Electrical Switching and Bistability in Organic/Polymeric Thin Films and Memory Devices

2006 ◽  
Vol 16 (8) ◽  
pp. 1001-1014 ◽  
Author(s):  
Y. Yang ◽  
J. Ouyang ◽  
L. Ma ◽  
R. J.-H. Tseng ◽  
C.-W. Chu
2007 ◽  
Vol 2 (2) ◽  
pp. 257-264
Author(s):  
Satoko Nishiyama ◽  
Masahiro Tajima ◽  
Yasuhiko Yoshida

2021 ◽  

The book covers the sensing and monitoring of poisonous carbon monoxide pollution in the environment. The sensors covered include semiconducting metal oxides, carbon nanotubes, conducting polymeric thin films, sensors based on colorimetric detection, non-dispersive infrared sensors, electrochemical sensors and photoacoustic detectors.


2021 ◽  
Vol 33 (23) ◽  
pp. 2170181
Author(s):  
Seungki Jo ◽  
Soyoung Cho ◽  
U Jeong Yang ◽  
Gyeong‐Seok Hwang ◽  
Seongheon Baek ◽  
...  

RSC Advances ◽  
2021 ◽  
Vol 11 (17) ◽  
pp. 10212-10223
Author(s):  
Abhijit Rudra Paul ◽  
Bapi Dey ◽  
Sudip Suklabaidya ◽  
Syed Arshad Hussain ◽  
Swapan Majumdar

In this article, we demonstrate the design, synthesis and physico-chemical characteristics, including electrical switching behaviours of long alkoxy-appended coumarin carboxylate/carboxylic acid in thin films.


1991 ◽  
Author(s):  
Karl W. Beeson ◽  
Keith A. Horn ◽  
Christina Lau ◽  
Michael J. McFarland ◽  
David R. Schwind ◽  
...  

2008 ◽  
Vol 40 (3-4) ◽  
pp. 400-403 ◽  
Author(s):  
E. Sarantopoulou ◽  
J. Kovač ◽  
Z. Kollia ◽  
I. Raptis ◽  
S. Kobe ◽  
...  

1998 ◽  
Vol 541 ◽  
Author(s):  
Tingkai Li ◽  
Fengyan Zhang ◽  
Sheng Teng Hsu

AbstractOne transistor memory devices have been proposed recently. To meet the needs of one transistor memory applications, C-axis oriented Pb5Ge3O11 (PGO) thin films were prepared using metalorganic chemical vapor deposition (MOCVD) and rapid thermal processing (RTP). It was found that the nucleation of C-axis Pb5Ge3O11 phase started at a deposition temperature below 400°C and grain growth dominated at 500°C or above. With increasing annealing temperature, the remanent polarization (Pr) and coercive field (Ec) values increased, and the hysteresis loops of the Pb5Ge3O11 films were well saturated and symmetrical after the post-annealing. The C-axis PGO thin film showed good ferroelectric properties at 5V: 2Pr and 2Ec values were 2.0 - 4.0 µC/cm2 and 90 - 110 kV/cm, respectively. The films also showed excellent fatigue characteristics: no fatigue was observed up to 1 × 109 switching cycles. The retention and imprint properties have also been studied. The leakage currents of the PGO films were 2 - 5 × 10−7 A/cm2 at 100 kV/cm and dielectric constants were 40 - 70. The high quality MOCVD Pb5Ge3O11 films can be used for single transistor ferroelectric memory devices.


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