Self-lubricant behaviour of copper-carbon nanocomposites: An electron microscopy and atomic force microscopy study

Carbon Nanocomposites ◽

Force Microscopy ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyanoquinodimethane thin film grown by vacuum evaporation

10.1116/1.1459723 ◽

2002 ◽

Vol 20 (2) ◽

pp. 673 ◽

Cited By ~ 3

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Errata: “Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyano- quinodimethane thin film grown by vacuum evaporation” [J. Vac. Sci. Technol. B 20, 673 (2002)]

10.1116/1.1740769 ◽

2004 ◽

Vol 22 (3) ◽

pp. 1213

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

High Resolution Transmission Electron Microscopy and Atomic Force Microscopy Study of Nanocrystalline Ferrites Synthesized by Reverse Micelle Technique Under Varied Conditions

Microscopy and Microanalysis ◽

10.1017/s1431927604880188 ◽

2004 ◽

Vol 10 (S02) ◽

pp. 402-403

Author(s):

Harish Nathani ◽

R. D. K Misra

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

High Resolution ◽

Reverse Micelle ◽

Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

Bone Abstracts ◽

10.1530/boneabs.1.pp48 ◽

2013 ◽

Author(s):

Petar Milovanovic ◽

Zlatko Rakocevic ◽

Jelena Potocnik ◽

Danijela Djonic ◽

Vladimir Zivkovic ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Hip Fracture ◽

Femoral Neck ◽

Cortical Bone ◽

Microscopy Study ◽

Bone Fragility ◽

Force Microscopy ◽

Atomic Force Microscopy study on the effect of different lecithins in cocoa-butter based suspensions

Colloids and Surfaces A Physicochemical and Engineering Aspects ◽

10.1016/j.colsurfa.2016.03.057 ◽

2016 ◽

Vol 499 ◽

pp. 60-68 ◽

Cited By ~ 8

Author(s):

D. Middendorf ◽

U. Bindrich ◽

P. Mischnick ◽

A. Juadjur ◽

K. Franke ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cocoa Butter ◽

Microscopy Study ◽

Force Microscopy ◽

Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

Adsorption of Polyethylenimine on Graphite: An Atomic Force Microscopy Study

Macromolecules ◽

10.1021/ma0345293 ◽

2003 ◽

Vol 36 (25) ◽

pp. 9510-9518 ◽

Cited By ~ 23

Author(s):

Marc Schneider ◽

Martin Brinkmann ◽

Helmuth Möhwald

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Force Microscopy ◽

An atomic force microscopy study of thin copper oxide films grown by molecular beam epitaxy on MgO(100)

Thin Solid Films ◽

10.1016/0040-6090(96)08574-4 ◽

1996 ◽

Vol 281-282 ◽

pp. 57-59 ◽

Cited By ~ 6

Author(s):

A. Brazdeikis ◽

U.O. Karlsson ◽

A.S. Flodström

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Copper Oxide ◽

Molecular Beam ◽

Oxide Films ◽

Microscopy Study ◽

Force Microscopy ◽

Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters ◽

10.1063/1.125581 ◽

1999 ◽

Vol 75 (26) ◽

pp. 4198-4200 ◽

Cited By ~ 39

Author(s):

G. Bar ◽

L. Delineau ◽

R. Brandsch ◽

M. Bruch ◽

M.-H. Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Indentation Depth ◽

Microscopy Study ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

An Atomic Force Microscopy Study on the Roughness of Silicon Wafers Correlated with Direct Wafer Bonding

Journal of The Electrochemical Society ◽

10.1149/1.1837009 ◽

1996 ◽

Vol 143 (7) ◽

pp. 2365-2371 ◽

Cited By ~ 13

Author(s):

Brian E. Roberds ◽

Shari N. Farrens

Keyword(s):

Atomic Force Microscopy ◽

Wafer Bonding ◽

Microscopy Study ◽

Silicon Wafers ◽

Force Microscopy ◽

Atomic Force ◽

Direct Wafer Bonding