Inside Front Cover: Oxidation Conditions for Octadecyl Trichlorosilane Monolayers on Silicon: A Detailed Atomic Force Microscopy Study of the Effects of Pulse Height and Duration on the Oxidation of the Monolayer and the Underlying Si Substrate (Adv. Funct. Mater. 6/2005)

Si Substrate ◽

Front Cover ◽

Force Microscopy ◽

Atomic Force ◽

Octadecyl Trichlorosilane

Oxidation Conditions for Octadecyl Trichlorosilane Monolayers on Silicon: A Detailed Atomic Force Microscopy Study of the Effects of Pulse Height and Duration on the Oxidation of the Monolayer and the Underlying Si Substrate

Advanced Functional Materials ◽

10.1002/adfm.200400534 ◽

2005 ◽

Vol 15 (6) ◽

pp. 938-944 ◽

Cited By ~ 52

Author(s):

D. Wouters ◽

R. Willems ◽

S. Hoeppener ◽

C. F. J. Flipse ◽

U. S. Schubert

Keyword(s):

Atomic Force Microscopy ◽

Pulse Height ◽

Microscopy Study ◽

Si Substrate ◽

Force Microscopy ◽

Atomic Force ◽

Octadecyl Trichlorosilane

Atomic force microscopy study of plastic deformation and interfacial sliding in Al thin film: Si substrate systems due to thermal cycling

Applied Physics Letters ◽

10.1063/1.1332098 ◽

2000 ◽

Vol 77 (26) ◽

pp. 4298-4300 ◽

Cited By ~ 22

Author(s):

M. W. Chen ◽

I. Dutta

Keyword(s):

Thin Film ◽

Plastic Deformation ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Si Substrate ◽

Force Microscopy ◽

Interfacial Sliding ◽

Atomic Force ◽

Al Thin Film

Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

Bone Abstracts ◽

10.1530/boneabs.1.pp48 ◽

2013 ◽

Author(s):

Petar Milovanovic ◽

Zlatko Rakocevic ◽

Jelena Potocnik ◽

Danijela Djonic ◽

Vladimir Zivkovic ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Hip Fracture ◽

Femoral Neck ◽

Cortical Bone ◽

Microscopy Study ◽

Bone Fragility ◽

Force Microscopy ◽

Atomic Force Microscopy study on the effect of different lecithins in cocoa-butter based suspensions

Colloids and Surfaces A Physicochemical and Engineering Aspects ◽

10.1016/j.colsurfa.2016.03.057 ◽

2016 ◽

Vol 499 ◽

pp. 60-68 ◽

Cited By ~ 8

Author(s):

D. Middendorf ◽

U. Bindrich ◽

P. Mischnick ◽

A. Juadjur ◽

K. Franke ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cocoa Butter ◽

Microscopy Study ◽

Force Microscopy ◽

Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

Adsorption of Polyethylenimine on Graphite: An Atomic Force Microscopy Study

Macromolecules ◽

10.1021/ma0345293 ◽

2003 ◽

Vol 36 (25) ◽

pp. 9510-9518 ◽

Cited By ~ 23

Author(s):

Marc Schneider ◽

Martin Brinkmann ◽

Helmuth Möhwald

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Force Microscopy ◽

An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100)

Thin Solid Films ◽

10.1016/0040-6090(96)08574-4 ◽

1996 ◽

Vol 281-282 ◽

pp. 57-59 ◽

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Author(s):

A. Brazdeikis ◽

U.O. Karlsson ◽

A.S. Flodström

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Copper Oxide ◽

Molecular Beam ◽

Oxide Films ◽

Microscopy Study ◽

Force Microscopy ◽

Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters ◽

10.1063/1.125581 ◽

1999 ◽

Vol 75 (26) ◽

pp. 4198-4200 ◽

Cited By ~ 39

Author(s):

G. Bar ◽

L. Delineau ◽

R. Brandsch ◽

M. Bruch ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Indentation Depth ◽

Microscopy Study ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

Self-lubricant behaviour of copper-carbon nanocomposites: An electron microscopy and atomic force microscopy study

Microscopy and Microanalysis ◽

10.1017/s1431927614014275 ◽

2015 ◽

Vol 21 (S6) ◽

pp. 114-115

Author(s):

D. Silva ◽

J. Jeremias ◽

D. Nunes ◽

J.B. Correia ◽

K. Hanada ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Carbon Nanocomposites ◽

Force Microscopy ◽

An Atomic Force Microscopy Study on the Roughness of Silicon Wafers Correlated with Direct Wafer Bonding

Journal of The Electrochemical Society ◽

10.1149/1.1837009 ◽

1996 ◽

Vol 143 (7) ◽

pp. 2365-2371 ◽

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Author(s):

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Shari N. Farrens

Keyword(s):

Atomic Force Microscopy ◽

Wafer Bonding ◽

Microscopy Study ◽

Silicon Wafers ◽

Force Microscopy ◽

Atomic Force ◽

Direct Wafer Bonding