
Piero Olivo ◽  
Christian Wenger

Direction dependent three-dimensional silicon carbide oxidation growth rate calculations

2016 ◽  
Author(s):  
Vito Simonka ◽  
Georg Nawratil ◽  
Andreas Hossinger ◽  
Josef Weinbub ◽  
Siegfried Selberherr
Keyword(s):  
Growth Rate ◽  
Silicon Carbide ◽  
Three Dimensional ◽  
Oxidation Growth

Operation of suspended lateral SOI PIN photodiode with aluminum back gate

2016 ◽  
Author(s):  
Guoli Li ◽  
Nicolas Andre ◽  
Olivier Poncelet ◽  
Pierre Gerard ◽  
Syed Zeeshan Ali ◽  
...  
Keyword(s):  
Back Gate ◽  
Pin Photodiode

Current mirrors with strained Si single nanowire gate all around Schottky barrier MOSFETs

2016 ◽  
Author(s):  
K. Narimani ◽  
G. V. Luong ◽  
C. Schulte-Braucks ◽  
S. Trellenkamp ◽  
Q.T. Zhao ◽  
...  
Keyword(s):  
Schottky Barrier ◽  
Strained Si ◽  
Single Nanowire ◽  
Current Mirrors

On the influence of the back-gate bias on InGaAs Trigate MOSFETs

2016 ◽  
Author(s):  
Enrique G. Marin ◽  
Francisco G. Ruiz ◽  
Andres Godoy ◽  
Jose M. Gonzalez-Medina ◽  
I. M. Tienda-Luna ◽  
...  
Keyword(s):  
Gate Bias ◽  
Back Gate

Enhancing electrical performances of metallic DG-SET based circuits by tunnel junction engineering

2016 ◽  
Author(s):  
Khalil G. El Hajjam ◽  
Mohamed Amine Bounouar ◽  
Dominique Drouin ◽  
Francis Calmon
Keyword(s):  
Tunnel Junction
Load More ...
Sign in / Sign up

Export Citation Format

Share Document