Real domain structure in orthorhombic phase of NaNbO3 crystals

1983 ◽  
Vol 18 (2) ◽  
pp. 195-204 ◽  
Author(s):  
Jan Dec
2008 ◽  
Vol 92 (13) ◽  
pp. 132906 ◽  
Author(s):  
H. Wang ◽  
J. Zhu ◽  
X. W. Zhang ◽  
Y. X. Tang ◽  
H. S. Luo

1994 ◽  
Vol 152 (1) ◽  
pp. 237-242 ◽  
Author(s):  
Ibrahima Sory Bah ◽  
L. E. Balyunis ◽  
V. W. Topolov ◽  
O. E. Fesenko

2004 ◽  
Vol 842 ◽  
Author(s):  
Benjamin A. Simkin ◽  
Yoshinori Hayashi ◽  
Haruyuki Inui

ABSTRACTThe orthorhombic compound Ru2Si3 is currently of interest as a high-temperature thermoelectric material. In order to clarify the effects of crystal orientation on the thermoelectric properties of Ru2Si3, we have examined the microstructure, Seebeck coefficient, electrical resistivity, and thermal conductivity of Ru2Si3 along the three principal axes, using these measured quantities to describe the relative thermoelectric performance as a property of crystal orientation. Ru2Si3 undergoes a high temperature (HT)→low temperature (LT) phase change and polycrystalline Si platelet precipitation during cooling, both of which are expected to effect the thermoelectric properties. The HT tetragonal→LT orthorhombic phase transformation results in a [010]//[010], [100]//[001] two-domain structure, while polycrystalline Si precipitation occurs on the (100)LT and (001)LT planes. The [010] orientation is found to posses superior thermoelectric properties (with the dimensionless figure of merit, ZT[010]/ZT[100]>4 at 650°C), due principally to the larger Seebeck coefficient along the [010] direction. The effect of the domain structure on the thermoelectric properties is discussed.


2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Jialiang Zhang ◽  
Chunming Zhou

Abstract Domain structure often greatly affects piezoelectric performance of a ferroelectric ceramic. Accordingly, a convenient method that can well characterize the domain structure at various temperatures is highly desired for understanding the underlying mechanism. An improved acid-etching technique was recently developed for such purpose. Domain structure of poled 0.96(K0.48Na0.52)(Nb0.96Sb0.04)O3–0.04(Bi0.50Na0.50)ZrO3 ceramics with a large piezoelectric coefficient d33 of 535 pC/N was systematically investigated at three typical temperatures. It was found that domain configurations change significantly with temperature. Hierarchical nanodomain structure is widely observed in domain patterns acid-etched at 25 °C, due to the orthorhombic-tetragonal phase coexistence. By contrast, the majority part of those acid-etched at − 60 °C are simply some long parallel stripes, while a small amount of banded structure appears in broad stripes inside some grains. A nearly 63° intersectional angle is seen between two adjacent sets of parallel stripes in the domain pattern of a cuboid-shaped grain, indicating that orthorhombic phase remains down to − 60 °C. The domain patterns acid-etched at 80 °C become even simpler, mainly consisting of long parallel stripes that are several hundred nanometers wide and have quite straight edges. Fundamental issues associating with the possible domain configurations and the acid-etching were discussed on the simple mathematical basis.


2008 ◽  
Vol 41 (3) ◽  
pp. 420-429 ◽  
Author(s):  
S. Anteboth ◽  
A. Brückner-Foit ◽  
M.J. Hoffmann ◽  
U. Sutter ◽  
Th. Schimmel ◽  
...  
Keyword(s):  

Author(s):  
S. H. Rahman

AbstractApplying the videographic reconstruction and simulation method, the real domain structure configuration of the Cu


Author(s):  
B. G. Demczyk

CoCr thin films have been of interest for a number of years due to their strong perpendicular anisotropy, favoring magnetization normal to the film plane. The microstructure and magnetic properties of CoCr films prepared by both rf and magnetron sputtering have been examined in detail. By comparison, however, relatively few systematic studies of the magnetic domain structure and its relation to the observed film microstructure have been reported. In addition, questions still remain as to the operative magnetization reversal mechanism in different film thickness regimes. In this work, the magnetic domain structure in magnetron sputtered Co-22 at.%Cr thin films of known microstructure were examined by Lorentz transmission electron microscopy. Additionally, domain nucleation studies were undertaken via in-situ heating experiments.It was found that the 50 nm thick films, which are comprised of columnar grains, display a “dot” type domain configuration (Figure 1d), characteristic of a perpendicular magnetization. The domain size was found to be on the order of a few structural columns in diameter.


Author(s):  
Yimei Zhu ◽  
Masaki Suenaga ◽  
R. L. Sabatini ◽  
Youwen Xu

The (110) twin structure of YBa2Cu3O7 superconductor oxide, which is formed to reduce the strain energy of the tetragonal to orthorhombic phase transformation by alternating the a-b crystallographic axis across the boundary, was extensively investigated. Up to now the structure of the twin boundary still remained unclear. In order to gain insight into the nature of the twin boundary in Y-Ba-Cu-O system, a study using electron diffraction techniques including optical and computed diffractograms, as well as high resolution structure imaging techniques with corresponding computer simulation and processing was initiated.Bulk samples of Y-Ba-Cu-O oxide were prepared as described elsewhere. TEM specimens were produced by crushing bulk samples into a fine powder, dispersing the powder in acetone, and suspending the fine particles on a holey carbon grid. The electron microscopy during this study was performed on both a JEOL 2000EX and 2000FX electron microscopes operated at 200 kV.


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