2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

2016 ◽

Cited By ~ 2

Author(s):

M. Visciarelli ◽

E. Gnani ◽

A. Gnudi ◽

S. Reggiani ◽

G. Baccarani

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Operation of suspended lateral SOI PIN photodiode with aluminum back gate

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440076 ◽

2016 ◽

Cited By ~ 3

Author(s):

Guoli Li ◽

Nicolas Andre ◽

Olivier Poncelet ◽

Pierre Gerard ◽

Syed Zeeshan Ali ◽

...

Keyword(s):

Back Gate ◽

Pin Photodiode

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Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440057 ◽

2016 ◽

Cited By ~ 5

Author(s):

Alessandro Grossi ◽

Eduardo Perez ◽

Cristian Zambelli ◽

Piero Olivo ◽

Christian Wenger

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Direction dependent three-dimensional silicon carbide oxidation growth rate calculations

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440094 ◽

2016 ◽

Author(s):

Vito Simonka ◽

Georg Nawratil ◽

Andreas Hossinger ◽

Josef Weinbub ◽

Siegfried Selberherr

Keyword(s):

Growth Rate ◽

Silicon Carbide ◽

Three Dimensional ◽

Oxidation Growth

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Single-electron transistors featuring silicon nitride tunnel barriers prepared by atomic layer deposition

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440045 ◽

2016 ◽

Cited By ~ 4

Author(s):

Golnaz Karbasian ◽

Alexei O. Orlov ◽

Alexander S. Mukasyan ◽

Gregory L. Snider

Keyword(s):

Silicon Nitride ◽

Atomic Layer Deposition ◽

Atomic Layer ◽

Single Electron ◽

Single Electron Transistors ◽

Layer Deposition ◽

Tunnel Barriers ◽

Electron Transistors

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Capacitor-less memory: Advances and challenges

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440054 ◽

2016 ◽

Cited By ~ 3

Author(s):

Francisco Gamiz

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Current mirrors with strained Si single nanowire gate all around Schottky barrier MOSFETs

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440082 ◽

2016 ◽

Cited By ~ 1

Author(s):

K. Narimani ◽

G. V. Luong ◽

C. Schulte-Braucks ◽

S. Trellenkamp ◽

Q.T. Zhao ◽

...

Keyword(s):

Schottky Barrier ◽

Strained Si ◽

Single Nanowire ◽

Current Mirrors

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On the influence of the back-gate bias on InGaAs Trigate MOSFETs

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440095 ◽

2016 ◽

Author(s):

Enrique G. Marin ◽

Francisco G. Ruiz ◽

Andres Godoy ◽

Jose M. Gonzalez-Medina ◽

I. M. Tienda-Luna ◽

...

Keyword(s):

Gate Bias ◽

Back Gate

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Recrystallization and oxidation - competing processes during PECVD ultrathin silicon layer high temperature annealing

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440085 ◽

2016 ◽

Author(s):

Romuald B. Beck ◽

Kamil Ber

Keyword(s):

High Temperature ◽

Silicon Layer ◽

High Temperature Annealing

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Enhancing electrical performances of metallic DG-SET based circuits by tunnel junction engineering

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2016.7440092 ◽

2016 ◽

Author(s):

Khalil G. El Hajjam ◽

Mohamed Amine Bounouar ◽

Dominique Drouin ◽

Francis Calmon

Keyword(s):

Tunnel Junction

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2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Optimization of GaSb/InAs TFET exploiting different strain configurations

Operation of suspended lateral SOI PIN photodiode with aluminum back gate

Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

Direction dependent three-dimensional silicon carbide oxidation growth rate calculations

Single-electron transistors featuring silicon nitride tunnel barriers prepared by atomic layer deposition

Capacitor-less memory: Advances and challenges

Current mirrors with strained Si single nanowire gate all around Schottky barrier MOSFETs

On the influence of the back-gate bias on InGaAs Trigate MOSFETs

Recrystallization and oxidation - competing processes during PECVD ultrathin silicon layer high temperature annealing

Enhancing electrical performances of metallic DG-SET based circuits by tunnel junction engineering

Export Citation Format

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Optimization of GaSb/InAs TFET exploiting different strain configurations

Operation of suspended lateral SOI PIN photodiode with aluminum back gate

Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

Direction dependent three-dimensional silicon carbide oxidation growth rate calculations

Single-electron transistors featuring silicon nitride tunnel barriers prepared by atomic layer deposition

Capacitor-less memory: Advances and challenges

Current mirrors with strained Si single nanowire gate all around Schottky barrier MOSFETs

On the influence of the back-gate bias on InGaAs Trigate MOSFETs

Recrystallization and oxidation - competing processes during PECVD ultrathin silicon layer high temperature annealing

Enhancing electrical performances of metallic DG-SET based circuits by tunnel junction engineering

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Latest Publications